博碩士論文 995201012 完整後設資料紀錄

DC 欄位 語言
DC.contributor電機工程學系zh_TW
DC.creator陳力維zh_TW
DC.creatorLi-Wei Chenen_US
dc.date.accessioned2012-7-9T07:39:07Z
dc.date.available2012-7-9T07:39:07Z
dc.date.issued2012
dc.identifier.urihttp://ir.lib.ncu.edu.tw:88/thesis/view_etd.asp?URN=995201012
dc.contributor.department電機工程學系zh_TW
DC.description國立中央大學zh_TW
DC.descriptionNational Central Universityen_US
dc.description.abstract在本篇論文中,我們將探討雙閘極金氧半場效電晶體的結構,而這結構有以下優 點:有效抑制短通道效應、低功率消耗、良好的閘極通道控制能力、較好的電流 驅動力、較低的通道漏電流以及接近理想的次臨限擺幅等。接著我們利用二維元 件模擬器探討雙閘極金氧半場效電晶體的元件特性,分析雙閘極與單閘極元件的 Id-Vg 曲線、單閘極與雙閘極在不同通道長度下的次臨限擺幅差異以及雙閘極元 件在不同體矽厚度下的漏電流。最後,利用臨限電壓公式驗證元件的開發是否正 確,再來探討改變各種參數對於元件的影響。 zh_TW
dc.description.abstractIn this thesis, we will investigate the structure of the double-gate MOSFETs. This structure has the following advantages: better short channel effect, low power consumption, good gate-channel control capability, better current driving force, the lower channel leakage current and near ideal sub-threshold swing, etc. Then we design a 2-D device simulator to investigate the device characteristics of the double-gate MOSFET. We analyze the Id-Vg curves of the double gate and single-gate components, sub-threshold swing difference in the different channel length, and double-gate leakage current in the different thickness of the bulk silicon. Finally, we use the threshold voltage formula to verify the validity of the 2-D device simulator,and then analyze the impact of the various design parameters. en_US
DC.subject雙閘極zh_TW
DC.subject短通道效應zh_TW
DC.subjectdouble Gateen_US
DC.subjectshort channel effectsen_US
DC.title二維雙閘極金氧半場效電晶體的探討與模擬zh_TW
dc.language.isozh-TWzh-TW
DC.titleAnalysis and Simulation of Two-DimensionalDouble-Gate MOSFETen_US
DC.type博碩士論文zh_TW
DC.typethesisen_US
DC.publisherNational Central Universityen_US

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