博碩士論文 101623010 完整後設資料紀錄

DC 欄位 語言
DC.contributor太空科學研究所zh_TW
DC.creator彭偉杰zh_TW
DC.creatorWei-Jie Pengen_US
dc.date.accessioned2014-7-28T07:39:07Z
dc.date.available2014-7-28T07:39:07Z
dc.date.issued2014
dc.identifier.urihttp://ir.lib.ncu.edu.tw:88/thesis/view_etd.asp?URN=101623010
dc.contributor.department太空科學研究所zh_TW
DC.description國立中央大學zh_TW
DC.descriptionNational Central Universityen_US
dc.description.abstract福衛五號先進電離層探測儀(Advanced Ionosperic Probe, AIP)需要一套整合測試系統,驗證其中電漿探測器的量測特性,找出誤差範圍與校正曲線。此系統使用的硬體為NI-cRIO 9074搭配自製的三種C型模組,分別為收發模組(Transceiver Module)、SPI模組(皆為單端與差分訊號轉換),電源模組(電源監控與配置)。使用的軟體為LabVIEW FPGA Module與LabVIEW Real-Time Module。透過LabVIEW FPGA Module,撰寫類比轉數位元件(ADC-LTC1867)、數位轉類比元件(DAC-DAC121S101QCMK)、溫度感測器(TMP-TMP122AMDBVTEP)的SPI數位波形與其他數位IO的控制。透過LabVIEW Real-Time Module,撰寫指令收發與科學資料處理之功能。利用此測試系統,本論文已量測出探測器的掃描電壓校正曲線、電流注入校正曲線等重要特性,未來福衛五號進行科學量測時,將可依此正確地解釋量測的電離層參數。zh_TW
dc.description.abstractSince the production of flight model of Advanced Ionospheric Probe (AIP) of FORMOSAT-5 (FS-5) has been completed. A test system is required to measure the characteristics of the sensor. The integrated test system is an overall solution for the controll, test and calibration for AIP. The main purpose is to measure the characteristics of sensor, finding the error range and the calibration curve. The hardware contains a controller of NI-cRIO 9074 and three self-made C series modules: transceiver module, SPI module and power module. Transceiver module and SPI module convert the single-ended signal to differential signal or in reverse. Power module distributes power to all devices and continuesly monitoring the current comsuption. The software is built with the embedded framework combined with LabVIEW FPGA module and LabVIEW Real-Time OS, which is based on the LabVIEW programming language. The LabVIEW FPGA module is used to achieve the SPI interfacing for ADC of LTC1867, DAC of DAC121S101, TMP of TMP122 and also some low-level IO control. The LabVIEW Real-Time OS is used to build the top-level UI consisted of command transmitter, science data viewer, and the preview on the result of data characteristics in real-time. This system is able to perform the current injection test to get the profile of calibration curves of AIP sensor, and also with the complete function of SPEU to perform the plasma injection test inside plasma chamber. With the integrated test system, a series of comprehensive test are done to get the parameters and characterestics curves of sensor, to ensure the accuracy and quality of geophysical data from AIP onboarded FS-5.en_US
DC.subject先進電離層探測儀zh_TW
DC.subjectAdvanced Ionospheric Probeen_US
DC.title先進電離層探測儀整合測試系統zh_TW
dc.language.isozh-TWzh-TW
DC.titleIntegrated Test System of Advanced Ionospheric Probeen_US
DC.type博碩士論文zh_TW
DC.typethesisen_US
DC.publisherNational Central Universityen_US

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