This study achieved controlling the positions of spontaneous growth of tin whiskers. We surmounted the unpredictable growing nature of such whiskers and performed accurately quantitative analyses of the growth kinetics and yielded precise measurement of the growth rate. Furthermore, using synchrotron radiation x-ray, this study determined the stress variations in conjunction with whisker growth that fitted appropriately to the model. Accordingly, the results could address the debate held for decades and prove that forming a surface oxide layer is one of the required and necessary conditions for controlling the positions of spontaneous growth of tin whiskers. (C) 2011 American Institute of Physics. [doi:10.1063/1.3643472]
