博碩士論文 87324010 詳細資訊




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姓名 林宜宏( Yi-Horng Lin)  查詢紙本館藏   畢業系所 電機工程學系
論文名稱 系統晶片類比數位轉換器測試之數位信號處理程式庫
(DSP Library for SOC ADC Testing)
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關鍵字(中) ★ 類比數位轉換器
★ 信號雜訊比
★ 有效位元數
★ 類比數位轉換器動態測試
關鍵字(英) ★ ADC
★ SNR
★ ENOB
★ ADC Dynamic Testing
論文目次 1. Introduction …………………………………………………1
1.1 Motivations……………………………………………………1
1.2 The Test Issues in Mixed Signal ICs……………………2
1.3 Thesis Organization…………………………………………7
2. Methodology of Testing Mixed Signal SOC ………………9
2.1 Sample Methods ………………………………………………9
2.2 Hardware Architecture ……………………………………10
2.3 FFT Testing Technique ……………………………………17
2.4 Histogram Testing Technique ……………………………20
2.5 Summary ………………………………………………………25
3. Method of Probability for The SNR Measurement………26
3.1 SNR Measurement ……………………………………………26
3.2 Amplitude Response Measurement…………………………27
3.3 The Less-Than-Full-Scale Signal ………………………34
3.4 The Amplitude of The Main Frequency and Optimum
Sampling points ……………………………………………35
3.5 SNR and ENOB…………………………………………………36
3.6 Summary ………………………………………………………39
4. Simulation and Measurement ………………………………40
4.1 Test Environment……………………………………………40
4.2 Measurement Result…………………………………………42
4.3 Simulation for The Amplitude Reposed…………………49
4.4 Summary ………………………………………………………55
5. Conclusion ……………………………………………………56
6. Symbols…………………………………………………………57
7. Reference………………………………………………………58
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[3]Naim Ben-Hamida, Bechir Ayari and Bozena Kaminska.”Testing of Embedded A/D Converters in Mixed-Signal Circuit”, IEEE Trans. Istrum. Meas, pp35-136, 1996
[4]K.D.Wanger and T.W. Willians, “Design for testability of mixed signal integrated circuits “ , IEEE International Test Conference, pp.823-828, 1988
[5]R.G Bennetts, “ Progress in Design for Test: A Personal View “, IEEE Internation Test Conference, 1992.
[6]M. Mahony, DSP based Test, Computer Society press, IEEE, U.S.A.
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[11]Texas Instrument, TMS320C6201/6701 peripherals, 1998
[12]J. Weimer, K. Baade.J.Fitzsimmons, B.Lowe. “ A Rapid Dither Algorithm Advance A/D Converter Testing,” IEEE International Test Conference 1990, pp.498-507
[13]S. Max, “ Fast, Accurate and Complete ADC Testing”, International Test Conference 1989, pp 111-117.
[14]J. A. Mielke, “ Frequency Domain Testing of ADCs”, IEEE Design & Test of Computers, spring 1996 pp 64-69.
[15]F. Xu, U. Jorczyk, “ Testing Mixed Signal Components (ADC and DAC) on MCMs”, ITG 8. Factagung, Mikroelerktronik for die informationstechnik, 03.1998. pp 217-222.
[16]Yuan Tzu Ting, Li Wei chao and Wei Chung Chao, “A Practical Implementation of Dynamic Testing of an AD Converter”, IEEE proceedings of ATS pp238-243, 1996
[17]IEEE Standard 1057, “IEEE Standard for Digitizing Waveform Recorder,” Oct 1994
[18]R.Pinteion, J.Schoukens, “An improved sine wave fitting procedure for the characterizing data acquisition channels,” Proc. IEEE Instrum. Meas. Tech. Conf, pp700-705, Waltham, Ma, USA, Apr.24-26 1995
[19]L.Benetazzo, C.Narduzzi, C.Offelli, D.Petri, “A/D converter performance analysis by a frequency-domain approach”, IEEE Trans. Istrum. Meas. V0l.41, no6,pp 834-839,Dec.1992
[20]Zhang Qunying, Yang Xuexian and Han Yueqiu, “Effect of Sampling Rate on SNR in Digital Pulse Compression System”, IEEE Signal Processing Proceedings, 1998. ICSP '98. 1998 Fourth International Conference on, 1998, Page(s): 23 -26 vol.1.
[21]D. Bella, A Brandolini and A. Gandelli, “ADC Nonlinear ties and Harmonic Distortion in FFT Test”, IEEE Instrumentation and Measurement Technology Conference 1998,pp1233-1238.
[22]K. Arabi, B Kaminska, J Rzeszut, “BIST for D/A and A/D Converters”, IEEE Design & Test of Computer 1996, pp.40-49.
[23]M.F. Toner, G. W. Roberts, “ A BIST Scheme for an SNR Test of a Sigma-Delta ADC”. International Test Conference 1993, pp.805-814.
[24]S. K. Sunter, n. Nagi, “A Simplified Polynomial-Fitting Algorithm for DAC and ADC BIST’, International Test Conference 1998, pp 389-395.
[25]Fang Xu, “A New Approach for the Non-linearity Test of ADCs/DACs and its application for BIST ”, IEEE Trans. On Instrumentation and Measurement, pp.35-39
指導教授 蘇朝琴(Chauchin Su) 審核日期 2001-7-10
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