博碩士論文 87324084 詳細資訊




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姓名 陳耿男(Gan-Nan Chen)  查詢紙本館藏   畢業系所 電機工程學系
論文名稱 匯流排上的時間延遲及交談失真的偵錯設計技巧
(A Design for Diagnosis technique for the Delay and Crosstalk Measurement of On-chip Bus)
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關鍵字(中) ★ 交談失真
★ 匯流排
★ 時基異變
★ 可偵錯設計技巧
★ 時間延遲
關鍵字(英) ★ crosstalk
★ bus
★ jitter
★ design for diagnosis
★ delay
論文目次 CHAPTER 1 INTRODUCTION1
1.1 TECHNOLOGY BACKGROUND1
1.2 MOTIVATION2
1.3 OBJECTIVE3
1.4 THE BUS ARCHITECTURE AND MODELING3
1.5 THESIS ORGANIZATION4
CHAPTER 2 DIGITAL DELAY MEASUREMENT6
2.1 THE ANALOG PHASE MEASUREMENT6
2.2 THE DIGITAL DELAY MEASUREMENT MODULE - DMM7
2.3 THE DIGITAL DELAY MEASUREMENT MODULE CONFIGURATION7
CHAPTER 3 THE DELAYDFD ARCHITECTURE11
3.1 THE DELAYDFD ARCHITECTURE11
3.2 THE DELAY MEASUREMENT CONFIGURATION12
3.3 BUS DELAY FAULT DIAGNOSIS14
CHAPTER 4 THE CROSSTALK NOISE18
4.1 INTRODUCTION18
4.2 THE ORIGIN OF CROSSTALK NOISE19
4.3 CROSSTALK NOISE EFFECTS21
4.4 CROSSTALK NOISE AND TIMING JITTER23
4.5 PREVIOUS WORK ABOUT CROSSTALK NOISE24
4.6 CROSSTALK NOISE DFD ARCHITECTURE26
4.7 HSPICE SIMULATION28
4.7.1 CASE 1: THE VICTIM LINE IS KEPT SILENT29
4.7.2 CASE 2: THE VICTIM LINE HAS SIGNAL RUNNING29
CHAPTER 5 FPGA IMPLEMENTATION AND VERIFICATION32
5.1 THE ENVIRONMENT SETUP32
5.2 THE EXPERIMENTAL RESULTS33
5.3 COMPARISON BETWEEN THEORETICAL AND MEASUREMENT VALUE35
5.4 CONCLUSION35
CHAPTER 6 FULL CUSTOM IC IMPLEMENTATION36
6.1 THE TEST CHIP ARCHITECTURE36
6.2 WHAT THE TEST CHIP CAN VERIFY38
6.2.1 CROSSTALK NOISE MEASUREMENT39
6.2.2 DIGITAL DELAY MEASUREMENT41
6.2.3 DESIGN FOR DIAGNOSIS41
6.2.4 EXTERNAL DELAY MEASUREMENT42
6.3 THE CIRCUITS DESIGN44
6.3.1 THE VOLTAGE CONTROLLED OSCILLATOR (VCO)44
6.3.2 THE FREQUENCY DIVIDER45
6.3.3 THE LIMITED SWING DRIVER-RECEIVER PAIR45
6.3.4 THE SCHMITT TRIGGER46
6.3.4.1 The Behavior Manner Analysis47
6.3.4.2 The HSPICE Simulation48
6.3.5 THE LIMITED SWING DRIVER DESIGN49
6.3.5.1 The Multi-Function Driver Configuration50
6.3.5.2 The HSPICE Simulation51
6.3.6 THE LIMITED SWING RECEIVER DESIGN54
6.3.6.1 The Receiver Configuration54
6.3.6.2 The HSPICE Simulation55
6.4 THE TEST CHIP CONTROL CIRCUIT56
6.5 THE TEST CHIP LAYOUT57
6.6 THE TESTING CONSIDERATION58
CHAPTER 7 CELL-BASED DESIGN IMPLEMENTATION59
7.1 INTRODUCTION59
7.2 THE BASIC ARCHITECTURE59
7.2.1 THE TIMING GENERATION MODULE59
7.2.2 THE BUS WIRES LAYOUT60
7.2.3 THE MULTI-DRIVING DRIVER61
7.3 THE TEST CHIP SYNTHESIS61
7.4 THE TEST CHIP LAYOUT62
CHAPTER 8 CONCLUSIONS64
REFERENCE66
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指導教授 蘇朝琴(Chauchin Su) 審核日期 2000-6-12
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