摘要(英) |
Abstract
Indium nanoparticle is produced by evaporation, changing Argon pressure and the temperature of W-boat to make different Indium nanoparticle diameters. The larger particle diameter is grew in higher Argon pressure, and the smaller one is grew in lower temperature.
The experiment of susceptibility is mainly divided into two parts, one is London penetration depth and the other is the superconducting coupling strength. London penetration depth is according to London theorem to get London equation. Indium nanoparticle becomes small along with the small penetration depth and when particle diameter is around 10-nm, the penetration depth will suddenly becomes unusual large with the small diameter of particle. This scenario indicates when the particle diameter is less than 10-nm, then diamagnetic screening effect will diminish gradually.
In the superconducting coupling strength part, it shows that the critical magnetic field becomes large with particle diameter becomes small. Similarly, when particle diameter approximates 14-nm, the critical magnetic field approaches the maximum value. Nevertheless, when the particle diameter is lower 14-nm, the smaller particle diameter causes the smaller critical magnetic field. For each sample in the coupling strength value, knowing that the particle diameters are equal to 65-nm, 17-nm, 14-nm, 12-nm and 8-nm then the coupling strength values are 1.28, 1.46, 1.64, 1.37 and 1.54 respectively. |
參考文獻 |
參考文獻
[1] M. Jalochowski , H. Knoppe, G. Lilienkamp, E. Bauer, Phys. Rev. B 46, 4693(1992)
[2] S. Sun, C. B. Murray, J. Appl. Phys. 85, 4325(1999)
[3] M. Hansont, C. Johanssont, M. S. Pedersent, S. Morup, J. Phys. 7, 9269(1995)
[4] D. A. Walters, L. M. Ericson, Appl. Phys. Lett.74, 3803(1999)
[5] J. Bardeen, L. N. Cooper, J. R. Schrieffer, Phys. Rev. 108, 1175(1957)
[6] H. Frohlich, Phys. Rev. 79, 845(1950)
[7] J. C. Swihart, Phys. Rev. Lett. 14, 106(1965)
[8] 周和穆, 零維奈米鉛粉粒超導耦合強度與粒徑關係探討, 中央大學碩士論文(2003)
[9] Kittel, Introduction to Solid State Physics, Chapter2, 31(1998)
[10] 李秉中, 利用X光繞射峰形探討奈米粉末的粒徑分佈, 中央大學碩士論文(2003)
[11] T. Ishida, R. B. Goldfarb, Phys. Rev. B 41, 8937(1990)
[12] F. London and H. London, Proc. Roy. Soc.,(London)A155, (1935), 71
[13] C. J. Gorter and H. B. Casimir, Physica, 1 (1934a), 306; Phys. Z., 35(1934b), 963; Z. Techn. Phy., 15(1934b), 539
[14] M. K.Wilkinson, Phys. Rev. 97, 889(1955)
[15] D. L. Decker, D. E. Mapother, R. W. Shaw, Phys. Rev. 112, 1888(1958)
[16] D. A. Walters, L. M. Ericson, Appl. Phys. Lett. 74, 3803 (1999) |