先進電離層探測儀

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姓名

林再文(Zai-Wun Lin) 查詢紙本館藏

畢業系所

太空科學研究所

論文名稱

先進電離層探測儀
(Advanced Ionospheric Probe)

相關論文

★ 動態視星等之星象辨識演算法	★ 太空電漿探針系統
★ 太空離子探測系統	★ 微衛星離子探測系統
★ 電子溫度儀在太空電漿模擬艙之量測	★ 先進電離層探測儀之機構設計與分析
★ 先進電離層探測儀離子流向推導與校正	★ 探空火箭姿態計
★ 先進電離層探測儀地面電子測試設備	★ 熱真空測試系統
★ 太空電漿模擬艙自動化監控系統	★ 數位式探空火箭姿態量測模組
★ 先進電離層探測儀整合測試系統	★ 先進電離層探測儀數位控制單元之研製
★ 探空十號火箭的姿態重建與分析	★ 先進電離層雙生儀地面電子測試設備

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摘要(中)

先進電離層探測儀是以單一探測器來實現複合式量測的電漿探測儀器，能透過分時的方式扮演平面電漿探針、阻滯電位分析儀、離子流向儀、與離子捕獲儀各項功能。將搭載於福爾摩沙衛星五號上，實地量測電離層的電漿成份、密度、溫度、運動速度等物理量。先進電離層探測儀具備體積小、重量輕等特性，其儀器角色可以透過衛星指令更改，具備高度的量測彈性，為完全由國人自製的衛星級儀器。先進電離層探測儀搭載了同級電漿量測酬載中最高的每秒 8,192 次的取樣率，可量測電離層的細微結構；探測器所使用的純金電鑄篩網，理論上可維持較好的等電位面結構，從實驗結果中也顯示具有較低的類磁滯現象，可使量測結果更為精確；探測器所採用的圓形開口相較於以往慣用的方型開口不同，其理論模型已經發展完成，並在實驗中證明可以應用於電漿流向的推算。先進電離層探測儀已經完成所有的功能測試與環境測試，並完成了探空九號火箭的飛行測試，其效能符合預期，將可於軌道上執行任務。

摘要(英)

Advanced Ionospheric Probe (AIP) is an all-in-one plasma sensor that uses single instrument to perform multiple sensor functions---includes the Planar Langmuir Probe, the Retarding Potential Analyzer, the Ion Drift Meter, and the Ion Trap---in a time sharing mechanism. AIP is a science payload for FORMOSAT-5 satellite to perform in situ measurement on the ionospheric plasma compositions, concentrations, temperatures, and velocities. AIP is fully made in Taiwan with features such as light weight, compact size, and software-programmable in sensor functions to archive high flexibilities in science operations. AIP has the highest sampling rate 8,192 samples per second in similar plasma payloads to measurement the detail plasma structures in ionosphere. The electro-forming golden grids are used to maintain the smoothness of the potential surface and improve the measurement accuracy. It shows that the quasi-hysteresis effect is reduced from an experiment in laboratory. Meanwhile, AIP uses circular aperture opening instead of the traditional square opening to measure the arrival angle of incoming plasma flow. A theory is developed and identified by experiments. AIP has passed all functional and environmental tests, and completed a pre-flight test on Taiwan′s sounding rocket 9 mission. The instrument performance is as expected and is ready for launch in the future.

關鍵字(中)

★ 先進電離層探測儀
★ 福爾摩沙衛星五號
★ 電漿量測
★ 阻滯電位分析儀
★ 離子流向儀
★ 探空九號火箭

關鍵字(英)

★ Advanced Ionospheric Probe
★ FORMOSAT-5
★ plasma diagnostics
★ retarding potential analyzer
★ ion drift meter
★ sounding rocket 9

論文目次

中文摘要 i
英文摘要 iii
誌謝 v
目錄 vii
圖目錄 xi
表目錄 xvii
1 介紹 1
1.1 電離層 1
1.2 福爾摩沙衛星五號 2
1.3 先進電離層探測儀 3
1.4 科學任務 5
1.4.1 赤道地區電漿不規則體 5
1.4.2 背景電離層 6
1.4.3 磁暴期間之電離層擾動 7
1.4.4 電離層地震前兆研究 7
1.5 章節說明 8
2 量測原理 9
2.1 平面電漿探針
2.2 阻滯電位分析儀
2.3 離子捕獲儀 13
2.4 離子流向儀 13
2.4.1 基本原理 13
2.4.2 備援原理 16
2.4.3 反矩陣 17
3 硬體架構 19
3.1 探測器 20
3.1.1 AMM 21
3.1.2 CBS 24
3.1.3 SPI 27
3.1.4 電流計設計 28
3.1.5 掃描電壓設計 30
3.2 科學酬載電子系統 30
3.2.1 電氣介面 31
3.2.2 通訊架構 32
3.2.3 電源架構與電源模組 33
3.2.4 過流保護電路 34
3.2.5 備援設計 35
3.2.6 掃描電壓預置區塊 35
3.3 座標系統 37
3.4 硬體規格 37
4 軟體架構 41
4.1 操作模式與設定 42
4.1.1 操作次階模式 42
4.1.2 操作限制 44
4.2 通訊介面 45
4.2.1 指令與遙傳介面 45
4.2.2 科學資料介面 46
4.2.2.1 科學資料封包 47
4.2.2.2 封包傳輸率 48
4.2.2.3 封包內容排列時序 49
4.2.2.4 科學資料與次階模式 51
4.2.2.5 測試模式 53
4.3 科學操作 55
4.3.1 正常模式 56
4.3.2 快速模式 57
4.3.3 高速模式 57
4.3.4 備援操作 58
4.4 量測規格 59
5 功能與環境測試 61
5.1 功率量測 61
5.2 電路保護測試 63
5.3 電流注入測試 66
5.4 熱真空測試 68
5.5 振動測試 76
5.5.1 正弦振動測試 77
5.5.2 隨機振動測試 78
5.5.3 衝擊測試 80
5.5.4 測試結果 81
5.6 電磁相容測試 83
5.7 燒機測試 83
6 電漿注入與飛行測試 87
6.1 電漿注入測試 89
6.1.1 實驗結果預覽 91
6.1.2 在快速與高速模式下的量測 93
6.1.3 IDM 方形開口與圓形開口的比較 94
6.1.4 IDM 的備援應用 97
6.2 探空九號火箭飛行測試 99
7 結論 107
參考文獻 109
A 相關資料 115
A.1 數學推導 115
A.1.1 離子流量方程式 115
A.1.2 圓上任兩割線所形成的面積關係 117
A.2 SPEU 接頭接腳定義 123
A.3 指令與遙傳介面 128
A.3.1 字元與封包規範 128
A.3.2 指令封包 128
A.3.3 衛星輔助資料封包 129
A.3.4 酬載狀態資訊封包 131
A.4 科學資料介面 134
A.4.1 字元與封包規範 134
A.4.2 科學資料封包主要標題格式 135
B AIP Sensor Control Handout 137
B.1 Sensor DIO and its related controls 137
B.2 SPI configurations for ADC, DAC and TMP 139
B.2.1 Hardware configuration of ADC 141
B.2.2 Hardware configuration of DAC 142
B.2.3 Hardware configuration of TMP 144
B.2.4 Sleep mode 144
B.2.5 Sampling requirement 145
B.3 Sweeping voltage blocks 152
B.4 More on SPEU-side controlled signals 154
B.5 SPI control considerations 155
B.5.1 Time delay 155
B.5.2 Demultiplexer switching glitch 158
B.6 CBS boards IO 158

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指導教授

趙吉光(Chi-Kuang Chao)

審核日期

2016-11-30

推文