倍頻非螢光基態耗損超解析之顯微成像方法

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姓名

吳濠濠(Hao-hao Wu) 查詢紙本館藏

畢業系所

光電科學與工程學系

論文名稱

倍頻非螢光基態耗損超解析之顯微成像方法
(Method of non-fluorescence high order harmonic generation ground state depletion super-resolution microscopy)

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摘要(中)

本論文利用受激輻射耗損顯微術(Stimulated emission depletion Microscopy, STED)中抑制放光的想法嘗試去抑制非螢光訊號，受激輻射耗損顯微術只能運用於螢光訊號，利用受激輻射耗損的方式去抑制點擴散函數周圍的螢光訊號進而取得超解析，然而此技術目前為止僅能運用於螢光訊號的調變，則造成此技術在使用上有了限制，為了改善該方面的限制，我們提出一個新的概念，嘗試用基態耗損(Ground state depletion, GSD)的方式去調控二倍頻或三倍頻等非螢光訊號的強度，則能使此技術的概念可用於非螢光訊號，從而拓展此技術的應用範圍。

從基態耗損會影響吸收，並利用材料本身因為有實際能階會增強倍頻與可進行基態耗損的特性去證實此概念的可能性，並自製出符合實驗需求的樣本，利用Z-scan的技術去量測出樣本的非線性係數與導入耗損光下吸收的變化，並利用倍頻會在介面放光的特性去驗證實際抑制三倍頻放光與Z-scan所量測的數值模擬倍頻放光是否相符合，最後模擬此概念藉由激發受激耗損顯微術系統時有機會達到69nm或更小的的解析度。

摘要(英)

This thesis aims to suppress third harmonic generation (THG) signals through ground state depletion (GSD) based on the concept of stimulated emission depletion in STED microscopy. The STED microscopy is based on fluorescent signals. By depleting the fluorescence signals, it modulates the point spread function (PSF) of fluorescence signals to reach super resolution. However, the applications of STED are limited by the using of fluorescence signals. To overcome this limitation, we propose a new concept to modulate the PSF of THG signals through GSD to improve the resolution of THG microscopy.

To prove this idea, we illustrate that the material absorption can enhance the THG signals and can be suppressed through ground state depletion. Proper sample of is made and its nonlinear coefficient is measured by both Z-scan technique and interface THG signals measurement. Combined with depletion light, the two-photon absorption coefficient is proved to be suppress through GSD, while the THG at interface is shown to decline with increasing depletion light intensity. Finally, applying the measured nonlinear coefficients to resolution simulation, the results indicate the resolution of THG microscopy can reach 69 nm or smaller based on GSD.

關鍵字(中)

★ 超解析顯微術
★ 倍頻
★ 基態耗損

關鍵字(英)

★ STED

論文目次

摘要 i
Abstract ii
致謝 vi
目錄 iv
圖目錄 vii
表目錄 vii
第一章導論 1
1-1 顯微術的發展 1
1-2 超解析顯微術簡介 3
1-3 研究動機與論文大綱 7
第二章文獻回顧 9
2-1 輻射耗損顯微術原理 9
2-2 基態耗損原理 13
2-3 材料的非線性 16
第三章非線性分析方法與三倍頻抑制方法 18
3-1 Z-scan原理與架構概念 18
3-2 介面對比法原理與架構概念 29
3-3 三倍頻抑制方法 32
第四章實驗與模擬 36
4-1 樣本備製 36
4-2 實驗結果與分析 38
4-3 模擬解析度與討論 54
第五章結論 61
第六章參考文獻 63

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指導教授

陳思妤(Szu-yu Chen)

審核日期

2016-1-5

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