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姓名 郝峻(Chun Hao)  查詢紙本館藏   畢業系所 機械工程學系
論文名稱 碳奈米管微電極陣列之製造與性質檢測
(Fabrication and characterization of carbon nanotube microelectrode array system)
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摘要(中) 本實驗目的為碳奈米管微電極陣列之製作,結合半導體製程中的各項製程:包括了薄膜沉積、微影蝕刻等以製做碳奈米管元件,並研究所製做完成的微電極陣列之特性(電化學特性之分析與細胞觀測之應用)。
首先評估雙金屬催化劑與浸漬法(dip-coating method)對於碳管電極陣列製做之可行性,透過控制不同的催化劑與催化劑比例,選擇一組對於製做電極陣列最佳的催化劑與比例條件,以此條件在不同的薄膜上使用熱化學氣相沉積來對碳管元件製做之選擇性與可行性做評估。
從浸漬法的實驗中,我們可以發現到,使用鈷金屬催化劑成長碳奈米管的效果較鎳金屬為好,碳奈米管的分布與管徑大小都較均勻;然而不管是在介電質薄膜或是導體薄膜上,薄膜的粗糙度、親疏水性與晶向組成都不會是影響浸漬法效果的主要因素,厚度與薄膜的其他特性可能是更為關鍵的因素;不同的表面處理方法於薄膜的表面改質效果,對於浸漬法成長碳奈米管的應用上目前則沒有一個顯著的效果。
由此我們改為探討薄膜催化劑與製程條件對製做碳奈米管元件的之效果,透過蝕刻法與光阻去除法來定義出碳奈米管元件的圖案,討論製程對微電極陣列晶片之影響,並對製程氣體、壓力與成長溫度對碳奈米管微電極陣列元件的製備做一系列的探討:
而我們可以發現在使用NH3做為還原氣體時,製程溫度對於碳奈米管的形貌並沒有太大的影響;另外隨著成長時間的增加,碳奈米管的密度也相對增加,催化劑在製程中的毒化並沒有造成太大影響。因此我們可以使用一個較為低溫的成長情況與成長時間來控制碳奈米管的表面形貌,由此進一步的比較碳奈米管電極陣列的元件特性。
摘要(英) Our experiment is to fabricate CNT-MEA system with combining novel integrated circuit technology including film deposition, lithography and etching process and to study the characteristics (impedance and cell observation) of the as fabricated CNT-MEA.
We assess the feasibility of using bimetallic catalysts and dip-coating method to fabricate CNT-MEA. With different metal catalysts and controlling the ratio of catalysts, we are able to find an optimum condition for growing CNT on different substrates. And cobalt shows better catalytic ability on growing CNT (the density and uniformity of CNT) than nickel in dip-coating method. And the governing factor for applying dip-coating to grow CNT might be the thickness or other specific characteristics of the supporting layer rather than the roughness, hydrophility and crystal structure of the supporting layer. No efficient surface treatment was found for applying dip-coating method to fabricate CNT-MEA.
Thus we try to study the effect of thin film catalyst and CVD process conditions (gas flow, pressure and growth temperature) on fabricating CNT-MEA. With different methods (etching and lift off) to define the pattern of MEA, we are able to discuss and to solve the encountering problems during CNT growth process.
When using NH3 gas as the reduction gas, growth temperature does not show significant effect on the CNT property and morphology. And with increasing the growth temperature, the density of CNT increases simultaneously disregards the poison effect of catalyst during growth process.
We’re now able to grow CNT at lower temperature and to control the morphology with growth time, thus we can study the characteristic of the as fabricated CNT-MEA device.
關鍵字(中) ★ 碳奈米管
★ 浸漬法
★ 微電極陣列
★ 熱化學氣相沉積
關鍵字(英) ★ MEA
★ CNT
★ thermal CVD
★ dip-coating method
論文目次 中文摘要 I
英文摘要 II
致謝 III
圖目錄 VII
表目錄 XII
第一章 緒論 1
1-1. 前言 1
1-2. 研究動機與目的 2
1-3. 文獻回顧 2
1-3-1. 微電極陣列 2
1-3-2. 金屬催化劑的沉積方法 4
第二章 碳奈米管的介紹 6
2-1. 碳奈米管的起源 6
2-2. 碳奈米管的結構 8
2-3. 奈米碳管之成長機制 12
2-4. 碳奈米管的合成技術 14
2-5. 碳奈米管的特性與應用 17
第三章 實驗方法與設備 18
3-1. 實驗流程 18
3-2. 實驗設備簡介 19
3-3. 使用浸漬法沉積催化劑薄膜 23
3-3-1. 浸漬法 23
3-3-2. 溶液配製與試片準備 24
3-3-3. 雙金屬催化劑對於製程條件的影響 25
3-4. 使用金屬薄膜進行微電極陣列之製作 26
3-4-1. 微電極陣列製作流程 26
3-4-2. 使用鎳薄膜來製做微電極陣列元件 27
3-5. LTCVD成長碳奈米管之步驟 29
3-6. 碳奈米管微電極陣列之分析 30
第四章 結果與討論 35
4-1. 使用浸漬法沉積催化劑薄膜 35
4-1-2. 試片清洗對浸漬法之影響 38
4-1-3. 催化劑濃度對碳奈米管成長之影響 40
4-1-4. 薄膜厚度對浸漬法的影響 42
4-1-5. 浸漬法對不同介電薄膜之選擇性 44
4-1-6. 浸漬法於表面處理前後導體薄膜之選擇性 46
4-2. 鎳薄膜製做碳奈米管微電極陣列 52
4-2-1. 薄膜的圖案化製程對成長碳奈米管的影響 53
4-2-2. 製程中氨氣對碳奈米管成長之比較 54
4-2-3. 製程參數對碳奈米管成長之影響 56
4-2-3-1. 甲皖流量對碳奈米管形貌的影響 57
4-2-3-2. 電漿前處理對碳奈米管形貌的影響 58
4-2-3-3. 製程溫度對碳奈米管形貌的影響 60
4-2-3-4. 製程壓力對碳奈米管形貌的影響 61
4-2-3-5. 製程時間對碳奈米管形貌的影響 63
4-3. 製程中熱應力的問題 64
4-4. 微電極陣列的電學性質檢測 69
4-4-1. 電流特性量測 69
第五章 結論與未來展望 71
5-1. 結論 71
5-2. 未來展望 72
參考文獻 73
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指導教授 黃豐元(Fuang-Yuan Huang) 審核日期 2010-7-26
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