DC 欄位 |
值 |
語言 |
DC.contributor | 統計研究所 | zh_TW |
DC.creator | 李侑瑾 | zh_TW |
DC.creator | Yu-Chin Lee | en_US |
dc.date.accessioned | 2020-9-29T07:39:07Z | |
dc.date.available | 2020-9-29T07:39:07Z | |
dc.date.issued | 2020 | |
dc.identifier.uri | http://ir.lib.ncu.edu.tw:88/thesis/view_etd.asp?URN=107225020 | |
dc.contributor.department | 統計研究所 | zh_TW |
DC.description | 國立中央大學 | zh_TW |
DC.description | National Central University | en_US |
dc.description.abstract | 破壞性衰變試驗在量測過程中,產品需經破壞方能取得與壽命相關之品質特徵值,卻無法再測試,導致每個樣本只有一筆衰變資料,提供非常有限的可靠度資訊。而高斯過程被廣泛地應用於衰變分析,但對厚尾資料之配適未臻理想。本文以包含高斯過程之學生-t 過程為基礎, 建立具有隨機效應之 (加速) 破壞性衰變模型,期能擬合具厚尾特徵的 (加速) 破壞性衰變資料,進而推論 (在正常應力下) 產品之壽命分配與相關性質。同時以多組實際資料說明產品壽命之可靠度估計、信賴區間以及模型之適合度診斷等。 | zh_TW |
dc.description.abstract | In a destructive degradation test, one must destroy the products to obtain values of the quality characteristic. As a result, only one meaningful measurement of the quality characteristic can be taken from each test unit. To analyze the degradation data, Gaussian process is a general model although it is not so appropriate to deal with heavy-tailed data. This thesis proposes a Student-t process, which includes Gaussian process as a special case, to assess the possibly heavy-tailed behavior of the degradation data and to draw the corresponding reliability inferences on the lifetime distribution. Random effects are introduced into the model to address the possible unit-to-unit variation. Five data sets are analyzed by the Student-t process and the resulting reliability analyses of products’ lifetime distributions as well as the goodness-of-fit tests are made based on the models selected via Akaike information criterion. | en_US |
DC.subject | 破壞性衰變試驗 | zh_TW |
DC.subject | 高斯過程 | zh_TW |
DC.subject | 學生-t 過程 | zh_TW |
DC.subject | 厚尾 | zh_TW |
DC.subject | 批次效應 | zh_TW |
DC.subject | destructive degradation test | en_US |
DC.subject | Gaussian process | en_US |
DC.subject | Student-t process | en_US |
DC.subject | heavy-tail | en_US |
DC.subject | batch effects | en_US |
DC.title | 學生-t 過程之破壞性衰變分析 | zh_TW |
dc.language.iso | zh-TW | zh-TW |
DC.title | Student-t Processes for Destructive Degradation Analysis | en_US |
DC.type | 博碩士論文 | zh_TW |
DC.type | thesis | en_US |
DC.publisher | National Central University | en_US |