| 摘要(英) |
This thesis is to describe the design process and methods of a programmable power-quality power supply. The main purpose is to design an AC power supply, but it can editing an arbitrary output voltage waveform through a programmable program not only the general common sinusoidal output voltage waveform. The alternating current with arbitrary waveform can be used to emulate a power supply of pollution with power harmonics, flicker, sags, swells and other disturbances. They can be used as a reference simulate power source when we are designing a power source filter or can be used to test equipment for power pollution interference.
Power-quality power supply rated output power given here is 500 VA, which is mainly use of class-D power amplifier as the main body. The stage before class-D power amplifier is a boost circuit which used to rise the input voltage. Input voltage of the class-D power amplifier is output voltage of the boost circuit. Programmable signal and user interface are edited by the LabVIEW software, and the signal DAC output through myDAQ which input to the microcontroller dsPIC30f4011 for the PWM control of switching elements in the system. Finally, coupled with hardware circuits, software and firmware to complete the overall structure and function.
Sine wave output voltage of the system up to R.M.S. value 120V. In the part of harmonic waveform output voltage can be added multiple sets of arbitrary frequency, amplitude harmonic components. The highest harmonic frequency up to 2kHz. In the part of flicker output voltage waveform can be added multiple sets of arbitrary frequency, amplitude flicker component. The minimum flicker frequency up to 1Hz. In the part of swells, sags, interrupts waveform output voltage can be set that voltage fluctuation occur at any times, and can do multiple sets of voltage fluctuation function.
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| 參考文獻 |
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[21] Electromagnetic compatibility - Testing and measurement techniques - Harmonics and interharmonics including mains signalling at a.c. power port, low frequency immunity tests. IEC Std. 61000-4-13, 2002.
[22] Electromagnetic compatibility - Testing and measurement techniques - Voltage fluctuation immunity test. IEC 61000-4-14, 2002.
[23] Electromagnetic compatibility - Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests. IEC 61000-4-11, 2004.
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