博碩士論文 105225027 完整後設資料紀錄

DC 欄位	值	語言
DC.contributor	統計研究所	zh_TW
DC.creator	藍啟豪	zh_TW
DC.creator	Chi-Hao Lan	en_US
dc.date.accessioned	2018-12-13T07:39:07Z
dc.date.available	2018-12-13T07:39:07Z
dc.date.issued	2018
dc.identifier.uri	http://ir.lib.ncu.edu.tw:88/thesis/view_etd.asp?URN=105225027
dc.contributor.department	統計研究所	zh_TW
DC.description	國立中央大學	zh_TW
DC.description	National Central University	en_US
dc.description.abstract	加速破壞性衰變試驗常用來評估一次性產品之可靠度資訊。而規劃此類型的計畫中，模型的假設、量測時間的選擇、應力水準的設定及其樣本配置的比例，皆會影響產品可靠度推論的精確性。本文將常用的加速破壞性衰變模型，加入具描述時間相關性之隨機過程，來配適實際資料以增加模型解釋之能力。利用類蒙地卡羅 (qusai-Monte Carlo) 方法來估計未知參數，且提供簡易流程來驗證衰變模型之適合性。最後，在模型參數是可辨別的條件下，提出最少試驗組合之D-最佳化實驗計畫。	zh_TW
dc.description.abstract	Accelerated destructive degradation tests (ADDTs) are commonly used to assess the reliability information of one-shot products. The accuracy of the reliability inference can be affected by the settings of test plan, including model assumptions, measurement times, stress levels and sample size allocations. This thesis takes stochastic processes into consideration in the traditional ADDT model to improve the ability of model interpretation. The qusai-Monte Carlo method is used to estimate the unknown parameters and a simple model-checking procedure is provided to assess the validity of different model assumptions. Finally, the D-optimal test plan with minimum run-size is proposed under the model assumption with identifiability.	en_US
DC.subject	加速破壞性衰變試驗	zh_TW
DC.subject	隨機過程	zh_TW
DC.subject	類蒙地卡羅	zh_TW
DC.subject	可辨別性	zh_TW
DC.subject	D-最佳化	zh_TW
DC.subject	accelerated destructive degradation tests	en_US
DC.subject	stochastic process	en_US
DC.subject	identifiability	en_US
DC.subject	qusai-Monte Carlo	en_US
DC.subject	D-optimality	en_US
DC.title	加速破壞性衰變模型之最佳實驗配置	zh_TW
dc.language.iso	zh-TW	zh-TW
DC.title	Optimal Test Plans of Accelerated Destructive Degradation Models	en_US
DC.type	博碩士論文	zh_TW
DC.type	thesis	en_US
DC.publisher	National Central University	en_US