博碩士論文 972206041 完整後設資料紀錄

DC 欄位	值	語言
DC.contributor	光電科學與工程學系	zh_TW
DC.creator	陳名邦	zh_TW
DC.creator	Ming-pang Chen	en_US
dc.date.accessioned	2010-10-7T07:39:07Z
dc.date.available	2010-10-7T07:39:07Z
dc.date.issued	2010
dc.identifier.uri	http://ir.lib.ncu.edu.tw:88/thesis/view_etd.asp?URN=972206041
dc.contributor.department	光電科學與工程學系	zh_TW
DC.description	國立中央大學	zh_TW
DC.description	National Central University	en_US
dc.description.abstract	本論文提出利用氦氖雷射打在光纖上的繞射圖形，藉由繞射圖形來檢測在二氧化碳雷射熔化法所製成的光纖品質，本系統改良傳統二氧化碳雷射法的製作，減少錐狀光纖製作完封包後，必須拿到光學顯微鏡下的步驟，本系統可以製作出其他光纖產品，近場掃描器的光纖探針等等。 在實驗中，由CCD Camera得到的繞射圖形，去校準光纖和氦氖雷射光點的相對位置，讓跟氦氖雷射共光路的二氧化碳雷射能有效率的打在光纖上，並且利用繞射圖形去判斷錐狀光纖的厚度。實驗中，其最好誤差值為-0.14(%/um)，代表其系統是可以被應用的，而錐狀光纖的厚度為16um，其穿透率為30%。	zh_TW
dc.description.abstract	In the thesis, we provide the improvement in fabricating tapered fiber by carbon dioxide laser melting method. We use the diffraction patterns formed by the fiber and He-Ne laser to investigate the quality of the taper fiber and calibrate the experiment system. The advantage of the system is to inspect the tapered fiber without packaging and reduce the cost. Moreover, we could utilize the system to produce probes for obtaining the super-resolution with the scanning near-field optical microscopy(SNOM). In the experiment, we demonstrate the tapered profile can be investigated by monitoring the far field diffraction patterns. Furthermore, the experimental results are in close agreement with the theoretical predictions and a tapered fiber with the waist of 16um was obtained.	en_US
DC.subject	繞射圖形	zh_TW
DC.subject	錐狀光纖	zh_TW
DC.subject	tapered fiber	en_US
DC.subject	diffraction patteren	en_US
DC.title	利用繞射圖形檢測錐狀光纖的製造與品質	zh_TW
dc.language.iso	zh-TW	zh-TW
DC.title	Investigation of the manufacturing and the quality of the optical tapered fibers based on diffraction patterens	en_US
DC.type	博碩士論文	zh_TW
DC.type	thesis	en_US
DC.publisher	National Central University	en_US