提升可撓式薄膜電晶體之類比電路可靠度的快速自動化設計方法

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姓名

吳宛蓉(Wan-Rong Wu) 查詢紙本館藏

畢業系所

電機工程學系

論文名稱

提升可撓式薄膜電晶體之類比電路可靠度的快速自動化設計方法
(Fast Reliability-Aware Automatic Sizing Approach for the Analog Circuits with Flexible TFTs)

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摘要(中)

軟性電子(flexible electronics)具有許多優點，常應用於可攜式產品。由於可撓式薄膜電晶體許多特性與傳統CMOS 不同，CMOS 設計技術不能直接應用於軟性電子產品上，而且激烈的參數變化和產品老化效應會對軟性電子電路的設計形成巨大的挑戰，尤其是敏感的類比電路，因此一套可提升軟性電子可靠度的電路設計方法是必不可少的。
本論文提出了一種針對可撓式薄膜電晶體的類比電路自動化最佳化技術，來解決軟性電子中激烈的參數變化和電路老化效應的問題。為了提高精準度與電路設計流程的效率，本論文將最壞情況距離(worst case distance)的概念導入以方程式為基礎的自動化設計流程中，可撓式薄膜電晶體的特殊性質，例如激烈的參數變動敏感、彎曲效應、臨界電壓漂移現象等等，都有考慮在最佳化流程之中，可有效提高良率。此外，本論文提出了一種在電路設計流程當中快速預估電路老化後參數的近似方式，可以有效地考慮電路效能漂移現象。實驗結果顯示，本論文提出的自動化設計方式，可以考量電路可靠度的問題，有效地提高設計良率和產品的壽命，解決了軟性電子類比電路設計的問題。

摘要(英)

Flexible electronics are possible alternative to conventional silicon electronics
for portable consumer applications with many advantages. Due to quite different
properties of flexible TFTs, conventional CMOS design techniques cannot be used
directly on flexible electronics. The severe parameter variations and aging effects of
flexible electronics are big challenges for circuit designers, especially for sensitive
analog circuits. Robust circuit design methodology is essential to implement more
complex applications with flexible electronics.
This thesis proposes an automatic robust optimization technique for analog
circuits with flexible TFTs to deal with the severe parameter variations and aging
effects. To improve both accuracy and efficiency of the circuit sizing procedure, the
WCD concept is integrated into equation-based sizing approach in this work to
optimize the design yield with accurate variation consideration. The different
properties of flexible TFTs such as bending and severe Vt variation are considered in
the optimization algorithm. Furthermore, this thesis proposes a fast approximation
technique to predict the parameter aging in the circuits to consider the shifted
performance in the circuit sizing procedure. As demonstrated on different cases with
flexible electronics, the proposed robust optimization technique can significantly
improve the fresh design yield and the lifetime yield, which solves the main difficulty
of designing the analog circuits with flexible electronics.

關鍵字(中)

★ 設計
★ 可撓式
★ 薄膜電晶體
★ 類比電路
★ 可靠度
★ 自動化

關鍵字(英)

★ Automatic
★ Sizing Approach
★ Analog Circuits
★ Flexible TFTs
★ Reliability

論文目次

摘要 i
Abstract ii
目錄 iv
圖目錄 vi
表目錄 viii
第一章、緒論 1
1-1 軟性電子所面臨的問題 1
1-2 相關研究 7
1-3 研究動機 12
1-4 論文結構 16
第二章、背景知識 17
2-1 電壓驅動設計方法 17
2-1-1 非線性規劃 18
2-1-2 gm/ID方法 19
2-1-3 限制條件與目標函數 22
2-1-4 取得電晶體尺寸 24
2-1-5 電壓驅動設計流程 25
2-2 可撓式薄膜電晶體運算放大器 26
2-3 可撓式薄膜電晶體老化模型 28
第三章、自動化可靠度導向設計 32
3-1 階層式變異度考量方法 32
3-2 快速預估電路老化後參數 36
3-3 考慮可靠度的限制條件與目標函數 38
3-4 考慮可靠度的設計流程 39
第四章、實驗結果與分析 42
4-1 實驗環境 42
4-2 實驗結果 42
4-2-1 考慮剛出廠電路良率實驗結果 43
4-2-2 考慮可靠度實驗結果 47
第五章、結論 51
第六章、參考文獻 52

參考文獻

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指導教授

劉建男(Chien-Nan Jimmy Liu)

審核日期

2012-8-16

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