Reliable data path design of VLIW processor cores with comprehensive error-coverage assessment

NCUIR > College of Electrical Engineering & Computer Science > Department of Electrical Engineering > journal & Dissertation > Item 987654321/51984

Please use this identifier to cite or link to this item: http://ir.lib.ncu.edu.tw/handle/987654321/51984

Title:	Reliable data path design of VLIW processor cores with comprehensive error-coverage assessment
Authors:	Chen,YY;Leu,KL
Contributors:	電機工程學系
Date:	2010
Issue Date:	2012-03-28 10:12:34 (UTC+8)
Publisher:	國立中央大學
Abstract:	In this paper, an effective fault-tolerant framework offering very high error coverage with zero detection latency is proposed to protect the data paths of VLIW processor cores. The feature of zero detection latency is essential to real-time error-recovery. The proposed framework provides the error-handling schemes of varying hardware complexity, performance and error coverage to be selected. A case study with an experimental VLIW architecture implemented in VHDL was used to demonstrate the impacts of our technique on hardware overhead and performance degradation. The fault injection experiments were performed to characterize the effects of fault-occurring frequency as well as workload variations on the error coverage, and the permanent faults on the length of time spent for error-recovery. The results observed from the experiments show that our approach can well protect the VLIW data paths even in a very severe fault scenario. As a result, the proposed fault-tolerant VLIW core is quite suitable for the highly dependable embedded applications. (C) 2009 Elsevier B.V. All rights reserved.
Relation:	MICROPROCESSORS AND MICROSYSTEMS
Appears in Collections:	[Department of Electrical Engineering] journal & Dissertation

Files in This Item:

File	Description	Size	Format
index.html		0Kb	HTML	302	View/Open

社群 sharing