博碩士論文 102323024 詳細資訊




以作者查詢圖書館館藏 以作者查詢臺灣博碩士 以作者查詢全國書目 勘誤回報 、線上人數:12 、訪客IP:18.191.211.66
姓名 楊東穎(Yang Dongying)  查詢紙本館藏   畢業系所 機械工程學系
論文名稱 熱處理對N型多孔矽表面燒結之研究
(Effect of annealing on sintering surface of N-type porous silicon)
相關論文
★ 塑膠機殼內部表面處理對電磁波干擾防護研究★ 研磨頭氣壓分配在化學機械研磨晶圓膜厚移除製程上之影響
★ 利用光導效應改善非接觸式電容位移感測器測厚儀之研究★ 石墨材料時變劣化微結構分析
★ 半導體黃光製程中六甲基二矽氮烷 之數量對顯影後圖型之影響★ 可程式控制器機構設計之流程研究
★ 伺服沖床運動曲線與金屬板材成型關聯性分析★ 鋁合金7003與630不銹鋼異質金屬雷射銲接研究
★ 應用銲針尺寸與線徑之推算進行銲線製程第二銲點參數優化與統一之研究★ 複合式類神經網路預測貨櫃船主機油耗
★ 熱力微照射製作絕緣層矽晶材料之研究★ 微波活化對被植入於矽中之氫離子之研究
★ 矽/石英晶圓鍵合之研究★ 奈米尺度薄膜轉移技術
★ 光能切離矽薄膜之研究★ 氮矽基鍵合之研究
檔案 [Endnote RIS 格式]    [Bibtex 格式]    [相關文章]   [文章引用]   [完整記錄]   [館藏目錄]   至系統瀏覽論文 ( 永不開放)
摘要(中) 本研究目標為將N型矽晶材料輔以紫外光蝕刻做出多孔矽層,製作出適用於太陽能電池之材料。目前在太陽能電池中,製作種類可分為單晶矽、多晶矽以及非晶矽,其中更以單晶矽的轉換效率最佳,在實驗過程中嘗試以加熱再結晶的方法使多孔矽表面形成一層單晶矽層。因傳統爐管加熱方式所耗費時間較長,故本實驗施以兩種不同加熱方式使他表面產生晶體再結晶,藉由儀器檢測比較不同加熱方式造成的表面結晶品質的差異,在蝕刻時的參數包含時間、濃度、電流、光照以及熱處理時的溫度、時間、環境氣氛,由參數的改變與設定製作出多孔矽材料,再藉由X光繞射去檢測不同數據下晶體結晶的品質,以利往後依需求不同而選取適合的參數及加熱方式。
摘要(英) The aim of this research is to make porous silicon layer on a n-type silicon wafer with the exposure of UV light,which could be used as a kind of solar cell material. Silicon based materiad that can be used in solar cell can be seprate as single crystalline ,polysilicon ,and amorphous silicon , in which single crystal silicon solar cell has best efficiency .In this experiment, we try to make a single crystal layer on the surface of the silicon wafer with the method of thermal annealing . Because of the long time that traditional method cost, we use two different ways to recrystallize the wafer surface and then study the quality difference after two kinds of treatment. The experiment parameters includes time, concentration, illumination, and the temperature, time and environment during anealling. We made difference porous silicon wafers by controlling experiment parameters , and test the quality under different conditions. All these work can be a data base for future work.

關鍵字(中) ★ 熱處理對N型多孔矽表面燒結之研究 關鍵字(英)
論文目次 目錄
摘要 I
Abstract II
致謝 III
目錄 IV
圖目錄 VI
第一章 緒論 1
1.1研究背景 1
1.2研究動機與目的 4
第二章 原理與文獻回顧 9
2.1 多孔矽的基礎理論 9
2.1.1 矽基板的種類 9
2.1.2 多孔矽的發現 11
2.2多孔矽的形成 12
2.2.1 多孔矽的製作技術種類 12
2.2.2 多孔矽電化學蝕刻的電壓-電流特性 14
2.2.3 多孔矽的溶解 15
2.2.4 多孔矽形成機制 16
2.2.4.1 量子模型(The Quantum Model) 17
2.2.4.2 貝爾模型(The Beale Model) 17
2.2.4.3 擴散限制模型(The Diffusion-Limited Model) 18
2.3高溫退火對多孔矽的影響 19
2.4 晶體結構的再結晶機制 20
第三章 實驗準備與步驟 29
3.1 實驗試片準備與清洗 29
3.2電化學蝕刻設備介紹 30
3.3 高溫退火設備介紹 31
3.4 分析儀器介紹 32
第四章 結果與討論 39
4.1 N型矽晶圓蝕刻參數以及熱處理參數設定 39
4.2 XRD檢測分析 40
第五章 結論 47
參考文獻 49

參考文獻 【1】P.K. Bondyopadhyay,"Moore′s law governs the silicon revolution",IEEE, Vol. 86,Issue: 1, pp. 78-81, (1998).
【2】K. Rupp and S. Selberherr, "The economic limit to moore’s law,"Proceedings
of the IEEE, vol. 98, no. 3, pp. 351–353, (2010).
【3】G. K. Celler and S. Cristoloveanu, "Frontiers of silicon-on-insulator", Journal of
Applied Physics, Vol. 93, Issue 9, pp. 4955-4978, (2003).
【4】莊達人,VLSI 製造技術,五版,高立圖書有限公司,台北縣,2004.
【5】J. B. Kuo and K.-W. Su, CMOS VLSI Engineering: Silicon-on-Insulator
(SOI),Kluwer Academic Publishers, Boston, (1998).
【6】J.P. Colinge, Silicon-on-Insulator Technology: Materials to VLSI ,Springer
Science Business Media, Inc., New York, (2004)
【7】J.B.Lasky,et al.,"Silicon-on-Insulator(SOI) by Bonding and Etch-Back",Electron
Devices Meeting,1985 Internation,Vol.31,p.684-687,1985
【8】Q,-Y.Tong and U.Gossel,"Semiconductor Wafer Bonding : Science and
Technology",John Wiley,New York,1999.
【9】Martin A. Green, Keith Emery, Yoshihiro Hishikawa, Wilhelm Warta and Ewan
D.Dunlop,"Solar cell efficiency tables",Australia ,2014
【10】A. Uhir,"Electrolytic shapping of germanium and silicon",Bell System Tech.J.,
Vol.35,pp.333,1956
【11】3T. Osaka, K. Ogasawara , and S. Nakahara, "Classification of the pore structure
of n-type silicon and its microstructure",J.Electrochem.Soc. 144,3226, 1997.
【12】C. L. Clement, A. Lagoubi, and M. Tomkiewicz,"Morphology of porous n-type
silicon obtained by photoelectrochemical etching" ,J.Electrochem. Soc.
141,958,1994.
【13】C. Levy-Clement, A. Lagoubi, R. Tenne, and M. Neumann-Spallart,
"Photoelectrochemical etching of silicon", Electrochim. Acta 37(5), 877,1992
【14】 A. A. Yaron, S. Bastide,J. L. Maurice, and C. L. Clement, "Morphology of
porous n-type silicon obtained by photoelectrochemical etching II", J.Lumin.
57, 67, 1993.
【15】 X.G. Zhang, S.D. Collins, R.L. Smith, Porous Silicon Formation and
Electropolishing of Silicon by Anodic Polarization in HF Solution", J.
Electrochem. Soc., Vol. 136, Issue 5, pp. 1561-1565, 1989.
【16】 X.G. Zhang, "Mechanism of Pore Formation on n‐Type Silicon", J.electrochem.
Soc., Vol. 138, Issue 12, pp. 3750-3756, 1991.
【17】 V. Lehmann, "The Physics of Macropore Formation in Low Doped n-Type
Silicon", J.electrochem. Soc., Vol. 140, pp. 2836, 1993.
【18】 C. Pickering, M.J. Beale, D.J. Robbins, P.J. Pearson, and R. Greef, "Optical
studies of the structure of porous silicon films formed in p-type degenerate and
non-degenerate silicon", J. Phys. C: Solid state Phys., Vol. 17, pp. 5535, 1984.
【19】 M.J. Beale, J.D. Benjamin, M.J. Uren, N.G. Uren, N.G. Chew and A.G. Cullis,
"An experimental and theoretical study of the formation and microstructure of
porous silicon", J. Cryst. Growth, Vol.73, pp. 622, 1985.
【20】 M.J. Beale, J.D. Benjamin, M.J. Uren, N.G. Uren, N.G. Chew, and A.G. Cullis,
"Microstructure and formation mechanism of porous silicon", Appl. Phys.
Lett., Vol. 46, pp. 86, 1985.
【21】 I. M. Young, M. I. Beale and J.D. Benjamin, "X‐ray double crystal diffraction
study of porous silicon", Appl. Phys. Lett., Vol.46, pp. 1133, 1985.
【22】 R.L. smith, S.D. Collins, "Porous silicon formation mechanism", J. Appl. Phys., Vol. 71, R1, 1992.
【23】V.Lehmann, "The Physics of Macropore Formation in Low Doped n-Type
Silicon",J.electrochem. Soc., Vol. 140,pp.2836,1993.
【24】V.Lehmann, H. Foll, "Formation mechanism and properties of electrochemically
etched trenches in n-type silicon", J.Electrochem. Soc.,Vol. 137,pp.653, 1990.
【25】V.Lehmann, W. Honlein, R. Reisinger, A. Spizer, H. Wendt, and J.Willer,"A
novel capacitor technology based on porous silicon" Thin Solid Films, Vol.
276,pp. 138, 1996.
【26】V.Lehmann, U. Gosele, "Porous silicon formation: A quantum wire effect", Appl.
Phys. Lett., Vol.58,pp.865,1991.
【27】V.Lehmann, "Porous silicon-a new material for MEMS",Proc. MEMS 96,pp.
1-6,1996.
【28】A.J. Read, R.J. Needs, K.J. Naish, L.T. Canham, P.D.J. Calcott, and A.Qteish,
"First-principles calculations of the electronic properties of silicon
quantum wires", Phy, Rev. Lett., Vol. 69,pp. 1232, 1992.
【29】 G. D. Sanders and Y. C. Chang, "Theory of optical properties of quantum wires
in porous silicon", Phys. Rev. B, Vol. 45,pp.856, 1992.
【30】V. Lehmann, U. Gosele, "Porous silicon formation: A quantum wire effect",
Appl.Phys.Lett., Vol. 58,pp.856, 1991.
【31】M.J. Beale, J.D. Benjamin, M.J. Uren, N.G. Uren, N.G. Chew and A.G. Cullis,
"An experimental and theoretical study of the formation and microstructure of
porous silicon", J. Cryst. Growth, Vol.73,pp. 622,1985.
【32】M.J. Beale, J.D. Benjamin, M.J. Uren, N.G. Uren, N.G. Chew and A.G. Cullis,
"Microstructure and formation mechanism of porous silicon", Appl.Phys. Lett.,
Vol. 46,pp. 86, 1985.
【33】R.L. Smith, S.F. Chuang, and S.D. Collins, "A theoretical model of the formation
morphologies of porous silicon",J. Electron. Mater., Vol.17,pp.533,1988.
【34】R.L. Smith and S.D. Collins, "Generalized model for the diffusion-limited
aggregation and Eden models of cluster growth",Phys. Rev. A, Vol. 39,pp.5409,
1989.
【35】R.L. Smith and S.D. Collins, "Porous silicon formation mechanisms" J.Appl.
Phys., Vol. 71,R1,1992.
【36】T.A. Witten and L.M. Sander, "Diffusion-limited aggregation" Phys. Rev.B,
Vol.27,pp.5686, 1983.
【37】V. Labunov, V. Bondarenko, I. Glinenko, A. Dorofeev and L.Tabulina,"Heat
treatment effect on porous silicon", Thin Solid Films, Vol.137,pp.123-134,
1986.
【38】G. Muller, M. Nerding, N. Ott, H.P.Strunk, and R. Brendel,"Sintering of porous
silicon", phys. stat. sol.(a),Vol. 197,pp. 83-87,2003.
【39】N. Ott, M. Nerding, G. Muller and R. Brendel, H.P. Strunk, "Evolution of the
microstructure during annealing of porous silicon multilayers", J.Appl. Phys.,
Vol. 95,pp.497-503,2004.
【40】G.L. Olson and J.A. Roth, Kinetics of Solid Phase Crystallization in Amorphous
Silicon, Materials Science Reports, Vol. 3, Issue 1, pp. 1-77, (1988).
指導教授 李天錫 審核日期 2015-6-23
推文 facebook   plurk   twitter   funp   google   live   udn   HD   myshare   reddit   netvibes   friend   youpush   delicious   baidu   
網路書籤 Google bookmarks   del.icio.us   hemidemi   myshare   

若有論文相關問題,請聯絡國立中央大學圖書館推廣服務組 TEL:(03)422-7151轉57407,或E-mail聯絡  - 隱私權政策聲明