中大機構典藏-NCU Institutional Repository-提供博碩士論文、考古題、期刊論文、研究計畫等下載:Item 987654321/69010
English  |  正體中文  |  简体中文  |  Items with full text/Total items : 80990/80990 (100%)
Visitors : 41255870      Online Users : 88
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version


    Please use this identifier to cite or link to this item: http://ir.lib.ncu.edu.tw/handle/987654321/69010


    Title: 深冷變形與陽極處理對6066-T6機械性質的影響;Effect of Cryogenic deformation and anodized treatment on AA6066-T6 mechanical properties
    Authors: 楊樺成;Yong,Hwa-sheng
    Contributors: 機械工程學系
    Keywords: 鋁合金6066-T6;深冷鍛造;析出物;陽極處理;AA6066-T6;cryogenic forging;precipitates;anodized
    Date: 2015-07-29
    Issue Date: 2015-09-23 14:52:54 (UTC+8)
    Publisher: 國立中央大學
    Abstract: 在這項研究中,鋁合金6066經過退火後深冷鍛造,再進行固溶處理和頂時效處理。深冷鍛造鋁合金與傳統的鋁合金6066-T6合金相比,深冷鍛造鋁合金在延展性增加35%,但在UTS和YS上卻犧牲了大約8%。陽極處理對於6066-T6有/無深冷鍛試片的抗腐蝕能力一併加以量測和討論。;In this study, AA6066 alloy samples were cryogenically forged after annealing and then subjected to solution and aging treatments. Compared with conventional 6066-T6 alloy samples, the cryogenically forged samples exhibited a 35% increase in elongation but sacrificed about 8% in UTS and YS. The effect of anodization on the corrosion resistance of 6066-T6 with/without cryogenically-forged samples was also investigated, and the results are discussed in this study.
    Appears in Collections:[Graduate Institute of Mechanical Engineering] Electronic Thesis & Dissertation

    Files in This Item:

    File Description SizeFormat
    index.html0KbHTML330View/Open


    All items in NCUIR are protected by copyright, with all rights reserved.

    社群 sharing

    ::: Copyright National Central University. | 國立中央大學圖書館版權所有 | 收藏本站 | 設為首頁 | 最佳瀏覽畫面: 1024*768 | 建站日期:8-24-2009 :::
    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library IR team Copyright ©   - 隱私權政策聲明