博碩士論文 945201054 完整後設資料紀錄

DC 欄位 語言
DC.contributor電機工程學系zh_TW
DC.creator吳賀傑zh_TW
DC.creatorHo-Chieh Wuen_US
dc.date.accessioned2007-7-4T07:39:07Z
dc.date.available2007-7-4T07:39:07Z
dc.date.issued2007
dc.identifier.urihttp://ir.lib.ncu.edu.tw:88/thesis/view_etd.asp?URN=945201054
dc.contributor.department電機工程學系zh_TW
DC.description國立中央大學zh_TW
DC.descriptionNational Central Universityen_US
dc.description.abstract在這篇論文中,我們使用新變數來處理一維元件之AC模擬,同時,使用兩種方法來執行模擬,其一是經由內部模擬器來進行,另一個是經由外部模擬器,也就是我們實驗室所開發的AC_CKT 電路模擬器來執行。我們會介紹AC_CKT的使用方法並用幾個範例來介紹輸入檔的撰寫格式,然後我們以一個金氧半電晶體來做驗證,在不同頻率下量測其C-V曲線,最後比較兩種方法得到的模擬結果。zh_TW
dc.description.abstractIn this thesis, we use new variables to process 1-D device ac simulation. We develop two methods for ac simulation. One is through the internal ac solver. The other is through AC_CKT simulator which is developed by our group. We will introduce the AC_CKT simulator and use some examples to show how to write the input file for the AC_CKT simulator. Then, we use an MOS capacitor as an example to measure the C-V curve under different frequencies. Finally, we will compare the simulation results of the two methods.en_US
DC.subject交流zh_TW
DC.subjectacen_US
DC.title用新變數法探討一維半導體元件之交流模擬zh_TW
dc.language.isozh-TWzh-TW
DC.titleNew Variables for AC Simulation of 1–D Semiconductor Devicesen_US
DC.type博碩士論文zh_TW
DC.typethesisen_US
DC.publisherNational Central Universityen_US

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