博碩士論文 93333003 完整後設資料紀錄

DC 欄位 語言
DC.contributor機械工程學系在職專班zh_TW
DC.creator詹舒卉zh_TW
DC.creatorSHU-HUEI JANen_US
dc.date.accessioned2008-1-11T07:39:07Z
dc.date.available2008-1-11T07:39:07Z
dc.date.issued2008
dc.identifier.urihttp://ir.lib.ncu.edu.tw:88/thesis/view_etd.asp?URN=93333003
dc.contributor.department機械工程學系在職專班zh_TW
DC.description國立中央大學zh_TW
DC.descriptionNational Central Universityen_US
dc.description.abstract本論文在探討數種商用助銲劑對錫-3銀-0.5銅無鉛銲錫在基板迴銲後電化學遷移行為之影響。電化學遷移研究在電導率186.2μS/cm之水中進行,迴銲時使用不同助銲劑,迴銲後兩銲球(直徑約1.2mm)相距0.80mm,在兩銲球間施加3或5V偏壓,結果顯示:隨著助銲劑的固形物含量的不同,當助銲劑的固形物含量增加,會延長電化學遷移短路之時間。 助銲劑成份中松香之C=O鍵結,其氧原子在迴銲後,已改變了其原本之C=O鍵結,而助銲劑與銲錫作用後,其表面之C-H鍵結,可以抑制電化學遷移之產生。 助銲劑之鹵素含量影響了電化學遷移的發生,而助銲劑中鹵素活性劑溴化物的添加,將促進電化學遷移之發生。zh_TW
dc.description.abstractThis paper relates to the effects of fluxes on the electrochemical migration of reflowed Sn-3Ag-0.5Cu solders in water. Electrochemical migration behaviors of reflowed Sn-3Ag-0.5Cu solders, so called Pb-free solders, by applying different fluxes have been studied. The electrochemical migration increasing resistance of the Sn-3Ag-0.5Cu solders at a bias of 3 or 5V with increasing Solid Content. Rosin is one of the contents of flux, and the C=O bonding of rosin is reduced after reflowing. When applying the fluxes to the solders, the C-H bonding in the surface of solders could increase the resistance of electrochemical migration. Halogen Content of the flux would change the characteristic of electrochemical migration. Halogen Content would encourage the electrochemical migrations.en_US
DC.subject陽極動態極化zh_TW
DC.subject無鉛銲料zh_TW
DC.subject錫銀銅銲料zh_TW
DC.subject助銲劑zh_TW
DC.subject鹵素zh_TW
DC.subject電化學遷移zh_TW
DC.subjectcyclic voltammetryen_US
DC.subjectanodic potentiodynamic polarizationen_US
DC.subjectlead-free soldersen_US
DC.subjectPb-free soldersen_US
DC.subjectfluxen_US
DC.subjecthalideen_US
DC.subjectSnAgCu solderen_US
DC.subjecthalogenen_US
DC.subjectelectrochemical migrationen_US
DC.title助銲劑對迴銲後Sn-3Ag-0.5Cu電化學遷移之影響zh_TW
dc.language.isozh-TWzh-TW
DC.titleEffects of fluxes on the electrochemical migration of reflowed Sn-3Ag-0.5Cu solders in wateren_US
DC.type博碩士論文zh_TW
DC.typethesisen_US
DC.publisherNational Central Universityen_US

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