新型散射元件全場域光場量測之研究

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姓名

陳彥霖(Yen-Lin Chen) 查詢紙本館藏

畢業系所

照明與顯示科技研究所

論文名稱

新型散射元件全場域光場量測之研究
(A novel technique for measurement of whole field optical distribution of scattering component)

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摘要(中)

本論文中，我們提出新穎之 BSDF 量測系統，為了達到最終之二維 BSDF 量測資料，我們先嘗試既有之錐光量測系統，鑑於數值孔徑上的限制，遂提出平面成像量測系統並逐步改良至全域成像量測系統。最後，利用全域成像量測系統，可以量測出散射片之穿透散射光角度分佈與反射散射光角度分佈，並且利用一維散角量測系統的實驗結果驗證了全域成像量測系統之準確性。

摘要(英)

In this thesis, we propose novel systems for BSDF measurement. In order to obtain the 2-D BSDF measurement data, we try to use the conoscopic system. The conoscopic system has restriction on the numerical aperture, so we propose a planar imaging measurement system and improve it to whole field imaging measurement system. The whole field imaging measurement system can measure both the transmittance scattering distribution and reflectance scattering distribution for different kinds of diffusers. Finally, we use 1-D measurement result to prove its reliability.

關鍵字(中)

★ 散射片
★ 散射
★ 雙向散射分佈函數
★ 雙向穿透分佈函數
★ 雙向反射分佈函數

關鍵字(英)

★ BSDF
★ BTDF
★ BRDF
★ scattering

論文目次

摘要 I
Abstract II
致謝 III
目錄 V
圖索引 IX
表索引 XV
第一章緖論 1
1-1散射學發展 1
1-2研究動機與目的 2
1-3論文大綱 3
第二章原理介紹 5
2-1輻射學（Radiometry） 5
2-1-1 Cosine-third law 11
2-1-2 Cosine-fourth law 12
2-2光的散射行為 13
2-3雙向散射分佈函數（Bidirectional scattering distribution function） 15
第三章光學散射元件之一維散角量測系統 17
3-1一維散角量測架構說明 17
3-2一維散角之光斑解決方法 19
3-3不同散射片之實驗量測結果 19
3-3結論 21
第四章錐光（Conoscopic）量測系統 23
4-1錐光量測系統之原理 23
4-2錐光量測系統之架構 24
4-2-1 CMOS 影像中的像素（Pixel）位置與散射光角度之對應關係 25
4-2-2 灰階值與能量之關係的實驗架構與量測方法 28
4-2-3 波長為632.8 nm時之不同曝光時間的灰階值與能量之關係 29
4-2-4 不同曝光時間之影像疊加方法 32
4-3不同入射角度下之 Sample_1量測結果 33
4-4一維散角量測結果驗證錐光量測系統量測結果 36
4-5結論 38
第五章平面成像量測系統 39
5-1平面成像量測系統之原理 39
5-2平面成像量測系統之影像校正 42
5-2-1相機CMOS 上之影像能量修正 42
5-2-2 相機 CMOS 上影像之座標轉換 44
5-2-3 波長為532 nm 時之灰階值與能量相對關係 46
5-3平面成像量測系統之實驗架構 48
5-4不同入射角度的實驗結果 53
5-5利用一維的量測結果驗證二維的量測結果 54
5-6結論 56
第六章全域成像量測系統 57
6-1全域成像量測系統之實驗方法 57
6-2全域成像量測系統之架構 58
6-2-1 全域成像量測系統之影像強度修正 61
6-3不同方位之影像結合方法 62
6-4利用一維的量測結果驗證二維的量測結果 69
6-5結論 72
第七章結論 73
參考文獻 74
中英文名詞對照表 77

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指導教授

孫慶成(Ching - Cherng Sun)

審核日期

2011-7-27

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