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    Please use this identifier to cite or link to this item: http://ir.lib.ncu.edu.tw/handle/987654321/9101


    Title: 氮化鋁中間層對氮化鋁鎵/氮化鎵異質接面場效電晶體之影響
    Authors: 甘佳民;Jian-Ming Gan
    Contributors: 電機工程研究所
    Keywords: 氮化鋁;中間層;異質接面場效電晶體;氮化鎵;氮化鋁鎵/氮化鎵;AlN;interlayer;HFET;GaN;AlGaN/GaN
    Date: 2001-07-17
    Issue Date: 2009-09-22 11:41:07 (UTC+8)
    Publisher: 國立中央大學圖書館
    Abstract: 在磊晶氮化鎵於藍寶石基板㆖時,由於晶格不匹配,導致在氮化鎵與基板介面間產生線差排,而此差排會往㆖延伸到表面,如此會降低材料㆗的電子遷移率。有論文發表在磊晶緩衝層時,若於緩衝層㆗加入了AlN interlayer可以減少這線差排。本文旨要在分析加入了這AlN interlayer以後,除了改善我們磊晶的品質外,觀看這是否會對我們元件特性有其它影響。除了元件特性外,本文尚討論了AlN interlayer與AlGaN對㆓維電子海的影響。
    Appears in Collections:[Graduate Institute of Electrical Engineering] Electronic Thesis & Dissertation

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