參考文獻 |
Chapter 1
[1] Z.-A. Ren, G.-C. Che, X.-L. Dong, J. Yang, W. Lu, W. Yi, X.-L. Shen, Z.-C. Li, L.-L. Sun, F. Zhou, & Z.-X Zhao, Europhysics Letters 83, 17002 (2008).
[2] V. Johnson, & W. Jeitschko, J. Solid State Chem. 11, 161 (1974).
[3] H. Sprenger, J. Less-Common Met. 34, 39 (1974).
[4] L. S. Andrukhiv, L.O. Lysenko, Ya. P. Yarmolynk, & E. I. Gladyshevskii, Dopov. Akad. Nauk. Ukr. Ser. A, 645 (1975).
[5] F. Jellinek, & H. Hahn, Naturwissenschaften 49, 103 (1962).
[6] A. J. Klein Haneveld, & F. Jellinek, Rec. Trav. Chim. 83, 776 (1964).
[7] V. Johnson, & W. Jeitschko, J. Solid State Chem. 6, 306 (1973).
[8] W.B. Pearson, Z. Kristallogr. 171, 23 (1985).
[9] P. Villars, & L.D. Calvert, Pearson’s Handbook of Crystallographic Data for Intermetallic Phases, 2nd Ed., American Society for Metals, Materials Park, OH, 1991, and desk edition, 1997.
[10] M. Palazzi, C. Carcaly, & J. Flahaut, J. Solid State Chem. 35, 150 (1980).
[11] M. Palazzi, & S. Jaulmes, Acta Crystallogr. B37, 1337 (1981).
[12] P. Palazzi, C. R. Acad. Sc. Ser. II 292, 789 (1981).
[13] K. Ueda, S. Inoue, S. Hirose, H. Kawazoe, & H. Hosono, Appl. Phys. Lett. 77, 2701 (2000).
[14] H. Hiramatsu, H. Kamioka, K. Ueda, H. Ohta, T. Kamiya, M. Hirano, & H. Hosono, Phys. Stat. Sol. A 203, 2800 (2006).
[15] D. Kaczorowski, J.H. Albering, H. Noël, & W. Jeitschko, J. Alloys Compd. 216, 117 (1994).
[16] B. I. Zimmer, W. Jeitschko, J.H. Albering, R. Glaum, & M. Reehuis, J. Alloys Compd. 229, 238 (1995).
[17] J.H. Albering, & W. Jeitschko, Z. Naturforsch. 51b, 257 (1996).
[18] A. T. Nientiedt, B. I. Zimmer, P. Wollesen, & W. Jeitschko, Z. Kristallogr. Suppl. 11, 101 (1996).
[19] P.Wollesen, J.W. Kaiser, & W. Jeitschko, Z. Naturforsch. 52b, 1467 (1997).
[20] A.T. Nientiedt, W. Jeitschko, P.G. Pollmeier, & M. Brylak, Z. Naturforsch. 52b, 560 (1997).
[21] A. T. Nientiedt, & W. Jeitschko, Inorg. Chem. 37, 386 (1998).
[22] P. Quebe, L. J. Terbüchte, & W. Jeitschko, J. Alloys Compd. 302, 70 (2000).
[23] M. Reehuis, & W. Jeitschko, J. Phys. Chem. Solids 51, 961 (1990).
[24] H. Lincke, T. Nilges, & R. Pöttgen, Z. Anorg. Allg. Chem. 632, 1804 (2006).
[25] H. Lincke, R. Glaum, V. Dittrich, M. Tegel, D. Johrendt, W. Hermes, M.H. Möller, T. Nilges, & R. Pöttgen, Z. Anorg. Allg. Chem. 634, 1339 (2008).
[26] Y. Kamihara, H. Hiramatsu, M. Hirano, R. Kawamura, H. Yanagi, T. Kamiya, & H. Hosono, J. Am. Chem. Soc. 128, 10012 (2006).
[27] T. Watanabe, H. Yanagi, T. Kamiya, Y. Kamihara, H. Hiramatsu, M. Hirano, & H. Hosono, Inorg. Chem. 46, 7719 (2007).
[28] M. Tegel, D. Bichler, & D. Johrendt, Solid State Sci. 10, 193 (2008).
[29] Y. Kamihara, T. Watanabe, M. Hirano, & H. Hosono, J. Am. Chem. Soc. 130, 3296 (2008).
[30] Z.-A. Ren, J. Yang, W. Lu, W. Yi, G.-C. Che, X.-L. Dong, L.-L. Sun, & Z.-X. Zhao, Mater. Res. Innov. 12, 1 (2008).
[31] Z.-A. Ren, W. Lu, J. Yang, W. Yi, X.-L. Shen, Z.-C. Li, G.-C. Che, X.-L. Dong, L.-L. Sun, F. Zhou, & Z.-X. Zhao, Chin. Phys. Lett. 25, 2215 (2008).
[32] T. Nomura, S.W. Kim, Y. Kamihara, M. Hirano, P.V. Sushko, K. Kato, M. Takata, A. L. Shluger, & H. Hosono, Supercond. Sci. Technol. 21, 125028 (2008).
[33] C. De la Cruz, Q. Huang, J.W. Lynn, J. Li,W. Ratcliff, L. L. Zarestky, H.A. Mook, G. F. Chen, J. L. Luo, N. L. Wang, & P. Dai, Nature 453, 899 (2008).
[34] S. Kitao, Y. Kobayashi, S. Higashitaniguchi, M. Saito, Y. Kamihara, M. Hirano, T. Mitsui, H. Hosono, & M. Seto, J. Phys. Soc. Jpn. 77, 103706 (2008).
[35] H.-H. Klauss, H. Luetkens, R. Klingeler, C. Hess, F. J. Litterst, M. Kraken, M.M. Korshunov, I. Eremin, S.- L. Drechsler, R. Khasanov, A. Amato, J. Hamann- Borrero, N. Leps, A. Kondrat, G. Behr, J. Werner, & B. Büchner, Phys. Rev. Lett. 101, 077005 (2008).
[36] M. Tegel, I. Schellenberg, R. Pöttgen, & D. Johrendt, Z. Naturforsch. 63b, 1057 (2008).
[37] O. K. Andersen, Phys. Rev. B 12, 3060 (1975).
[38] O. Jepsen & O. K. Z. Andersen, Phys. B. 97, 35 (1995).
[39] W. C. Sheets, E. S. Stampler, H. Kabbour, M. I. Bertoni, L. Cario, T. O. Mason, T. J. Marks, & K. R. Poeppelmeier, Inorg. Chem. 46, 10741 (2007).
[40] H. W. Eng, P. W. Barnes, B. M. Auer, & P. M. Woodward, J. Solid State Chem. 175, 94 (2003).
[41] E. S. Stampler, W. C. Sheets, M. I. Bertoni, W. Prelller, T. O. Mason, & K. R. Poeppelmeier, Inorg. Chem. 47, 10009 (2008).
[42] P. S. Berdonosov, A. M. Kusainova, L. N. Kholodkovskaya, V. A. Dolgikh, L. G. Akselrud, & B. A. Popovkin, J. Solid State Chem. 118, 74 (1995).
[43] A. Zakutayev, P. F. Newhouse, R. Kykyneshi, P. A. Hersh, D. A. Keszler, & J. Tate, Appl. Phys. A 102, 485 (2011).
[44] H. Hiramatsu, H. Yanagi, T. Kamiya, K. Ueda, M. Hirano, & H. Hosono, Chem. Mater. 20, 326 (2008).
[45] T. Ohtani, Y. Tachibana, & Y. Fujii, J. Alloys Compd. 262–263, 175 (1997).
[46] H. Ohta, S. Kim, Y. Mune, T. Mizoguchi, K. Nomura, S. Ohta, T. Nomura, Y. Nakanishi, Y. Ikuhara, M. Hirano, H. Hosono, & K. Koumoto, Nat. Mater. 6, 129 (2007).
[47] Y. Liu, L.-D. Zhao, Y.-C. Liu, J. Lan, W. Xu, F. Li, B.-P. Zhang, D. Berardan, N. Dragoe, Y.-H. Lin, C.-W. Nan, J.-F. Li, & H. Zhu, J. Am. Chem. Soc. 133, 20112 (2011).
[48] S. K. Karna, C.-H. Hung, C.-M. Wu, C.-W. Wang, W.-H. Li, R. Sankar, F.-C. Chou, & M. Avdeev, Dalton Trans. 42, 15581 (2013).
[49] S. K. Karna, C.-W. Wang, C.-M. Wu, C.-K. Hsu, D. Hsu, C.-J. Wang, W.-H. Li, R. Sankar, & F.-C. Chou, J. Phys.: condens. Matter 24, 266004 (2012).
[50] A. Ubaldini, E. Giannini, C. Senatore, & D. van der Marel, Physica C 470, S356 (2010).
[51] L. Ortenzi, S. Biermann, O. K. Andersen, I. I. Mazin, & L. Boeri, Phys. Rev. B 83, 100505(R) (2011).
[52] S. K. Karna, R. Sankar, C.-M. Wu, C.-W. Wang, D. Hsu, C.-J. Wang, F.-C. Chou, & W.-H. Li, J. Phys. Soc. Jpn. 80, SB011 (2011).
[53] S. K. Karna, W.-H. Li, C.-M. Wu, C.-W. Wang, C.-Y. Li, R. Sankar, & F.-C. Chou, J. Phys. Soc. Jpn. 82, 094705 (2013).
Chapter 2
[1] http://www.qdusa.com/sitedocs/productBrochures/mag3-07.pdf.
[2] http://www.qdusa.com/sitedocs/productBrochures/16TPPMS7.pdf.
[3] http://www.mrl.ucsb.edu/sites/default/files/mrl_docs/instruments/resPPMS.pdf.
Capter 3
[1] A. Guinier, X-ray diffraction in crystals, imperfect crystals, and amorphous bodies, W. H. Freeman & Company, San Francisco, 1963.
[2] B. E. Warren, X-ray diffraction, Dover Publications, New York, 1990.
[3] A. D. Krawitz, Introduction to diffraction in materials science and engineering, John Wiley & Sons, New York, 2001.
[4] H. M. Rietveld, Acta Crystallogr. 22, 151 (1967).
[5] H. M. Rietveld, J. Appl. Crystallography. 2, 65 (1969).
[6] R. A. Young (Eds.), The Rietveld Method, 4th Ed., Oxford University Press, New York, 2002.
[7] http://www.mx.iucr.org/iucr-top/comm/cpd/rietveld.html
[8] B. H. Toby, J. Appl. Cryst. 34, 210 (2001).
[9] A. C. Larson & R. B. von Dreele, GSAS Manual, p.167
[10] P. V. E. McClintock, and D. J. Meredith, & J. K. Wigmore, Matter at Low Temperatures, Blackie & Son, London, 1984.
[11] K. Morigaki, Physics of Amorphous Semiconductors, Chap. 7, World Scientific, Singapore, 1999.
[12] N. F. Mott, Phil. Mag. 19, 835 (1969).
[13] N. F. Mott & E. A. Davis, Electronic Processes in Non-Crystalline Materials, 2nd Ed., Clarendon press, Oxford, 1979.
[14] R. W. Rollins, H. Küpfer, & W. Gey, J. Appl. Phys. 45, 5392 (1974).
[15] R. Singh, R. Lal, U. C. Upreti, D. K. Suri, A. V. Narlikar, V. P. S. Awana, J. Albino Aguiar, & Md. Shahabuddin, Phys. Rev. B 55, 1216 (1997).
[16] J. M. D. Coey, Magnetism and Magnetic Materials, Cambridge University Press, New York, 2010.
Chapter 4
[1] H.-M. Kagaya, & T. Soma, Solid State Commun. 85, 617 (1993).
[2] R. Douglas, & B. Ellis (Eds.), Amorphous Materials, Wiley, New York, 1970.
[3] G. Hausch, R. Bächer, & J. Hartmann, Physica B 161, 22 (1989).
[4] T. A. Mary, J. S. Evans, O. Vogt, & A.W. Sleight, Science 272, 90 (1996).
[5] R. H. Baughman & D. S. Galvao, Nature 365, 735 (1993).
[6] C. E. Guillaume, C.R. Hebd. Seances Acad. Sci. 125, 235 (1897).
[7] A. Sleight, Nature 425, 674 (2003).
[8] J. R. Salvador, F. Gu, T. Hogan, & M. G. Kanatzidis, Nature 425, 702 (2003).
[9] Y. Zhang, Z. Islam, Y. Ren, P. A. Parilla, S. P. Ahrenkiel, P. L. Lee, A. Mascarenhas, M. J. McNevin, I. Naumov, H. X. Fu, X. Y. Huang, & J. Li, Phys. Rev. Lett. 99, 215901 (2007).
[10] J. Li, W. H. Bi, W. Ki, X. Y. Huang, & S. Reddy, J. Am. Chem. Soc. 129, 14140 (2007).
[11] J. Chen, X. R. Xing, C. Sun, P. H. Hu, R. B. Yu, X. W. Wang, & L. H. Li, J. Am. Chem. Soc. 130, 1144 (2008).
[12] K. Takenaka & H. Takagi, Appl. Phys. Lett. 94, 131904 (2009).
[13] X. Song, Z. Sun, Q. Huang, M. Rettenmayr, X. Liu, M. Seyring, G. Li, G. Rao, & F. Yin, Adv. Mater. 23, 4690 (2011).
[14] T. Yokoyama & K. Eguchi, Phys. Rev. Lett. 107, 065901 (2011).
[15] X. Zhang, Y. Ren, M. Roushan, & J. Li, Eur. J. Inorg. Chem. 36, 5966 (2012).
[16] K. J. Miller, C. P. Romao, M. Bieringer, B. A. Marinkovic, L. Prisco, & M. A. White, J. Am. Ceram. Soc. 96, 561 (2013).
[17] X. G. Zheng, H. Kubozono, H. Yamada, K. Kato, Y. Ishiwata, & C. N. Xu, Nat. Nanotechnol. 3, 724 (2008).
[18] S. Iikubo, K. Kodama, K. Takenaka, H. Takagi, M. Takigawa, & S. Shamoto, Phys. Rev. Lett. 101, 205901 (2008).
[19] Y. W. Long, N. Hayashi, T. Saito, M. Azuma, S. Muranaka & Y. Shimakawa, Nature 458, 60 (2009).
[20] D. Das, T. Jacobs, & L. J. Barbour, Nat. Mater. 9, 36 (2010).
[21] P. Hu, J. Chen, J. Deng, & X. Xing, J. Am. Chem. Soc. 132, 1925 (2010).
[22] L. Sun & P. Kwon, Mater. Sci. Eng. A 527, 93 (2009).
[23] L. Sun, A. Sneller, & P. Kwon, Compos. Sci. Technol. 68, 3425 (2008).
[24] A. Poowancum, K. Matsumaru, & K. Ishizaki, J. Am. Ceram. Soc. 94, 1354 (2011).
[25] L. V. B. Diop, M. Amara, & O. Isnard, J. Phys.: Condens. Matter 25, 416007 (2013).
[26] T. Hamada & K. Takenaka, J. Appl. Phys. 111, 07A904 (2012).
[27] http://www.telegraph.co.uk/news/worldnews/australiaandthepacific/australia/4414203/Southern-Australia-endures-worst-heatwave-for-150-years.html
[28] A. C. Larson & R. B. Von Dreele, General Structure Analysis System, Report LA-UR-86-748, Los Alamos National Laboratory, Los Alamos, 1990.
[29] H. M. Rietveld, J. Appl. Crystallogr. 2, 65 (1969).
[30] K. Ueda, H. Hiramatsu, H. Ohta, M. Hirano, T. Kamiya, & H. Hosono, Phys. Rev. B 69, 155305 (2004).
[31] G. K. White & P. J. Meeson, Experimental Techniques in Low-Temperature Physics, 4th Ed., p. 223, Oxford University Press Inc., New York, 2002.
[32] B. E. Warren, X-ray diffraction, Ch. 9.2, p. 108-111, Dover Publications, New York, 1990.
[33] N. E. Brese & M. O’Keeffe, Acta Cryst. B47, 192 (1991).
[34] S. K. Karna, W.-H. Li, C.-M. Wu, C.-W. Wang, C.-Y. Li, R. Sankar, and F. C. Chou, J. Phys. Soc. Jpn. 82, 094705 (2013).
Chapter 5
[1] B. L. Shklovskii & A. L. Efros, Electronic Properties of Doped Semiconductors, Springer-Verlag, Berlin, 1984.
[2] M. N. Baibich, J. M. Broto, A. Fert, F. Nguyen Van Dau, F. Petroff, P. Eitenne, G. Creuzet, A. Friederich, & J. Chazelas, Phys. Rev. Lett. 61, 2472 (1988).
[3] J. M. D. Coey, J. Appl. Phys. 85, 5576 (1999).
[4] M. Venkatesan, P. Velasco, J. A. Alonso, J. L. Martínez & J. M. D. Coey, J. Phys.: Condens. Matter 16, 3465 (2004).
[5] T. Block, S. Wurmehl, & C. Felser, Appl. Phys. Lett. 88, 202504 (2006).
[6] M. Saloaro, S. Majumdar, H. Huhtinen, & P. Paturi, J. Phys.: Condens. Matter 24, 366003 (2012).
[7] Y. Kopelevich, R. R. da Silva, B. C. Camargo, & A. S. Alexandrov, J. Phys.: Condens. Matter 25, 466004 (2013).
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