| DC 欄位 |
值 |
語言 |
| DC.contributor | 機械工程學系 | zh_TW |
| DC.creator | 梁家倫 | zh_TW |
| DC.creator | Chia-Lun Liang | en_US |
| dc.date.accessioned | 2004-6-30T07:39:07Z | |
| dc.date.available | 2004-6-30T07:39:07Z | |
| dc.date.issued | 2004 | |
| dc.identifier.uri | http://ir.lib.ncu.edu.tw:88/thesis/view_etd.asp?URN=91323003 | |
| dc.contributor.department | 機械工程學系 | zh_TW |
| DC.description | 國立中央大學 | zh_TW |
| DC.description | National Central University | en_US |
| dc.description.abstract | 摘 要
在微鏡面元件致動面之殘留應力的量測研究中，為了使沉積材料達到堅韌之特性，故選擇以摻雜氮的鋁薄膜來作為微鏡面致動器之鉸鍊材料。在製程方面，以反應式濺鍍法來沉積、製作支撐柱及鉸鍊材料，藉此來改善選擇性鎢沉積後，薄膜會被氫氟酸所蝕刻的問題，並藉由調整沉積時之功率和氮氣流量的比例，來探討不同氮含量的氮化鋁(AlN)薄膜其材料性質之變化，包括薄膜所產生之熱應力、片電阻值及剛性等。
此外，為瞭解AlN薄膜之組成成分、晶格間距，以X光粉末繞射分析儀來分析試片薄膜的相結構，藉由元件在釋放犧牲層前、後所測得之晶格間距，推算出薄膜所產生之殘留應力值，探討其製程參數所造成之影響。以氮氣流量20％的薄膜沉積參數來作為殘留應力量測的結果中，以1000W的電漿功率下可產生一張應力，可供元件具彎曲後回復之力，以此作為製程之依據。 | zh_TW |
| dc.description.abstract | Abstract
In this study, in order to make the material reaching qualities of strength and toughness, so select aluminum nitride to do the hinge of micromirror actuator. In fabrication produce, to deposition and manufacture the contact holes and hinges by reactive sputtering deposition. By this way can improve the problem of membranes etched by hydrofluoric acid after selectivity tungsten deposition. To adjust deposition power and nitrogen flow rate also can confer the change in characters of aluminum nitride membranes for different nitrogen flow rate, including the thermal stresses, sheet resistances, and hardness that cased by membrane.
Furthermore, in order to understand the compose components, and lattice space in aluminum nitride membranes, used the X-ray powder diffractometer to analyze the phase structure in membranes. Employing the lattice space that measured in front and behind of sacrifical layer released, could calculate the residual stress value that cased from membrane, investigating the influences to fabrication process. And we could get that a twenty percent nitrogen flow and 1500 watts plasma power would cause a tensile force in actuating plane material. | en_US |
| DC.subject | 殘留應力 | zh_TW |
| DC.subject | 微鏡面 | zh_TW |
| DC.subject | 微機電 | zh_TW |
| DC.subject | MEMS | en_US |
| DC.subject | Micromirror | en_US |
| DC.subject | XRD | en_US |
| DC.subject | Residual Stress | en_US |
| DC.title | 微鏡面元件致動面之殘留應力的量測 | zh_TW |
| dc.language.iso | zh-TW | zh-TW |
| DC.title | Residual Stress Measurement of Actuating Plane in Micromirror | en_US |
| DC.type | 博碩士論文 | zh_TW |
| DC.type | thesis | en_US |
| DC.publisher | National Central University | en_US |