| dc.description.abstract | In Thin-Film Transistor Liquid Crystal Display (TFT-LCD) panel module manufacturing process, how to repair mura defect, make use of the gets rid of the mura defect system (De-Mura) to again do the catch image, Image region of interest (ROI), the creation de-mura repair code and burn to record the de-mura process procedure that the datas, images to compare right of again repair, and inquire into image information or the manufacturing process last relativity of mura defect in TFT-LCD, whether the processing that can do a batch quantity according to same relation or characteristic directly burns to record to compensate the value, for example: ratio to image and production manufacturing process data, calculate the value (common code) to do the de-mura.
Mura defect of TFT-LCD panel for long time for influence the even of quality as an important factor, and now for satisfying the customer′s need, big size TFT-LCD panel, the manufacturing process that de-mura is also more important. The experiment characteristic aiming at TFT-LCD panel and manufacturing process data collections produce a common code burn to record in the panel of take a flash IC to do De-Mura, again effect of a great deal of identification confirmation de-mura, the use just noticeable distortion (JND) value and degree number of image information mutual difference of horizontal-vertical direction (H and V values) to judge, another confirm the gamma value optics whether have the influence.
Experiment with the TFT-LCD panel that obtains in times before the same batch image about 100 ~ 130 pcs of information, these information with each of pixel bright degree operation of the use mean, outlier-mean, median and mode, calculate the common code, use 100 pcs of TFT-LCD panel again to in great quantities identify (batch run). The degree number of image information mutual difference of horizontal direction (H value) is about 26 ~ 24, vertical direction (V value) is about 14 ~ 10, this method is obvious improvement.
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