博碩士論文 107521010 完整後設資料紀錄

DC 欄位 語言
DC.contributor電機工程學系zh_TW
DC.creator陳雅寧zh_TW
DC.creatorYa-Ning Chenen_US
dc.date.accessioned2020-8-10T07:39:07Z
dc.date.available2020-8-10T07:39:07Z
dc.date.issued2020
dc.identifier.urihttp://ir.lib.ncu.edu.tw:88/thesis/view_etd.asp?URN=107521010
dc.contributor.department電機工程學系zh_TW
DC.description國立中央大學zh_TW
DC.descriptionNational Central Universityen_US
dc.description.abstract近年來近紅外光單光子崩潰二極體(Single Photon Avalanche Diode, SPAD) 被廣為研究,其應用相當廣泛,可用於光纖通訊為基礎的量子通訊及量子電腦、電子產業的VLSI電路或是車用電子偵測系統等。其原理為將元件操作於崩潰電壓以上,光子被吸收後產生載子,並於高電場下獲取能量觸發衝擊游離,因此具有相當高的增益,遂可用來偵測極低強度的光。 將SPAD元件製作成多像素陣列,可提高偵測器動態偵測範圍(dynamic range)或實現成像相關之應用;為了提高偵測效率,陣列設計會盡可能縮小SPAD元件間的間距來提升密度,減少光子損失。當元件崩潰時所產生的光學串擾,會因為間距的微縮而影響相鄰元件的偵測,導致其他元件發生非預期之崩潰,而影響偵測的準確性。 在本論文中,我們量測出InGaAs/InAlAs APD所產生的Breakdown flash波長,並使用光學模擬軟體Rsoft的FullWAVE功能,用計算共振腔品質因子的方法延伸應用至模擬SPAD陣列中光學串擾現象,模擬陣列中breakdown flash傳遞至相鄰元件的能量密度,藉由此方法來比較不同陣列結構設計下,光學串擾對相鄰元件之影響是否如預期趨勢相同,並印證此模擬方法可用於模擬SPAD陣列光學串擾現象,我們亦進一步分析何種設計可以有效降低光學串擾。zh_TW
dc.description.abstractIn recent years, near infrared single photon avalanche diodes (SPAD) have many applications in various fields including optical fiber-based quantum communications and quantum computers, VLSI circuits in the electronics industry, or automotive electronic detection systems. A SPAD is reversely biased above the breakdown voltage and the absorption of single photon can trigger impact ionization process, resulting infinite number of carriers to detect faint light. SPADs are made into a multi-pixel array to improve the detector dynamic range or enable imaging applications. To improve the detection efficiency, the distance between SPAD pixels should be minimized in order to increase the pixel density and hence reduce the photon loss. When the distance between each pixel is reduced, the breakdown flash generated by the avalanche carriers may travel to the nearby SPADs in the array, inducing unwanted avalanche events that would deteriorate the detection ability. In this paper, we pay great effort to measure the emission spectrum of breakdown flash produced by InGaAs/InAlAs SPAD, and further substitute the emission spectrum into the simulation tool of FullWAVE in Rsoft to study the issue of optical crosstalk in the SPAD array by applying the method similar to the calculation of the decay of resonance mode in cavity. Based on the above method, we can calculate the energy density of breakdown flash propagation. The optical crosstalk can be well predicted under different conditions. We also further discuss the effectiveness of several designs that can help to reduce the optical crosstalk.en_US
DC.subject單光子雪崩二極體zh_TW
DC.subject光學串擾zh_TW
DC.subject砷化銦鎵 /砷化鋁銦zh_TW
DC.subject崩潰閃光zh_TW
DC.subjectSPADen_US
DC.subjectOptical Crosstalken_US
DC.subjectbreakdown flashen_US
DC.subjectInGaAs/InAlAsen_US
DC.title在砷化銦鎵 /砷化鋁銦單光子崩潰二極體中崩潰閃光引致光學串擾之探討zh_TW
dc.language.isozh-TWzh-TW
DC.titleBreakdown Flash Induced Optical Crosstalk Issue in InGaAs/InAlAs Single Photon Avalanche Diodeen_US
DC.type博碩士論文zh_TW
DC.typethesisen_US
DC.publisherNational Central Universityen_US

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