參考文獻 |
Akaike, H. (1974). A new look at the statistical model identification, IEEE Transactions on Automatic Control, 19, 716-723.
Anderson, T. W. and Darling, D. A. (1954). A test of goodness of fit, Journal of the American Statistical Association, 49, 765-769.
Bagdonavicius, V. and Nikulin, M. (2002). Accelerated Life Models: Modeling and Statistical Analysis}, Chapman and Hall/CRC, London.
Cheng, Y. S. and Peng, C. Y. (2012). Integrated degradation models in R using iDEMO, Journal of Statistical Software, 49, 1-22.
De Oliveira, V. R. B. and Colosimo, E. A. (2004). Comparison of methods to estimate the time‐to‐failure distribution in degradation tests, Quality and Reliability Engineering International, 20, 363-373.
Demidenko, E. (2004). Mixed Models: Theory and Applications, John Wiley and Sons, New York.
Escobar, L. A., Meeker, W. Q., Kugler, D. L. and Kramer, L. L. (2003). Accelerated destructive degradation tests: data, models, and analysis, Mathematical and Statistical Methods in Reliability, 7, 319-335.
Gertbsbakh, I. B. and Kordonskiy, K. B. (1969). Models of Failure, Springer-Verlag, New York.
Henderson, C. R. (1975). Best linear unbiased estimation and prediction under a selection model, Biometrics, 31, 423-447.
Jeng, S. L., Huang, B. Y. and Meeker, W. Q. (2011). Accelerated destructive degradation tests robust to distribution misspecification, IEEE Transactions on Reliability, 60, 701-711.
Johnson, R. A. and Wichern, D. W. (2014). Applied Multivariate Statistical Analysis, Prentice-Hall, New Jersey.
Li, M. and Doganaksoy, N. (2014). Batch variability in accelerated-degradation testing, Journal of Quality Technology, 46, 171-180.
Lu, C. J. and Meeker, W. O. (1993). Using degradation measures to estimate a time-to-failure distribution, Technometrics, 35, 161-174.
Lu, C. J., Meeker, W. Q. and Escobar, L. A. (1996). A comparison of degradation and failure-time analysis methods for estimating a time-to-failure distribution, Statistica Sinica, 6, 531-546.
Lu, J. C., Park, J. and Yang, Q. (1997). Statistical inference of a time-to-failure distribution derived from linear degradation data, Technometrics, 39, 391-400.
Meeker, W. Q. and Escobar, L. A. (1998). Statistical Methods for Reliability Data, John Wiley and Sons, New York.
Meeker, W. Q., Escobar, L. A. and Lu, C. J. (1998). Accelerated degradation tests: modeling and analysis, Technometrics, 40, 89-99.
Nelson, W. (1981). Analysis of performance-degradation data from accelerated tests, IEEE Transactions on Reliability, 30, 149-155.
Nelson, W. B. (1990). Accelerated Testing: Statistical Models, Test plans, and Data Analysis, John Wiley and Sons, New York.
Peng, C. Y. (2015). Inverse Gaussian processes with random effects and explanatory variables for degradation data, Technometrics, 57, 100-111.
Peng, C. Y. and Cheng, Y. S. (2016). Threshold degradation in R using iDEMO, Computational Network Analysis with R: Applications in Biology, Medicine and Chemistry, 83-103.
Peng, C. Y. and Tseng, S. T. (2009). Mis-specification analysis of linear degradation models, IEEE Transactions on Reliability, 58, 444-455.
ReliaSoft Corporation (2015). Destructive Degradation Analysis in Weibull++}, Retrieved from http://www.weibull.com/hotwire/issue178/hottopics178.htm.
Robinson, G. K. (1991). That BLUP is a good thing: the estimation of random effects, Statistical Science, 6, 15-32.
Schwarz, G. (1978). Estimating the dimension of a model, The Annals of Statistics, 6, 461-464.
Shi, Y. and Meeker, W. Q. (2012). Bayesian methods for accelerated destructive degradation test planning, IEEE Transactions on Reliability, 61, 245-253.
Shi, Y., Escobar, L. A. and Meeker, W. Q. (2009). Accelerated destructive degradation test planning, Technometrics, 51, 1-13.
Shi, Y. and Meeker, W. Q. (2013). Planning accelerated destructive degradation tests with competing risks, Statistical Models and Methods for Reliability and Survival Analysis, 335-356.
Stephens, M. A. (1974). EDF statistics for goodness of fit and some comparisons, Journal of the American Statistical Association, 69, 730-737.
Tsai, C. C. and Lin, C. T. (2015). Lifetime inference for highly reliable products based on skew-normal accelerated destructive degradation test model, IEEE Transactions on Reliability, 64, 1340-1355.
Wang, W. (2013). Identifiability of linear mixed effects models, Electronic Journal of Statistics, 7, 244-263.
Xie, Y., King, C. B., Hong, Y. and Yang, Q. (2017). Semi-parametric models for accelerated destructive degradation test data analysis, To appear in Technometrics. |