博碩士論文 992212014 完整後設資料紀錄

DC 欄位 語言
DC.contributor照明與顯示科技研究所zh_TW
DC.creator李書恩zh_TW
DC.creatorShu-En Lien_US
dc.date.accessioned2013-7-11T07:39:07Z
dc.date.available2013-7-11T07:39:07Z
dc.date.issued2013
dc.identifier.urihttp://ir.lib.ncu.edu.tw:88/thesis/view_etd.asp?URN=992212014
dc.contributor.department照明與顯示科技研究所zh_TW
DC.description國立中央大學zh_TW
DC.descriptionNational Central Universityen_US
dc.description.abstract本論文是以雙光子激發受激輻射耗損顯微鏡為目標,討論環形光場分布以及樣品螢光生命週期對其解析度之影響,提出增加解析度的方法。在環形光場的討論中,本研究採用模擬及光場量測分析以不同方式所產生的環形光場及其在強聚焦下的光場變化,而螢光生命週期的研究則是模擬的方式來了解螢光樣品的選擇可以如何幫助解析度的提昇。此外,本研究已著手進行系統的建構,期望能透過實際系統的建構來證實上述論點之可行性。zh_TW
dc.description.abstractThis thesis is based on the two-photon excitation stimulated-emission depletion microscopy to discuss the effects of donut beam and fluorescence lifetime on the spatial resolution of this system and propose the methods to improve the resolution. In this research, both simulation and experimental measurements were applied to analyze the intensity distributions of donut beams generated in different ways and their distributions under tightly-focusing condition. On the other hand, only simulation was used to discuss the impact of fluorescence lifetime on the spatial resolution improvement. Finally, in order to obtain the experimental evidences of our results, the two-photon excitation stimulated-emission depletion microscopy was setup.en_US
DC.subject顯微術zh_TW
DC.subject螢光zh_TW
DC.subject受激輻射耗損顯微術zh_TW
DC.subject環形光場zh_TW
DC.subjectmicroscopyen_US
DC.subjectSTED microscopyen_US
DC.subjectfluorescenceen_US
DC.subjectdonut beamen_US
DC.title雷射環狀模態及螢光生命週期於雙光子激發受激輻射耗損顯微術解析度提升之研究zh_TW
dc.language.isozh-TWzh-TW
DC.titleThe effects of donut mode and fluorescence lifetime on the resolution improvement of two-photon excitation STED microscopyen_US
DC.type博碩士論文zh_TW
DC.typethesisen_US
DC.publisherNational Central Universityen_US

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