| dc.description.abstract | Patent analysis is a method to assess the evolution direction of a specific technology, if we can utilize the knowledge revealed by patent analyses more effectively and precisely, it will helps the company to formulate the basis of policy for research and development. Different from the previous studies, we propose a method based on the network view that can analyse the correlation between two or more patents and industrial patent deployment. By identifying the correlation between two or more patents, the influence of these patents will be identified from points to surfaces. Furthermore, the observation of industrial patent deployment provides sufficient information to help us understand the current technology development. By conducting the aforementioned analysis, it will help the policy maker make a patent application that with influence in the appropriate technology field. In this study, we will integrate the small-world network and social network into the patent analysis and take the RFID, Nano and LCD industry as example. From the perspective of small-world network, this study examines the patent citation network of RFID industry to explore the structure of patent networks and the behavior of patent citation. It will provide us a full view and much information for observing the correlation between patents of industry. For a view of dynamic analysis, we investfigate the evolution of patent technology by exploring the patent application of Nano industry. Understanding the evolution of patent technology will help the policy maker make the direction of technology development for current stage and future. From a static point of view, we will identify critical patents in the LCD patent network and the influence of these patents. By identifying the critical patents, we can evaluate advantage and disadvantage of our technology and developing an appropriate technology strategy. According to the results of three cases conducted for this study, the approach proposed demonstrates an appropriate way for analyzing patent information.
| en_US |