白光LED封裝效率與可靠性分析之研究;Study of Package Efficiency and Reliability of Phosphor-converted White LED

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題名:	白光LED封裝效率與可靠性分析之研究;Study of Package Efficiency and Reliability of Phosphor-converted White LED
作者:	陳正健;Chen,Cheng-Chien
貢獻者:	光電科學與工程學系
關鍵詞:	發光二極體;LED封裝效率;LED光衰;螢光粉粒子數;螢光粉模型;LED;LED lighting decay;LED package efficiency;Phosphor model;Phosphor particle number
日期:	2012-09-19
上傳時間:	2012-11-12 14:29:48 (UTC+8)
出版者:	國立中央大學
摘要:	在本論文中我們探討並分析白光 LED 之封裝效率並提出一種快速檢測 LED 燈具壽命之方法。首先，我們利用已建構之YAG螢光粉模型在相同的相關色溫之條件下，分析六種封裝架構在封裝效率上的差異，並討論其封裝效率差異的原因，再探討改變散熱基板反射率與晶粒對於藍光的吸收率等參數對封裝效率的變化；並搭配實際封裝與量測進行驗證，提出封裝效率最高之封裝體與討論實際封裝體之損耗來源。接著我們提出螢光粉粒子數用以整合螢光粉層中之濃度與厚度並以此討論白光 LED 封裝在光學與色彩上的表現，藉此簡化在螢光粉封裝時的參數，並驗證在相同相關色溫中，分析兩種不同封裝架構之不同濃度厚度在發光效率上的差別。最後，我們提出一套能供產線使用且能快速檢測 LED 燈具壽命之架構，能大幅降低檢測之時間與提升量測上的便利性；在架構中我們先利用加速老化的方式建立 LED 之結溫對於燈具壽命之關係，再取得不同光衰與結溫溫差的對應方程式與決定初始照度值的量測方式而得可利用光衰快速推算 LED 燈具壽命之模型，並以實驗進行驗證與討論實驗量測之誤差，且針對實際產線應用上提出建議之光衰值。In this thesis, we analyzed the package efficiency of white light LEDs and proposed a method to evaluate the lifetime of LED lamps rapidly. Based on the well-constructed YAG phosphor optical model, we analyzed the difference of package efficiency with six different package structures under the same correlated color temperature. And we discussed the influence of the package loss by changing the reflectivity of the substrate and the absorption coefficient of the die. Then we verified the experimental results with simulation data and investigated the difference of package loss with experimental package.In order to figure out the effect of different thickness and concentration of phosphors on the performance of LEDs, we demonstrated a method to calculate the phosphor particle numbers and studied the relationship among phosphor particle numbers, light output and correlated color temperature of LEDs under remote package type and dispensing package type. And we can simplify the parameter of LED package by using phosphor particle numbers. Finally, we proposed a method to estimate the lifetime of LED lamps quickly and this method can reduce the time for detection. We applied the accelerated test method to build up the relationship among the junction temperature of LEDs and lifetime, then we established the function of lighting decay and difference of junction temperature, we also decided the method to get the initial points. Finally, we combined all those methods to evaluate the lifetime of LEDs lamps rapidly and verified the results with the experimental data. And we suggested a value of lighting decay for the practical application.
顯示於類別:	[光電科學研究所] 博碩士論文

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