| DC 欄位 |
值 |
語言 |
| DC.contributor | 工業管理研究所 | zh_TW |
| DC.creator | 王雲輝 | zh_TW |
| DC.creator | Wang | en_US |
| dc.date.accessioned | 2019-7-17T07:39:07Z | |
| dc.date.available | 2019-7-17T07:39:07Z | |
| dc.date.issued | 2019 | |
| dc.identifier.uri | http://ir.lib.ncu.edu.tw:88/thesis/view_etd.asp?URN=106456016 | |
| dc.contributor.department | 工業管理研究所 | zh_TW |
| DC.description | 國立中央大學 | zh_TW |
| DC.description | National Central University | en_US |
| dc.description.abstract | 由於記憶體產品已經與人們地生活息息相關，不論是手機或電腦甚至網路服務商，背後的儲存裝置已從傳統硬碟(HDD)逐漸更新成固態印碟(SSD)，其中重要零件便是本研究所提的快閃記憶體（NAND），因此在記憶體產品業界中，如何在最快地時間且兼顧品質的狀況下推出產品，這已經是各公司的重要的核心競爭力。
本研究將利用K-平均集群法(K-means)將快閃記憶體重新分群，將具有同特性的IC歸為一類，使得產品韌體開發人員能更能聚焦該快閃記憶體並了解該群快閃記憶體的特徵用適合的韌體演算法來處理快閃記憶體本身隨時間、製程等因素有不良的問題。經實驗結果證明，本研究的方法在同類型且不同批次的快閃記憶體上，最大數量的分群樣本都具備相同的特性，也可提供給研發及品經單位作為產品品質的參考依據。 | zh_TW |
| dc.description.abstract | Since the memory products have been closely related to people lives, whether it is a mobile, computer and internet service provider, the storage device behind it has been update from hard disk drive (HDD) to solid state drive(SSD), the key point is the NAND by the this research. Therefore, in the memory product market, how to launch products in the fastest time and quality is good, this is already an important core competitiveness of each company. This study will use the K-means to group the NAND, classify the ICs with the same characteristics, so that product firmware developers can focus on the NAND and understand the characteristics of the group NAND with appropriate firmware algorithms to handler the process problem and other lot or grade. The experimental results show that the method of this study has the same characteristics in the same type and different batch of NAND, this can also be provided to the R&D and quality department for reference the product and material quality. | en_US |
| DC.subject | 分群 | zh_TW |
| DC.subject | 快閃記憶體 | zh_TW |
| DC.subject | K-means | en_US |
| DC.subject | NAND | en_US |
| DC.title | 透過K-平均集群法及主成份分析方法改良快閃記憶體的測試方法 | zh_TW |
| dc.language.iso | zh-TW | zh-TW |
| DC.title | Improve the NAND IC Sorting method via K-means and principal component analysis. | en_US |
| DC.type | 博碩士論文 | zh_TW |
| DC.type | thesis | en_US |
| DC.publisher | National Central University | en_US |