博碩士論文 105328024 完整後設資料紀錄

DC 欄位 語言
DC.contributor能源工程研究所zh_TW
DC.creator葉政緯zh_TW
DC.creatorYE,ZHENG-WEIen_US
dc.date.accessioned2018-8-13T07:39:07Z
dc.date.available2018-8-13T07:39:07Z
dc.date.issued2018
dc.identifier.urihttp://ir.lib.ncu.edu.tw:88/thesis/view_etd.asp?URN=105328024
dc.contributor.department能源工程研究所zh_TW
DC.description國立中央大學zh_TW
DC.descriptionNational Central Universityen_US
dc.description.abstract近年來,氮化鎵薄膜材料因為擁有耐高溫、耐高壓與電組小等特性,被視為未來半導體材料的重心之一。而氮化鎵是以金屬有機化學氣相沉積法(MOCVD)製成,並以三甲基鎵(TMGa)與氨氣(NH3)作為前驅物進行磊晶。為了達成半導體元件的需求,控制氮化鎵的電阻值則相當重要,當碳濃度過高的時候,薄膜電阻值也會過高,因此控制薄膜碳含量是一件很重要的事。 由於氮化鎵在實驗時無法量測腔內中的含碳氣體,使進行實驗無法確切了解氣相中的化學反應,因此建立含碳反應的數值模型相當關鍵,在過去的參考文獻已經建立了隨著製程溫度變化的氮化鎵含碳反應模型,但是根據文獻的實驗碳濃度也會隨著壓力、載氣與氨氣的流量變化,因此本研究將建立與溫度、壓力、氣體流量有關的碳反應模型,藉此深入探討各項製程參數的變化對薄膜含碳濃度的影響。 最後研究結果顯示,溫度上升的時候,碳濃度會因為解吸速度上升而降低,而壓力上升的時候,氮化鎵與含碳物種吸附量會上升,但因為壓力同時會影響到解吸速度進而使碳濃度下降,另外在三甲基鎵流量上升的時候,碳濃度會因為熱裂解產生更多的含碳物種而增加,在氨氣流量增加時,會使甲基與氨氣的反應加速形成不易吸附到表面的甲烷,而使碳濃度下降,最後當氫氣流量上升時,碳濃度會因為氫氣減少主要碳吸附物種而降低。同整模擬結果後可以得到結論,要製成含碳濃度較低的薄膜,可以在製程上以高溫、高壓、高氨氣、高氫氣、低三甲基鎵流量進行長晶。zh_TW
dc.description.abstractIn recent years, GaN film materials are regarded as one of important future semiconductor materials because of their high temperature resistance, high voltage resistance and low resistance. Gallium nitride is produced by metal organic chemical vapor deposition (MOCVD). Epitaxial growth using trimethylgallium (TMGa) and ammonia (NH3) as precursors. In order to achieve the requirements of semiconductor components, controlling the resistance value of gallium nitride is very important. When the carbon concentration is too high, the resistance is also too high, so controlling the carbon content of the film is an important point. Since GaN cannot measure the carbon-containing gas in the reactor during the experiment, it is impossible to accurately understand the chemical reaction in the gas phase. Therefore, it is important to establish a numerical model containing the carbon reaction. In the past,references have been established the gallium nitride carbon-containing reaction model with different temperatures, according to the references the carbon concentration also varies with the pressure, carrier gas, and ammonia flow. Our study will establish the model that carbon concentration related to temperature, pressure, and gas flow. The model is used to further investigate the effect of carbon on the film in the variation of various parameters. Then the results of the study show when the temperature rises, the carbon concentration will decrease due to the increase of the desorption rate. When the pressure rises, the adsorption flux of gallium nitride and carbonaceous species will increase. However,the pressure will affect the desorption rate.So the carbon concentration will decreases. In addition, when the flow rate of trimethylgallium increases, the carbon concentration increases due to the pyrolysis to produce more carbon species. When the ammonia flow rate increases, the reaction between methyl and ammonia accelerates and the product methane is not easy to adsorb. The methane will decrease the carbon concentration. Finally, when the hydrogen flow rate rises, the carbon concentration will decrease as the hydrogen reduces the main carbon-adsorbed species. After the simulation results, it can be concluded that a film with a lower carbon concentration can epitaxy by having a high temperature, a high pressure, a high ammonia gas, a high hydrogen gas, and a low trimethylgallium flow rate in the process.en_US
DC.subject金屬有機化學氣相沉積法zh_TW
DC.subject氮化鎵zh_TW
DC.subject含碳濃度zh_TW
DC.subject水平式腔體zh_TW
DC.subjectMetal Organic Chemical Vapor Deposition,horizontal reactoren_US
DC.subjectgallium nitrideen_US
DC.subjectcarbonen_US
DC.subjecthorizontal reactoren_US
DC.titleMOCVD水平式腔體中氮化鎵薄膜製程碳濃度之模擬與傳輸現象分析zh_TW
dc.language.isozh-TWzh-TW
DC.titleNumerical analysis of carbon concentration in GaN films growth via MOCVD in horizontal reactoren_US
DC.type博碩士論文zh_TW
DC.typethesisen_US
DC.publisherNational Central Universityen_US

若有論文相關問題,請聯絡國立中央大學圖書館推廣服務組 TEL:(03)422-7151轉57407,或E-mail聯絡  - 隱私權政策聲明