Intrinsic response extraction for the removal of the parasitic effects in analog test buses

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Please use this identifier to cite or link to this item: http://ir.lib.ncu.edu.tw/handle/987654321/32663

Title:	Intrinsic response extraction for the removal of the parasitic effects in analog test buses
Authors:	Su,C;Chen,YT
Contributors:	電機工程研究所
Keywords:	P1149.4
Date:	2000
Issue Date:	2010-07-06 18:35:50 (UTC+8)
Publisher:	中央大學
Abstract:	The removal of the parasitic effects is an emerging Issue in the implementation of the IEEE standard 1149.4 analog test buses. For this, this paper defines the intrinsic response and derives an extraction algorithm. The intrinsic response is defined as th
Relation:	IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS
Appears in Collections:	[Graduate Institute of Electrical Engineering] journal & Dissertation

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