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    請使用永久網址來引用或連結此文件: http://ir.lib.ncu.edu.tw/handle/987654321/48243


    題名: 應用氮化鎵奈米柱基板提升氮化鎵發光二極體之電流擴散;Improvement of Current Spreading in GaN-based Light Emitting Diode Grown on Nanorods GaN Template
    作者: 周秀玫;Hsiu-Mei Chou
    貢獻者: 照明與顯示科技研究所
    關鍵詞: 發光二極體;氮化鎵;電流擴散;GaN;LED;current spreading
    日期: 2011-07-18
    上傳時間: 2012-01-05 14:42:26 (UTC+8)
    摘要: 本論文主要研究成長不同濃度之n型GaN薄膜於奈米柱GaN/藍寶石基板來改善Planar GaN發光二極體之電流擁擠現象,期望應用在大電流密度下提升整個GaN發光二極體電流擴散之均勻性。文中首先分別成長不同濃度之n型GaN薄膜於傳統GaN基板及奈米柱GaN/藍寶石基板,接著量測分析其n型GaN薄膜在兩者基板之間的材料特性差異,接著成長不同濃度之n型GaN薄膜的GaN發光二極體結構應用在此兩者基板上,並探討不同濃度之n型GaN薄膜對於GaN發光二極體之光電特性表現的差異性。 由GaN發光二極體電流擴散原理得知,使n型GaN薄膜電阻值與表面氧化銦錫( ITO )薄膜電阻值越匹配,其電流分佈越均勻,因此本研究是藉由成長高濃度的n型GaN薄膜來降低n型GaN薄膜之電阻值,而成長較高濃度的n型GaN薄膜會因為過多的Si摻雜而使得薄膜品質較差,為了不讓增加Si摻雜而影響GaN薄膜品質,我們使用奈米柱GaN/藍寶石基板成長GaN薄膜,可抑制薄膜缺陷密度不因摻雜高濃度Si而增加。 我們再利用奈米柱GaN/藍寶石基板成長GaN發光二極體結構,並比較結構中有不同濃度之n型GaN薄膜對於影響電流在GaN發光二極體分佈的均勻性。由量測結果得知,使用奈米柱GaN/藍寶石基板比傳統GaN基板成長之GaN發光二極體,其光輸出功率在20 mA下,由5.8 mW上升至6.5 mW,提高約12%,而在相同使用奈米柱GaN/藍寶石基板,我們調整n型GaN薄膜電阻值使其和氧化銦錫( ITO )薄膜電阻值匹配,其光輸出功率在20 mA下由6.5 mW上升至7.5 mW,順向電壓皆為3.4 V。 經本研究結果得知,使用奈米柱GaN/藍寶石基板所成長的GaN發光二極體與傳統GaN發光二極體有較佳的光電特性表現,且在此奈米柱GaN/藍寶石基板所成長的GaN發光二極體結構下,最佳的 n型GaN薄膜之濃度為1.6╳1019/cm3,並量測大電流密度注入條件下,能改善其電流擁擠現象,使電流分佈更為均勻,增加光輸出功率。 This thesis investigation, we studied the growth of different concentrations of n-type GaN film on the nanorods GaN / sapphire substrate to improve the p-side-up mesa-structure GaN LED of the current crowding, expectations used in high current density to enhance the current spreading uniformity of GaN LED. First, Growth of different concentrations of n-type GaN film on the nanorods GaN / sapphire substrate, the surface morphology and structural characteristics were analyzed. Next, we make use of theory to calculate the current distribution of different concentrations of n-type GaN film grown on the nanorods GaN / sapphire substrate.When the resistance of n-type GaN film and the transparent current layer were match so that the current is distributed will be even. Therefore, we grow high concentrations of n-type GaN film to reduce the resistance of n-type GaN film, but heavily Si-doped of n-type GaN film could made film quality has poor. So, we using nanorods GaN / sapphire substrate could effectively suppress the threading dislocation density by increasing Si-doped of n-type GaN film. The measurement results revealed that GaN LED grown on nanorods GaN / sapphire substrate GaN substrate, at 20mA injection current, the optical output power was enhanced by 12%, respectively, compared to those of a conventional LED.We adjusted the different reisistance of n-type GaN film grown on nanorods GaN / sapphire substrate, the light output power was enhanced by 15%, because of changing n-type GaN film resistance could let the current distributed evenly.
    顯示於類別:[照明與顯示科技研究所 ] 博碩士論文

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