博碩士論文 110521118 詳細資訊




以作者查詢圖書館館藏 以作者查詢臺灣博碩士 以作者查詢全國書目 勘誤回報 、線上人數:41 、訪客IP:18.226.185.44
姓名 蔡伯泓(Bo-Hong Tsai)  查詢紙本館藏   畢業系所 電機工程學系
論文名稱 兩端口及四端口2x-thru去嵌入法之實作
(Implementation of Two-port and Four-port 2x-thru De-embedding Methods)
相關論文
★ 克服 2x-Thru 去嵌入法中的挑戰:解決印刷電路板校準 中的夾具誤差、參考阻抗及表面粗糙度估計問題★ 使用平衡截取與被動降階互連建模法簡化向量擬合所得之模型
檔案 [Endnote RIS 格式]    [Bibtex 格式]    [相關文章]   [文章引用]   [完整記錄]   [館藏目錄]   至系統瀏覽論文 (2028-7-18以後開放)
摘要(中) 由於2x-thru去嵌入校正方法簡單實用,只需測量兩條傳輸線電路即可實現,在實際應用中降低了成本和時間,在相關領域得到越來越廣泛的應用。然而,在過往的文獻除了很少細部分析直通長度對於在實行時間截斷的影響以及在執行時間截斷時,透過窗口函數的技巧減緩頻域截斷的問題,另外,關於四端口實現的方法也缺乏完整文檔。
因此,在本論文的主旨包含了分析不同直通長度對時間截斷造成的影響、針對實務上頻域截斷對信號造成干擾的問題提拱一種改善的方法,以及基於TRL和2x-thru校正演算法,自行編寫了一個Python程序來實現兩端口單端信號的校正,同時,我們事先使用模擬資料來驗證校正演算法的準確性後,再透過量測實例與商用軟體進行校正結果的比較。
此外,隨著科技的進步,差分信號相對於單端信號擁有更快的傳輸速度和抑制雜訊的優勢,因此,為了能夠貼近實際的應用,本研究亦基於2x-thru校正演算法,實現四端口差分信號的校正,同樣地,我們預先利用模擬資料來驗證校正演算法的準確性,再使用量測實例與商用軟體進行校正結果的比較。
摘要(英) The 2x-thru de-embedding calibration method is simple and practical, which only needs to measure two transmission line circuits. It has been widely used in related fields as it helps to reduce the cost and time in practical application. However, in previous literature, the detailed analysis on the effects of thru length on time gating and the use of windowing techniques to mitigate frequency domain truncation issues during time gating is very limited and there is also a lack of complete documentation regarding the implementation of four-port calibration methods.
Therefore, the main objective of this thesis includes analyzing the impact of different THRU lengths on time gating, proposing a method to mitigate the interference caused by frequency domain truncation in practical scenarios, and implementing two-port single-ended calibration based on TRL and 2x-thru calibration algorithms through self-developed Python program. The calibration algorithm′s accuracy is verified by using simulated data in advance, then the calibration results with measurement examples and commercial software is cross compared.
Furthermore, with the advance of science and technology, comparing to single-ended signals, differential signals offer more advantages such as faster transmission speeds and better noise suppression. In order to make it close to the practical application, this research is to implement four-port differential pair calibration based on the 2x-thru calibration algorithm. Similarly, the prior validation of the calibration algorithm′s accuracy by using simulated data is conducted first, and the comparison of calibration results with measurement examples and commercial software will be made afterwards.
關鍵字(中) ★ 2x-thru校正
★ TRL校正
★ S參數
★ 時域反射術
★ 高速信號傳輸
★ 差分對
關鍵字(英) ★ 2x-thru calibration
★ TRL calibration
★ scattering parameters
★ time-domain reflectometry (TDR)
★ high speed signal transmission
★ differential pair
論文目次 中文摘要 ii
Abstract iii
Acknowledgments iv
Contents v
List of figures and list of tables vi
Chapter 1 Introduction 1
1.1 General introduction 1
1.2 Calibration theory 4
1.2.1 Signal flow graph 4
1.2.2 TRL (THRU-REFLECT-LINE) calibration 7
1.2.3 2x-thru de-embedding calibration 15
1.2.4 Theory of characteristic impedance 17
1.2.5 Meaning of reference impedance 19
1.2.6 Renormalization formula 22
1.3 Objective and organization of this thesis 24
Chapter 2 Practical implementation of 2x-thru calibration 27
2.1 Computation of impulse response 27
2.1.1 Calculate continuous IFFT via IDFT 27
2.1.2 Gaussian pulse technique 33
2.2 Time gating point 45
2.3 Computation of TDR 47
2.4 Effect of different thru lengths 51
2.5 Comparison with TRL/AFR/IEEE 370/ISD/SFD/Snpview 65
Chapter 3 Four-port differential calibration 79
3.1 Differential and common mode characteristic impedance 79
3.2 Mixed-mode S-parameters 83
3.3 Four-port T-matrix algorithm 86
3.4 Four-port differential pair calibration with 2x-thru algorithm 90
3.5 Validation and Comparison 95
Chapter 4 Conclusion and future works 111
References 112
參考文獻 [1] R. Schaefer, “Challenges and solutions for removing fixture effects in multi-port measurements,” in Proc. of DesignCon 2008.
[2] G. F. Engen and C. A. Hoer, "Thru-reflect-line: An improved technique for calibrating the dual six-port automatic network analyzer," in IEEE Transactions on Microwave Theory and Techniques, vol. 27, no. 12, pp. 987-993, Dec. 1979.
[3] R. B. Marks, "A multiline method of network analyzer calibration," in IEEE Transactions on Microwave Theory and Techniques, vol. 39, no. 7, pp. 1205-1215, July 1991.
[4] V. Adamian and B. Cole, "A novel procedure for characterization of multiport high-speed balanced devices," 2006 IEEE International Symposium on Electromagnetic Compatibility, 2006. EMC 2006., Portland, OR, USA, 2006, pp. 395-398.
[5] J. Dunsmore, N. Cheng and Y. -x. Zhang, "Characterizations of asymmetric fixtures with a two-gate approach," 77th ARFTG Microwave Measurement Conference, Baltimore, MD, USA, 2011, pp. 1-6.
[6] C. Yoon et al., "Design criteria of automatic fixture removal (AFR) for asymmetric fixture de-embedding," 2014 IEEE International Symposium on Electromagnetic Compatibility (EMC), Raleigh, NC, USA, 2014, pp. 654-659.
[7] S. -J. Moon, X. Ye and R. Smith, "Comparison of TRL calibration vs. 2x thru de-embedding methods," 2015 IEEE Symposium on Electromagnetic Compatibility and Signal Integrity, Santa Clara, CA, USA, 2015, pp. 176-180.
[8] H. Barnes and J. Moreira, "Verifying the accuracy of 2x-Thru de-embedding for unsymmetrical test fixtures," 2017 IEEE 26th Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS), San Jose, CA, USA, 2017, pp. 1-3.
[9] J. Cho et al., "A Two-line Time-domain gating method for characterization of test fixture with via hole discontinuity," in IEEE Microwave and Wireless Components Letters, vol. 27, no. 10, pp. 936-938, Oct. 2017.
[10] Y. Chen, B. Chen, J. He, R. Zai, J. Fan and J. Drewniak, "De-embedding comparisons of 1X-Reflect SFD, 1-port AFR, and 2X-Thru SFD," 2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility (EMC/APEMC), Suntec City, Singapore, 2018, pp. 160-164.
[11] A. S. Salnikov, I. M. Dobush, D. V. Bilevich, A. A. Popov, A. A. Kalentyev and A. E. Goryainov, "A study of connectors and feed lines de-embedding techniques for PCB microwave components S-parameters measurements up to 50 GHz," 2020 Dynamics of Systems, Mechanisms and Machines (Dynamics), Omsk, Russia, 2020, pp. 1-6.
[12] Y. Liu et al., "S-Parameter de-embedding error estimation based on the statistical circuit models of fixtures," in IEEE Transactions on Electromagnetic Compatibility, vol. 62, no. 4, pp. 1459-1467, Aug. 2020.
[13] S. Yao, X. -C. Wei and L. Ding, "A deembedding method for the S-parameter extraction of surface-mounted devices with asymmetric fixtures," in IEEE Microwave and Wireless Components Letters, vol. 31, no. 2, pp. 211-214, Feb. 2021.
[14] B. -W. Liu, X. -C. Wei and C. -X. Xv, "A hybrid de-embedding method for low loss and reciprocal PCB fixtures," in IEEE Transactions on Instrumentation and Measurement, vol. 71, pp. 1-8, 2022, Art no. 1003608.
[15] D. F. Williams and R. B. Marks, "Reciprocity relations in waveguide junctions," in IEEE Transactions on Microwave Theory and Techniques, vol. 41, no. 6, pp. 1105-1110, June-July 1993.
[16] R. E. Collin, Foundation for Microwave Engineering. John Wiley & Sons, 2007.
[17] D. C. Youla, “On scattering matrices normalized to complex port numbers,” Proc. IRE, vol. 49, July 1961, p 1221.
[18] K. Kurokawa, "Power waves and the scattering matrix," in IEEE Transactions on Microwave Theory and Techniques, vol. 13, no. 2, pp. 194-202, March 1965.
[19] D. A. Frickey, "Conversions between S, Z, Y, H, ABCD, and T parameters which are valid for complex source and load impedances," in IEEE Transactions on Microwave Theory and Techniques, vol. 42, no. 2, pp. 205-211, Feb. 1994.
[20] R. B. Marks and D. F. Williams, “A general waveguide circuit theory,” J. Res. Natl. Inst. Stand. Technol., vol. 97, no. 5, pp. 533–562, Sept. 1992.
[21] R. B. Marks, D. F. Williams and D. A. Frickey, "Comments on "Conversions between S, Z, Y, h, ABCD, and T parameters which are valid for complex source and load impedances" [with reply]," IEEE Trans. Microw. Theory Techn., vol. 43, no. 4, pp. 914-915, April 1995.
[22] V. Adamian and B. Cole, "A novel procedure for characterization of multiport high-speed balanced devices," 2006 IEEE International Symposium on Electromagnetic Compatibility, 2006. EMC 2006., Portland, OR, USA, 2006, pp. 395-398.
[23] J. Frei, X. -D. Cai and S. Muller, "Multiport S-Parameter and T-Parameter conversion with symmetry extension," in IEEE Transactions on Microwave Theory and Techniques, vol. 56, no. 11, pp. 2493-2504, Nov. 2008.
指導教授 周求致(Chiu-Chih Chou) 審核日期 2023-7-20
推文 facebook   plurk   twitter   funp   google   live   udn   HD   myshare   reddit   netvibes   friend   youpush   delicious   baidu   
網路書籤 Google bookmarks   del.icio.us   hemidemi   myshare   

若有論文相關問題,請聯絡國立中央大學圖書館推廣服務組 TEL:(03)422-7151轉57407,或E-mail聯絡  - 隱私權政策聲明