摘要(英) |
In this study, the main types of equipment used in the wafer sort, including tester, prober and probe card. Find the probe card is a key factor. In the capacity planning process, the number of probe cards that can be supported for production is relatively limited, because the number of probe cards built depends on the wafer product and cannot be shared with other product, plus the status of the probe card is easy to follow with the increase in testing activities, the situation is getting worse. An effective on-site management strategy has been developed to maximize the benefits of the limited probe card in hand, and the overall equipment effectiveness can be effectively improved.
There are two key conclusions to make it happened. The first key conclusions is emphasis on timely disposal brings positive improvement to the overall equipment effectiveness:This study found that with practical examples, timely disposal is taken when the violation of statistical classification restrictions is triggered. Although it will cause the machine downtime and required to reinstall the machine. However, it can greatly improve the time for product reworking. The second key conclusions is develop multi-actions for probe card timely processing strategy:A single action can only optimize the machine status of a single downtime, resulting in non-optimized overall equipment effectiveness. The multi-actions strategy can reduce the three down time and maintain a certain level, avoiding the worst situation of a single down time and dragging on the overall equipment effectiveness. |
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