博碩士論文 107225020 完整後設資料紀錄

DC 欄位 語言
DC.contributor統計研究所zh_TW
DC.creator李侑瑾zh_TW
DC.creatorYu-Chin Leeen_US
dc.date.accessioned2020-9-29T07:39:07Z
dc.date.available2020-9-29T07:39:07Z
dc.date.issued2020
dc.identifier.urihttp://ir.lib.ncu.edu.tw:88/thesis/view_etd.asp?URN=107225020
dc.contributor.department統計研究所zh_TW
DC.description國立中央大學zh_TW
DC.descriptionNational Central Universityen_US
dc.description.abstract破壞性衰變試驗在量測過程中,產品需經破壞方能取得與壽命相關之品質特徵值,卻無法再測試,導致每個樣本只有一筆衰變資料,提供非常有限的可靠度資訊。而高斯過程被廣泛地應用於衰變分析,但對厚尾資料之配適未臻理想。本文以包含高斯過程之學生-t 過程為基礎, 建立具有隨機效應之 (加速) 破壞性衰變模型,期能擬合具厚尾特徵的 (加速) 破壞性衰變資料,進而推論 (在正常應力下) 產品之壽命分配與相關性質。同時以多組實際資料說明產品壽命之可靠度估計、信賴區間以及模型之適合度診斷等。zh_TW
dc.description.abstractIn a destructive degradation test, one must destroy the products to obtain values of the quality characteristic. As a result, only one meaningful measurement of the quality characteristic can be taken from each test unit. To analyze the degradation data, Gaussian process is a general model although it is not so appropriate to deal with heavy-tailed data. This thesis proposes a Student-t process, which includes Gaussian process as a special case, to assess the possibly heavy-tailed behavior of the degradation data and to draw the corresponding reliability inferences on the lifetime distribution. Random effects are introduced into the model to address the possible unit-to-unit variation. Five data sets are analyzed by the Student-t process and the resulting reliability analyses of products’ lifetime distributions as well as the goodness-of-fit tests are made based on the models selected via Akaike information criterion.en_US
DC.subject破壞性衰變試驗zh_TW
DC.subject高斯過程zh_TW
DC.subject學生-t 過程zh_TW
DC.subject厚尾zh_TW
DC.subject批次效應zh_TW
DC.subjectdestructive degradation testen_US
DC.subjectGaussian processen_US
DC.subjectStudent-t processen_US
DC.subjectheavy-tailen_US
DC.subjectbatch effectsen_US
DC.title學生-t 過程之破壞性衰變分析zh_TW
dc.language.isozh-TWzh-TW
DC.titleStudent-t Processes for Destructive Degradation Analysisen_US
DC.type博碩士論文zh_TW
DC.typethesisen_US
DC.publisherNational Central Universityen_US

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