IEEE standard 1500 compatible interconnect diagnosis for delay and crosstalk faults

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Please use this identifier to cite or link to this item: http://ir.lib.ncu.edu.tw/handle/987654321/32192

Title:	IEEE standard 1500 compatible interconnect diagnosis for delay and crosstalk faults
Authors:	Li,Katherine Shu-Min;Su,Chauchin;Chang,Yao-Wen;Lee,Chung-Len;Chen,Jwu E.
Contributors:	電機工程研究所
Keywords:	WIRING NETWORKS
Date:	2006
Issue Date:	2010-07-06 18:20:46 (UTC+8)
Publisher:	中央大學
Abstract:	An interconnect diagnosis scheme based on the oscillation ring (OR) test methodology for systems-on-chip (SOC) design with heterogeneous cores is proposed. In addition to traditional stuck-at and open faults, the OR test can also detect and diagnose impor
Relation:	IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS
Appears in Collections:	[Graduate Institute of Electrical Engineering] journal & Dissertation

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