在本計畫中，將針對一般微波電路中常見的電路板或層狀介質基板，提出一方便且準確的介電係數量測方法。本量測方法的重點如下：感測機制為一平面共振電路，但其中的共振區(單元)只是整體電路的一部份，以縮小量測區域的面積。平面感測電路的基板並非待測介質樣本。待測介質樣本可置於電路下，利用缺陷地面中孔徑耦合的方式來影響電路特性。如此對不同的待測介質，無需再重做電路。在本計畫的先期研究中，利用簡易的缺陷地面來觀察等效電路元件對介質特性的反應，由模擬結果發現，由電容來只量介電係數，而只用電感來量磁導係數，這樣的量測技術的建立是可能的。這些結果提供了未來電路設計的方向。針對本平面感測電路重新設計一套校準技術。根據向量網路分析儀的誤差特性，對本技術的反演結果從事誤差分析。為了方便技術發展，在本計畫中，將先根據一般FR-4印刷電路板及SMA接頭的頻率使用限制，從事頻率12 GHz以下的量測及驗證。在未來可將本技術延伸到毫米波量測。計畫完成後，其結果將記錄於期末報告並投稿於國際期刊。 In the project, a convenient dielectric measurement technique will be proposed for dielectric substrates used in microwave planar circuits. The major features of the proposed technique is listed as follows: A planar cuitcuit, which consists of resonators, will be used as the sensor in the measurements. In order to achieve compactness, instead of the whole circuit, the resonators will be the main sensing mechanism. The substrate of the proposed circuit will not be the sample under test (SUT). Instead, the SUT will be deployed on the sensing area upon the proposed circuit. The energy coupling between the circuit and SUT will be achieved through apertures on the ground. A new measurement calibration technique will be developed for the proposed sensing circuit. The TRL technique will not be applied in the project. The accessment of the retrieving error due to the uncertainties in the vector network analyzer will be conducted in the project. To conduct the validation of the proposed technique, the measurement will be made at the frequencies under 12 GHz, due to the the frequency limitation of the FR-4 printed-circuit board and SMA conectors. The final results of the project will be presented in the final report and sumitted to the international journals. 研究期間：10008 ~ 10107
