博碩士論文 87324029 完整後設資料紀錄

DC 欄位 語言
DC.contributor電機工程學系zh_TW
DC.creator廖俊豪zh_TW
DC.creatorJing-Hau Laien_US
dc.date.accessioned2000-6-19T07:39:07Z
dc.date.available2000-6-19T07:39:07Z
dc.date.issued2000
dc.identifier.urihttp://ir.lib.ncu.edu.tw:88/thesis/view_etd.asp?URN=87324029
dc.contributor.department電機工程學系zh_TW
DC.description國立中央大學zh_TW
DC.descriptionNational Central Universityen_US
dc.description.abstract本論文探討含非晶矽化鍺氫梯度結構薄膜的金屬-半導體-金屬光偵測器特性。藉調整梯度結構層沉積的時間與溫度及利用氫氣退火等研究所製作的各種金屬-半導體-金屬光偵測器的交、直流特性。再者,利用自動對準製程完成溝渠式電極光偵測器並探討其特性。最後,利用金屬-半導體-金屬光偵測器的結構研發出低操作電壓之大工作面積光偵測器,以利實際運用的探討。zh_TW
dc.description.abstractIn this thesis, first, the metal-semiconductor-metal photodetectors (MSM-PDs) with a graded hydrogenated intrinsic amorphous silicon-germanium (i-a-Si1-xGex:H) film deposited on [100] n-type silicon wafer, and the Cr top-electrodes have been studied. The effects of elapsed-time during growing graded i-a-Si1-xGex:H layer, substrate temperature and H2-annealing on device characteristics were compared and discussed. Then, the fabrication process and characteristics of the MSM-PDs with self-aligned trench-electrodes were investigated. Their obtainable characteristics were nearly the same as those of a conventional MSM-PD with trench-electrodes, which needed an additional mask. Finally, instead of i-a-Si1-xGex:H film, the i-a-Si:H film was used and deposited on Si wafer to form MSM-PDs with large active-area. The effects of resistivity of Si wafer on device performances were also discussed. The device linearity, knee voltage, and dark current were studied.en_US
DC.subject光偵測器zh_TW
DC.subjectMSMen_US
DC.subjectphotodetectoren_US
DC.title金屬-半導體-金屬光偵測器的特性zh_TW
dc.language.isozh-TWzh-TW
DC.titleCharacteristics of MSM Photodetectorsen_US
DC.type博碩士論文zh_TW
DC.typethesisen_US
DC.publisherNational Central Universityen_US

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