DC 欄位 |
值 |
語言 |
DC.contributor | 軟體工程研究所 | zh_TW |
DC.creator | 郭榮智 | zh_TW |
DC.creator | Jung-chih Kuo | en_US |
dc.date.accessioned | 2012-7-28T07:39:07Z | |
dc.date.available | 2012-7-28T07:39:07Z | |
dc.date.issued | 2012 | |
dc.identifier.uri | http://ir.lib.ncu.edu.tw:88/thesis/view_etd.asp?URN=995205004 | |
dc.contributor.department | 軟體工程研究所 | zh_TW |
DC.description | 國立中央大學 | zh_TW |
DC.description | National Central University | en_US |
dc.description.abstract | 由於物件導向方法越來越廣泛被使用在軟體開發上,所以如何測量物件導向軟體的品質變成為了重要課題,目前已經有非常多的測量物件導向軟體的metrics被提出來,也有metrics提供如何測量模組與模組之間的關連程度,像是MQ、IC和AC等。但是這些被提出來測量模組之間關係的metrics大多數沒有經過open source軟體來做測試,也沒有實驗性的驗證與說明,本篇論文針對MQ、IC和AC等提供測量modularization quality的metrics做了實驗分析,透過四十四個Eclipse專案,驗證這些metrics與fix response time和defect density之間不具有明顯的相關性,最後利用統計的方法來說明與解釋實驗結果。
| zh_TW |
dc.description.abstract | Nowadays, object-oriented design approach is widely used in software development. Therefore, how to measure the quality of object-oriented software has become an important issue. Recently, metrics have been proposed to measure modularization quality of object-oriented software, such as MQ, IC, and AC. However, there has been little work on validating these metrics by applying them to popular open-source software systems. In this work, we validated the correlation between the metrics and fix response time or defect density, respectively. Through the experiment on forty-four open source Eclipse projects, we showed that there are no obvious correlations between MQ/IC/AC metrics and fix response time or defect density, respectively.
| en_US |
DC.subject | 軟體 | zh_TW |
DC.subject | 驗證 | zh_TW |
DC.subject | 度量 | zh_TW |
DC.subject | 模組化 | zh_TW |
DC.subject | software | en_US |
DC.subject | experimental validation | en_US |
DC.subject | modularization | en_US |
DC.subject | metrics | en_US |
DC.title | 軟體模組化度量之實驗與驗證 | zh_TW |
dc.language.iso | zh-TW | zh-TW |
DC.title | Experimental Validation of Software Modularization Metrics | en_US |
DC.type | 博碩士論文 | zh_TW |
DC.type | thesis | en_US |
DC.publisher | National Central University | en_US |