參考文獻 |
[1] Balakrishnan, N. and Ling, M. H. (2012). “EM algorithm for one-shot device testing
under the exponential distribution.” Computational Statistics & Data Analysis, 56, 502-
509.
[2] Basu, S., Basu, A. P., and Mukhopadhyay, C. (1999). “Bayesian analysis for masked
system failure data using nonidentical weibull models.” Journal of Statistical Planning
and Inference, 78, 255-275.
[3] Beger, J. O. and Sun, D. (1993). “Bayesian analysis for the poly-weibull distribution.”
Journal of the American Statistical Association, 88, 1412-1418.
[4] Bunea, C. and Mazzuchi, T. A. (2005). “Bayesian accelerated life testing under competing
failure mode.” IEEE Transactions on reliability, 54, 152-157.
[5] Bunea, C. and Mazzuchi, T. A. (2006). “Competing failure modes in accelerated life
testing.” Journal of Statistical Planning and Inference, 136, 1608-1620.
[6] Efron, B. (1979). “Bootstrap method:another look at the jacknife.” Annals of
Statist., 17, 1-26.
[7] Fan, T. H., Balakrishnan, N. and Chang, C. C. (2009). “The Bayesian approach for highly
reliable electro-explosive devices using one-shot device testing.” Journal of Statistical Computation and Simulation, 79, 1143-1154.
[8] Fan, T. H. and Chang, C. C. (2009). “A Bayesian zero-failure reliability demonstration
test of high quality electro-explosive devices.” Quality and Reliability Engineering
International, 25, 913-920.
[9] Fan, T. H. and Hsu, T. M. (2012). ”Accelerated life tests of a series system with masked
interval data under exponential lifetime distributions”. To appear in IEEE Transactions
on Reliability.
[10] Fan, T. H. and Wang, W. L. (2011). “Accelerated life tests for independent weibull series
systems with masked Type-I censored data.” IEEE Transactions on Reliability, 60, 557-
569.
[11] Guttman, I., Lin, D. K. J., Reiser, B. and Usher, J. S. (1995). “Dependent masking and
system life data analysis: Bayesian inference for twocomponent systems.” Lifetime Data
Analysis, 1, 87-100.
[12] Hastings, W. K. (1970). “Monte carlo sampling methods using markov chains and their
applications.” Biometrika, 57, 97-109.
[13] Khamis, IH. (1997). “Comparison between constant and step-stress tests for weibull
models.” International Journal of Quality & Reliability Management, 14, 74-81.
[14] Kim, C. M. and Bai, D. S. (2002). “Analyses of accelerated life test data under two failure
modes.” International Journal of Reliability, Quality and Safety Engineering, 9, 111-126.
[15] Klein, J. P. and Basu, A. P. (1981). “Weibull accelerated life test when there are competing
causes of failure.” Communications in Statistics, Theory andMethods, 10, 2073-2100.
[16] Klein, J. P. and Basu, A. P. (1982). “Accelerated life tests under competing weibull
causes of failure.” Communications in Statistics, Theory and Methods, 11, 2271-2286.
[17] Kuo, L. and Yang, T. (2000). “Bayesian reliability modeling for masked system lifetime
data.” Statistics and Probability Letters, 47, 229-241.
[18] Mazzuchi, T. A., Soyer, R. and Vopatek A. (1997). “Linear Bayesian inference for accelerated
weibull model.” Lifetime Data Analysis, 3, 63-75.
[19] Meeker, W. Q. and Escobar, L. A. (1998). Statistical Methods for Reliability Data.Wiley,
New York.
[20] Metropolis, N., Rosenbluth, A.W., Rosenbluth, M.N., Teller, A.H., and Teller,
E. (1953). “Equations of state calculations by fast computing machines.” Journal of
Chemical Physics, 21, 1087-1092.
[21] Miyakawa, M. (1984). “Analysis of incomplete data in competing risk model.” IEEE
Transactions on Reliability, 33, 293-296.
[22] Mukhopadhyay, C. (2006). “Maximum likelihood analysis of masked series system lifetime
data.” Journal of Statistical Planning and Inference, 136, 803-838.
[23] Mukhopadhyay, C. and Basu, A. P. (1993). Bayesian analysis of competing risks: k
independent exponentials. Technical Report No.516, Department of Statistics, The Ohio
State University.
[24] Mukhopadhyay, C. and Basu, A. P. (1997). “Bayesian analysis of incomplete time and
cause of failure data.” Journal of Statistical Planning and Inference, 59, 79-100.
[25] Nelson, W. (1980). “Accelerated life testing-step-stress model and data analysis.” IEEE
Transactions on Reliability, 29, 103-108.
[26] Nelson, W. (1990). Accelerated Testing: Statistical Models, Test Plans, and Data Analysis.
New York: John Wiley & Sons.
[27] Sarhan, A. M. (2001). “Reliability estimations of components from masked system life
data.” Reliability Engineering and System Safety, 74, 107-113.
[28] Sarhan, A. M. (2003). “Estimation of system components reliabilities using masked
data.” Applied Mathematics and Computation, 136, 79-92.
[29] Tan, Y., Zhang, C. and Chen, X (2009). “Bayesain analysis of incomplete data from
accelerated life testing with competing failure modes.” IEEE Transactions on Reliability,
58, 1268-1272.
[30] Tanner, M. A., Wong, W. H. (1987). “The calculation of posterior distributions by data
augmentation.” Journal of the American Statistical Association, 82, 528-550.
[31] Usher, J. S. (1996). “Weibull component reliability-prediction in the presence of masked
data.” IEEE Transactions on Reliability, 45, 229-232.
[32] Usher, J. S. and Hodgson, T. J. (1988). “Maximum likelihood analysis of component
reliability using masked system life-test data.” IEEE Transactions on Reliability, 37, 550-
555.
[33] Van Dorp, J. R. and Mazzuchi, T. A. (2004). “A general Bayes exponential inference
model for accelerated life testing.” Journal of Statistical Planning and Inference, 119, 55-
74.
[34] Wang, W. and Kececioglu, D. B. (2000). “Fitting the weibull log-linear model to accelerated
life-test data.” IEEE Transactions on Reliability, 49, 217-223.
[35] Watkins, A. J. (1994). “Review: likelihood method for fitting weibull log-linear models
to accelerated life-test data.” IEEE Transactions on Reliability, 43, 361-365.
[36] Xu, A. and Tang, Y. (2011). “Objective Bayesian analysis of accelerated competing
failure models under Type-I censoring.” Computational Statistics & Data Analysis,
55, 2830-2839.
[37] Yang, G. B. (1994). “Optimum constant stress accelerated life test plans.” IEEE Transactions
on Reliability, 43, 575-581.
[38] Yu, I. T., Wang Z. H., Cheng, S. W. and Fuh, C. D. (2002). “Reliability analysis for
pyrotechnics product.” Journal of Chinese Statistical Association, 40, 333-360.
|