參考文獻 |
[1] R. Schaefer, “Challenges and solutions for removing fixture effects in multi-port measurements,” in Proc. of DesignCon 2008.
[2] G. F. Engen and C. A. Hoer, "Thru-reflect-line: An improved technique for calibrating the dual six-port automatic network analyzer," in IEEE Transactions on Microwave Theory and Techniques, vol. 27, no. 12, pp. 987-993, Dec. 1979.
[3] R. B. Marks, "A multiline method of network analyzer calibration," in IEEE Transactions on Microwave Theory and Techniques, vol. 39, no. 7, pp. 1205-1215, July 1991.
[4] V. Adamian and B. Cole, "A novel procedure for characterization of multiport high-speed balanced devices," 2006 IEEE International Symposium on Electromagnetic Compatibility, 2006. EMC 2006., Portland, OR, USA, 2006, pp. 395-398.
[5] J. Dunsmore, N. Cheng and Y. -x. Zhang, "Characterizations of asymmetric fixtures with a two-gate approach," 77th ARFTG Microwave Measurement Conference, Baltimore, MD, USA, 2011, pp. 1-6.
[6] C. Yoon et al., "Design criteria of automatic fixture removal (AFR) for asymmetric fixture de-embedding," 2014 IEEE International Symposium on Electromagnetic Compatibility (EMC), Raleigh, NC, USA, 2014, pp. 654-659.
[7] S. -J. Moon, X. Ye and R. Smith, "Comparison of TRL calibration vs. 2x thru de-embedding methods," 2015 IEEE Symposium on Electromagnetic Compatibility and Signal Integrity, Santa Clara, CA, USA, 2015, pp. 176-180.
[8] H. Barnes and J. Moreira, "Verifying the accuracy of 2x-Thru de-embedding for unsymmetrical test fixtures," 2017 IEEE 26th Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS), San Jose, CA, USA, 2017, pp. 1-3.
[9] J. Cho et al., "A Two-line Time-domain gating method for characterization of test fixture with via hole discontinuity," in IEEE Microwave and Wireless Components Letters, vol. 27, no. 10, pp. 936-938, Oct. 2017.
[10] Y. Chen, B. Chen, J. He, R. Zai, J. Fan and J. Drewniak, "De-embedding comparisons of 1X-Reflect SFD, 1-port AFR, and 2X-Thru SFD," 2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility (EMC/APEMC), Suntec City, Singapore, 2018, pp. 160-164.
[11] A. S. Salnikov, I. M. Dobush, D. V. Bilevich, A. A. Popov, A. A. Kalentyev and A. E. Goryainov, "A study of connectors and feed lines de-embedding techniques for PCB microwave components S-parameters measurements up to 50 GHz," 2020 Dynamics of Systems, Mechanisms and Machines (Dynamics), Omsk, Russia, 2020, pp. 1-6.
[12] Y. Liu et al., "S-Parameter de-embedding error estimation based on the statistical circuit models of fixtures," in IEEE Transactions on Electromagnetic Compatibility, vol. 62, no. 4, pp. 1459-1467, Aug. 2020.
[13] S. Yao, X. -C. Wei and L. Ding, "A deembedding method for the S-parameter extraction of surface-mounted devices with asymmetric fixtures," in IEEE Microwave and Wireless Components Letters, vol. 31, no. 2, pp. 211-214, Feb. 2021.
[14] B. -W. Liu, X. -C. Wei and C. -X. Xv, "A hybrid de-embedding method for low loss and reciprocal PCB fixtures," in IEEE Transactions on Instrumentation and Measurement, vol. 71, pp. 1-8, 2022, Art no. 1003608.
[15] D. F. Williams and R. B. Marks, "Reciprocity relations in waveguide junctions," in IEEE Transactions on Microwave Theory and Techniques, vol. 41, no. 6, pp. 1105-1110, June-July 1993.
[16] R. E. Collin, Foundation for Microwave Engineering. John Wiley & Sons, 2007.
[17] D. C. Youla, “On scattering matrices normalized to complex port numbers,” Proc. IRE, vol. 49, July 1961, p 1221.
[18] K. Kurokawa, "Power waves and the scattering matrix," in IEEE Transactions on Microwave Theory and Techniques, vol. 13, no. 2, pp. 194-202, March 1965.
[19] D. A. Frickey, "Conversions between S, Z, Y, H, ABCD, and T parameters which are valid for complex source and load impedances," in IEEE Transactions on Microwave Theory and Techniques, vol. 42, no. 2, pp. 205-211, Feb. 1994.
[20] R. B. Marks and D. F. Williams, “A general waveguide circuit theory,” J. Res. Natl. Inst. Stand. Technol., vol. 97, no. 5, pp. 533–562, Sept. 1992.
[21] R. B. Marks, D. F. Williams and D. A. Frickey, "Comments on "Conversions between S, Z, Y, h, ABCD, and T parameters which are valid for complex source and load impedances" [with reply]," IEEE Trans. Microw. Theory Techn., vol. 43, no. 4, pp. 914-915, April 1995.
[22] V. Adamian and B. Cole, "A novel procedure for characterization of multiport high-speed balanced devices," 2006 IEEE International Symposium on Electromagnetic Compatibility, 2006. EMC 2006., Portland, OR, USA, 2006, pp. 395-398.
[23] J. Frei, X. -D. Cai and S. Muller, "Multiport S-Parameter and T-Parameter conversion with symmetry extension," in IEEE Transactions on Microwave Theory and Techniques, vol. 56, no. 11, pp. 2493-2504, Nov. 2008. |