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以作者查詢圖書館館藏 、以作者查詢臺灣博碩士 、以作者查詢全國書目 、勘誤回報 、線上人數：19 、訪客IP：3.17.203.68
姓名 張博雄(Bo-Shon Chang) 查詢紙本館藏 畢業系所 電機工程學系 論文名稱 以電子電路觀點對田口式惠斯登電橋模擬實例的再分析
(Reanalysis On The Wheatstone Bridge Simulation Example By Taguchi In Terms Of Electronic Circuit)相關論文 檔案 [Endnote RIS 格式]
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[館藏目錄]
至系統瀏覽論文 ( 永不開放)
摘要(中) 本論文是將各參數引入公差來深入解析惠斯登電橋，並導出精確解式子，再利用binary search演算法與matlab軟體，以期求得所對應之量測值，同時對惠斯登電橋進行蒙地卡羅分析。經由離群值存在的事實發現惠斯登電橋本質上的量測問題，找出惠斯登電橋量測奇異點的地方，並証明越靠近量測奇異點的位置，越容易出現離群值，進而推導出式子來概括論述奇異點所在位置與各參數間的關係。除此之外，將我們分析所得的結果與田口玄一博士及黎正中教授用直交表分析的結果做一個徹底而完整的比較是為本論文的另一大要點。 摘要(英) In this thesis, the Wheatstone bridge is deeply analyzed by introducing the tolerance of each component and the exact formula is derived to show the relationship of parameters. It is found out that the existence of the singularity for the measured parameter is the essential measuring error of Wheatstone bridge. Monte Carlo Method by combining binary search algorithm in Matlab is used to solve the value of corresponding measured parameter. While the set of parameters is close to the location of singularity, it results the value of measured parameter to be an outlier, i.e. less measurement accuracy. Additionally, the explanation of the relation between the location and all parameters by the derived formula is given. Comparison of our results with Dr. Taguchi’s and Dr. Chang Chung Li’s results by orthogonal matrix is another key point and it shows our result is consistent with the one of Dr. Li. 關鍵字(中) ★ 惠斯登電橋
★ 容限分析關鍵字(英) ★ Wheatstone bridge
★ tolerance論文目次 摘要 i
Abstract ii
誌謝 iii
目錄 iv
圖目錄 vii
表目錄 ix
第一章 簡 介 1
第二章 基本統計學與蒙地卡羅分析 3
2-1 名詞解釋 3
2-1-1 平均數（Mean） 3
2-1-2 變異數(Variance) 3
2-1-3 標準差(Standard Deviation) 3
2-1-4 常態分布(Normal distribution) 4
2-2 蒙地卡羅分析 6
第三章 基本理論 7
3-1 概述田口品質工程 7
3-2 概述惠斯登電橋 9
3-2-1 惠斯登電橋的起源 9
3-2-2 惠斯登電橋的基本原理 9
3-2-3 惠斯登電橋在量測上的應用 10
第四章 實驗流程與模擬結果 12
4-1 問題描述 12
4-2 實驗流程 14
4-3 電路解析 16
4-3-1 電阻的Δ-Y轉換 16
4-3-2 Temp的定義 17
4-3-3 二分搜尋演算法(Binary Search) 19
4-4 模擬結果 22
4-4-1 標準化 22
4-4-2 標準化後的結果-八角圖 22
4-4-3 Z參數 26
第五章 實驗討論與歸納 29
5-1 精確解與近似解 29
5-2 奇異點與參數、公差設計的關係 31
5-2-1 奇異點與臨界線 31
5-2-2 參數設計與公差設計 31
5-3 實驗歸納 36
第六章 結 論 38
參考文獻 39參考文獻 [1] Northrup, E. F. , “Methods Of Measureing Electrical Resistance”, McGraw-Hill, 1912.
[2] Berry, S. A. , ”Techniques In The Application Of Computers To Industrial Moni -toring”, In CAD/CAＭ and the Computer Revolution, Society of Manufacturing Engineers, pp. 221-239, 1974.
[3] Phadke, N. S. , Kackar, R. N. , Speeney, D. V. , and Grieco, N. J. , ”Off-Line Quality Control In Integrated Circuit Fabrication Using Experimental Design”, The Bell System Technical Journal, vol. 62, no. 5, pp. 1273-1309, 1983.
[4] Roussas, G. G. , “A First Course In Mathematical Statistics”, Addison Wesley, 1985.
[5] Taguchi, G. , “Introduction To Quality Engineering”, Asian Productivity Organ -ization, 1986.
[6] Taguchi, G. , ” On-Line Quality Control”, Japanese Standards Associations, 1986.
[7] Taguchi, G. , Elsayed, E. A. , Hsiang, T. C. , ”Quality Engineering In Production Systems”, McGraw-Hill, 1989.
[8] Chang-Chung Li and Chen-Yih Weng, “Reanalysis On The Wheatstone Bridge Simulation Example By Taguchi”, Journal of The Chinese Institute of Industrial Engineers, vol.8, no.1, pp. 21-26, 1991.
[9] Carstens, “Electrical Sensors And Transducers”, Prentice Hall, pp. 203-205, 1993.
[10] Dally, Riley, and McConnell, “Instrumentation For Engineering Measurements”, Wiley, 2nd Ed, pp. 171-176, 1993.
[11] Peace, G. S. , ” Taguchi Methods”, Addison Wesley, 1993.
[12] Ross, P. J. , ” Taguchi Techniques For Quality Engineering”, McGraw-Hill, 2nd Ed, 1996.
[13] Bentley, J. P. , ”Introduction To Reliability And Quality Engineering”, Pearson Prentrice Hall, 1999.
[14] 黎正中, ”穩健設計之品質工程”, 台北圖書, 1989.
[15] 蘇朝墩, “產品穩健設計-田口品質工程方法的介紹和應用”, 中華民國品質學會, 1997.指導教授 陳竹一(Jwu-E Chen) 審核日期 2008-11-25 推文 plurk
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