博碩士論文 102226012 詳細資訊




以作者查詢圖書館館藏 以作者查詢臺灣博碩士 以作者查詢全國書目 勘誤回報 、線上人數:8 、訪客IP:35.175.201.14
姓名 陳家偉(Jia-Wei Chen)  查詢紙本館藏   畢業系所 光電科學與工程學系
論文名稱 雷射微型投影機波前量測技術
(Wavefront Measurement Made By an Off-the-shelf Laser Scanning Pico Projector)
相關論文
★ 膜堆光學導納量測儀★ 中小型光學鏡組之高密度全場波前量測
★ 使用液晶空間光線調制器之相移式光柵-十字狹縫量測裝置★ 以奈米壓印改善陽極氧化鋁週期性
★ 全像場同時取像像差量測★ 含氫矽薄膜太陽電池材料之光電特性研究
★ 自我複製結構膜光學性質之研究★ 溫度及應力對高密度分波多工器(DWDM)濾光片中心波長飄移之研究
★ 以射頻磁控濺鍍法鍍製P型和N型微晶矽薄膜之研究★ 以奈米小球提升矽薄膜太陽能電池吸收之研究
★ 定光電流量測法在氫化矽薄膜特性的研究★ 單頻位移與傾角量測干涉儀
★ 廣角物鏡之相對照度探討及其設計應用★ 動態干涉儀量測薄膜之光學常數
★ 反應式濺鍍過渡態矽薄膜之研究★ 光子晶體偏振分光鏡之設計與製作
檔案 [Endnote RIS 格式]    [Bibtex 格式]    [相關文章]   [文章引用]   [完整記錄]   [館藏目錄]   [檢視]  [下載]
  1. 本電子論文使用權限為同意立即開放。
  2. 已達開放權限電子全文僅授權使用者為學術研究之目的,進行個人非營利性質之檢索、閱讀、列印。
  3. 請遵守中華民國著作權法之相關規定,切勿任意重製、散佈、改作、轉貼、播送,以免觸法。

摘要(中) 焦平面量測方法,像是Shack-Hartmann 波前感測器或是相移式條紋投影術,在光學量測的領域裡都非常具有價值。在本篇研究裡,我們提出一個全新的波前斜率量測方法。藉由掃描式振片雷射投影機,高斯光束將會掃描待測光學系統的入瞳。此外,藉由調節角度空間的座標以及四步相移的運算,橫向像差可以依此重建。然後即可利用兩個正交方向的橫向相差,進而重建波前相差。如此即可避免繞射的限制對系統的影響,並且因為此系統解析度決定於CCD像素的使用數目,因此系統重建的波前擁有充足的解析度。我們會利用CodeV模擬此系統,並且預測這個系統量測的結果。並將此系統量測的波前像差與Fizeau干涉儀量測的波前像差以Zernike多項式的項次進行比較,以驗證此系統的量測結果。

除此之外,我們對掃描式雷射投影機的能力進行測試。振片面鏡的穩定度大約為1/10個角像素。然而,藉由投影機的非線性分析中,投影機的灰階度被發現僅約30。這也是為何量測結果與Fizeau干涉儀相比之下有誤差的主要原因。

在未來中,藉由控制高斯光束的半徑,此系統將可被應用至小型光學系統的量測當中。此外,藉由三個不同波長的雷射二極體,此系統也可以發展成單張圖片量測系統。

摘要(英) Focal plane testing methods such as Shack-Hartmann wavefront sensing or phase shifting deflectometry are valuable tools for optical testing. In this study, we propose a novel wavefront slope testing method that uses a scanning galvo laser projector, where the single mode Gaussian beam scans the pupil of the tested optics in this system. In addition, the ray aberration is reconstructed by four step phase shifting measurement by modulating the angular coordinates. The wavefront aberration can then be reconstructed from the two orthogonal ray aberrations. The system is simulated in CodeV for predication of the results. In this way, the diffraction limit can be avoided and it provides sufficient resolution depend on the projector resolution we used. The measured wavefront is cross-verified by the Fizeau interferometer in terms of Zernike polynomials.

Additionally, we test the ability of the laser scanning projector. The galvo-mirror stability is about 1/10 of an angular pixel. However, through the nonlinearity analysis, the grayscale ability of the laser projector is noticed that only about 30. This is the main reason why the results have error compared with that tested by the Fizeau interferometer.

In the future, this system will be applied to small optical system measurement by controlling the Gaussian beam radius. It will also be developed into a single frame measurement system with three different wavelength laser diodes.

關鍵字(中) ★ 像差
★ 光學量測
關鍵字(英) ★ Aberration
★ Optical Testing
論文目次 Table of Contents



摘要 i

Abstract ii

致謝 iii

Table of Contents iv

List of Figures vi

List of Tables viii

Chapter 1: Introduction 1

1.1. Background Knowledge 1

1.1.1. Hartmann Test 1

1.1.2. Ronchi Test 4

1.2. Literature Review 5

1.3. Research Motivation 9

Chapter 2: Theory 11

2.1. Aberration 11

2.1.1. Wavefront Aberration 11

2.1.2. Transverse Ray Aberration Measurement 12

2.2. Zernike Polynomials 14

2.2.1. Zernike Polynomial Theory 14

2.2.2. Wavefront Reconstruction with Zernike Polynomials 18

2.3. Wavefront Measurement by a Laser Projector 19

2.3.1. Laser Scanning Pico Projector 19

2.3.2. Gaussian Beam Propagation 20

2.3.3. Angular Phase Modulated Gaussian Beam 22

2.4. 4-Step Phase Shifting Algorithm 26

Chapter 3: Experiments 28

3.1. System Setup and Tested Lenses 28

3.2. System Simulation 33

3.3. Measurement Process 35

Chapter 4: Results and Discussion 39

4.1. Galvo-Mirror Angular Stability Analysis 39

4.2. Projector Nonlinearity Analysis 40

4.3. Number of Captured Pattern Analysis 44

4.4. Measurement Results 47

4.5. System Verification 50

Chapter 5: Conclusion and Future Work 53

5.1. Conclusion 53

5.2. Future Work 54

References 55

參考文獻 [1] D. Malacara and I. Ghozeil, "Hartmann, Hartmann-Shack, and Other Screen Tests," in Optical Shop Testing, D. Malacara, ed. John Wiley & Sons, Inc., pp. 361- 397. 2007.

[2] B. C. Platt and R. Shack, "History and Principles of Shack-Hartmann Wavefront Sensing," Journal of Refractive Surgery, Vol. 17, pp. S571 - S577, 2001.

[3] D. Malacara and I. Ghozeil, "Ronchi Test," in Optical Shop Testing, John Wiley & Sons, Inc., pp. 317-360. 2007.

[4] G. Y. Yoon, T. Jitsuno, M. Nakatsuka, and S. Nakai, "Shack Hartmann Wave-front Measurement with a Large F-number Plastic Microlens Array," Applied Optics, Vol. 35, pp. 188-192, 1996.

[5] J. A. Koch, R. W. Presta, R. A. Sacks, R. A. Zacharias, E. S. Bliss, M. J. Dailey, M. Feldman, A. A. Grey, F. R. Holdener, J. T. Salmon, L. G. Seppala, J. S. Toeppen, L. Van Atta, B. M. Van Wonterghem, W. T. Whistler, S. E. Winters, and B. W. Woods, "Experimental Comparison of a Shack-Hartmann Sensor and a Phase-shifting Interferometer for Large-optics Metrology Applications," Applied Optics, Vol. 39, pp. 4540-4546, 2000.

[6] V. Ronchi, "Forty Years of History of a Grating Interferometer," Applied Optics, Vol. 3, pp. 437-451, 1964.

[7] B.J. Thompson, Studies in Optics, Technical Report, U.S. AFAL-TR-73-112, U.S. Government, Washington D.C., 1973.

[8] T.Yatagai, "Fringe Scanning Ronchi Test for Aspherical Surface," Applied Optics, Vol. 23, pp. 3676-3679, 1984.

[9] K. Hibino, D.I. Farrant, B.K. Ward, and B.F. Oreb, "Dynamic Range of Ronchi Test with a Phase-shifted Sinusoidal Grating," Applied Optics, Vol. 36, pp. 6178-6189, 1997.

[10] M.M. Gonzalez, and N.A. Ochoa, "Sinusoidal Liquid Crystal Display Grating in the Ronch Test," Optical Engineering, Vol. 42, pp. 1725-1729, 2003.

[11] M. Knauer, J. Kaminski, and G. Hausler, "Phase Measuring Deflectometry: a New Approach to Measure Specular Free Form Surfaces", Proc. SPIE 5457, pp. 366-376, 2004.

[12] C. Liang, and J. Sasian, "Geometrical Optics Modeling of the Grating-slit Test," Optics Express, Vol. 15, pp. 1738-1744, 2007.

[13] T. Bothe, W. Li, C. von Kopylow, W. Jueptner, "High-resolution 3D Shape Measurement on Specular Surfaces by Fringe Reflection," Proc. SPIE 5457, pp. 411-422, 2004.

[14] J. Wyant, and K. Creath, "Basic Wavefront Aberration Theory for Optical Metrology," in Applied Optics and Optical Engineering, Vol. XI, pp. 28-34, 1992.

[15] W.H. Southwell, "Wave-front Estimation from Wave-front Slope Measurements," J. Opt. Soc. Am. Vol 70, pp. 998-1006, 1980.

[16] M. Niesten, R. Sprague, J. Miller, "Scanning Laser Beam Displays, " Proc. of SPIE Vol. 7001, 70010E1-70010E-10, 2008.

[17] B. Saleh, M. Teich, “Beam Optics,” in Fundamental of Photonics, B. Saleh and M.Teich ed. John Wiley & Sons, Inc., pp. 80-93, 1991.

[18] H. Schreiber and J. H. Bruning, "Phase Shifting Interferometry," in Optical Shop Testing, D. Malacara, ed. John Wiley & Sons, Inc., pp. 547-655. 2007.

[19] H. Guo, H. He, and M. Chen, "Gamma Correction for Digital Fringe Projection Profilometry," Applied Optics, Vol. 43, pp. 2906-2914, 2004.

指導教授 陳昇暉、梁肇文(SHENG-HUI CHEN CHAO-WEN LIANG) 審核日期 2015-8-27
推文 facebook   plurk   twitter   funp   google   live   udn   HD   myshare   reddit   netvibes   friend   youpush   delicious   baidu   
網路書籤 Google bookmarks   del.icio.us   hemidemi   myshare   

若有論文相關問題,請聯絡國立中央大學圖書館推廣服務組 TEL:(03)422-7151轉57407,或E-mail聯絡  - 隱私權政策聲明