The Manufacturing of a Metallic Nano-Cluster at a Tip Apex for Field-Sensitive Microscopy Applications

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题名:	The Manufacturing of a Metallic Nano-Cluster at a Tip Apex for Field-Sensitive Microscopy Applications
作者:	Lin,HM;Chang,MN;Lin,YS;Cheng,CC
贡献者:	物理學系
关键词:	SINGLE SEMICONDUCTOR NANOCRYSTALS;SPREADING RESISTANCE MICROSCOPY;MAGNETIC FORCE MICROSCOPY;FOCUSED ION-BEAM;NANOMETER-SCALE;PROBE;RESOLUTION;CHARGE;PHOTOIONIZATION
日期:	2010
上传时间:	2012-06-11 10:47:11 (UTC+8)
出版者:	國立中央大學
摘要:	Using a conductive atomic force microscopic setup, a metallic nano-cluster at a tip apex was successfully manufactured by an electrochemical redox process from an anodic aluminum oxide template. The diameter of the metallic nano-clusters ranged from 15 nm to 200 nm. The diameters of the nano-clusters could be well-controlled by adjusting the pore size of the templates. The formation of a variety of metallic nano-clusters at the tip apex was accomplished by preparing the electrolyte solution from different metallic salts. The formation mechanism for the nano-cluster is outlined and discussed. Moreover, we were able to enhance the performance of the nano-cluster tips for field-sensitive scanning probe microscopy, including electrostatic force microscopy and scanning Kelvin probe microscopy by laser annealing. Our experimental results indicated that for applications in field-sensitive scanning probe microscopy the stray field effect was significantly suppressed by the nano-cluster tip and hence the spatial resolution was improved.
關聯:	JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY
显示于类别:	[物理學系] 期刊論文

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