博碩士論文 943207024 詳細資訊




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姓名 周登科(Teng-Ko Chou)  查詢紙本館藏   畢業系所 光機電工程研究所
論文名稱 全場相位式表面電漿共振生醫感測器
(Surface plasmon resonance bio-sensor with full-field phase detection)
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摘要(中) 本研究以偏振干涉術結合表面電漿共振技術,配合CCD擷取影像,得到四個相位兩兩相差90度的光強度訊號,再以類似四步移相的數值方法,量測出一整面硫醇(Thiol)分佈的全場相位資訊。本解相系統的相位解析度為0.8度,整體系統對折射率的靈敏度為1.6X10-5RIU(Refractive Index Unit, RIU)。此表面電漿共振儀在實驗上可以量測出折射率差0.0001RIU的磷酸鹽緩衝液(Phosphate-Buffered Saline, PBS)。另外可以分辦出濃度為20mM及2mM的硫醇在3x3mm2範圍裡的相位變化。本系統具有即時、定量、高靈敏度等優點,且可應用於微小生物分子鍵結反應的檢測領域上。若能結合不同的生物分子應用於陣列晶片上,將能達到大量平行篩檢的目的。
摘要(英) A full-field phase detection system for surface plasmon resonance (SPR)
bio-sensor is presented. In our full-field system, we combine a method of the
polarization interference for phase detection, SPR technique and CCD Video
camera. By means of a similar algorithm phase-shifting interferometry, the
distribution of SPR bio-sensor was obtained. We have successfully detected the
refractive index variation of PBS (phosphate-buffered saline) with 0.0001RIU
(Refractive Index Unit), and measured the thiol(C8H14O2S2) of 20mM and 2mM
within 3×3 mm2 full field range. The resolution of phase detection is about 0.8
degree, and the measurement sensitivity of refractive index is about 1.6×10-5
RIU. This system has advantages, such as immediately, ration, high sensitivity,
etc., it can be applied to the small biological molecule interaction. If can
combine different biological members to apply to the array chip, it can be a
large number of high throughput screening.
關鍵字(中) ★ 偏振干涉術
★ 表面電漿共振技術
★ 全場相位
關鍵字(英) ★ Polarization Interferometry
★ Surface Plasmon Resonance
★ full field phase detection
論文目次 摘要 I
Abstract II
誌謝 III
目錄 IV
圖目錄 VII
表目錄 XI
符號說明 XII
第一章 緒論 1
1-1前言 1
1-2文獻回顧 2
1-3研究動機與目的 3
1-4論文架構 4
第二章 表面電漿共振 6
2-1表面電漿共振原理 6
2-2激發表面電漿波的方式 11
2-3反射光強度與相位數學推導 15
2-4小結 21
第三章 解相位理論與架構 22
3-1解相位架構 22
3-2 瓊斯矩陣計算理論分析 24
3-3全場折射率分析模擬 26
3-4系統校正 28
3-5利用空氣全反射驗證解相系統 33
3-6小結 35
第四章 系統設計與架構 36
4-1感測器參數設計 36
4-2機構設計 42
4-3整體架構 47
4-4程式設計 50
4-5小結 53
第五章 實驗結果與討論 54
5-1 實驗準備 54
5-2 實驗一:液體切換量測 59
5-3 實驗二:不同濃度之硫醇陣列點量測 61
5-4 實驗三:蛋白質與硫醇鍵結 65
5-5 誤差來源與分析 70
5-6 系統靈敏度分析 72
5-7 小結 73
第六章 結論 74
參考文獻 75
附錄一 作者相關著作 80
附錄二 儀器參展之DM 81
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指導教授 李朱育(Ju-Yi Lee) 審核日期 2007-7-18
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