本研究以探討7005鋁合金陽極處理所生成多孔陽極氧化膜為主軸。經由退火、輥軋變形與時效處理後，觀察其微結構、析出物型態。再經過陽極處理，並討論基地微結構對陽極氧化膜的影響。分析陽極過程中電壓與時間(V-t)變化曲線，透過SEM 觀察前製程的微結構對陽極多孔氧化膜生長行為的影響。並利用光電子能譜儀(XPS)分析陽極氧化膜的表面層及介面層(氧化膜/基材)組成成分，且進行AUTOLAB PGSTAT30分析電化學測試。最後使用色度儀分析陽極氧化膜顏色性質。觀察TEM分析，RSAT(1)晶界附近有差排及析出物，SRAT(1)上有大量差排糾結形成所謂的變形帶。SAT(2)及RSAT(2)受到自然時效影響產生性質回復現象，讓微結構產生硬度軟化，由TEM觀察可發現析出物(MgZn2)尺寸較大且少。觀察V-t曲線，低導電度的RSAT(1)試片具有較高的第一階段電壓及能量消耗。在第二階段可以看到RSAT(1)電壓高，孔徑大。將陽極試片進行XPS分析，我們得知陽極氧化膜的構成相可能為非晶質氧化鋁(Amorphous alumina；Al-O-H)、水合氧化物(Hydrated oxide；Al(OH)3)、結晶型(Crystallized) AlOOH。在腐蝕測試分析，陽極氧化膜上所形成的水合氧化物(Hydrated oxide；Al(OH)3)會影響陽極試片的孔蝕電位(Epit)。The aim of the study is to investigate the effect of the anodic aluminum oxide film (AAO film) formed on the 7005 aluminum alloy by using anodizing treatment. Through the manufacturing processes including annealing, artificial aging treatment and cold-rolling, the variation of AAO film of 7005 aluminum alloy revealed especially on its microstructure and the status of precipitate materials. Furthermore, anodize was utilized to explore the influence on the AAO film from the basic structure. Also, voltage-time (V-t) curvature changes in the process of anodizing were recorded. After the above manufacturing processes, the effect of the microstructure on the growing behavior of the porous AAO film was observed by using SEM. In addition, the XPS was utilized to analyze the composition of AAO film surface and interface (film/metal). Then, the electrochemical tests were conducted and recorded by AUTO LAB PGSTAT30 potentiostat. The CIE L*a*b* colorimeter were used to analyzed the AAO film surface Colour properties.By analyzing the Transmission Electron Microscopy (TEM), we found that near the grain boundary (G.B.) has dislocations and precipitates in RSAT(1) samples. In SRAT(1) sample, the bands developed from dense dislocation walls were called microbands. SAT(2) and RSAT(2) are affected by natural aging and generated the phenomenon of recovery, which lower the hardness. With observing by TEM, the density of precipitates is smaller. In respect to the variation of V-t curvature, the lower the conductivity of RSAT(1) sample, the voltage and the energy consumption of the test fragment with RA sample became higher in step 1. The voltage of the test fragment with RSAT(1) sample became higher in step 2. Concerning the RSAT(1) sample, it is suggested that the pore diameter increases by using the AAO films.The anodized samples were then analyzed by X-ray Photoelectron Spectroscopy (XPS). We found that the constituted phases in the AAO film are composed by amorphous alumina (Al-O-H), hydrated oxide (Al(OH)3) and crystallite oxide (AlOOH) phases. In the corrosion test, hydrated Al(OH)3 that formed at the subsurface of AAO film were found to inversely influence the pitting potential (Epit) of anodized samples.
