參考文獻 |
[1] Peter Van Zant著,姜庭隆譯,“半導體製程”, 滄海書局,第四版,2001.
[2] Quirk Serda著,羅文雄、蔡榮輝譯,“半導體製造技術”,滄海書局,2003.
[3] 莊達仁,“VLSI製造技術”,第五版,高立出版社,2002.
[4] 邱燦賓、施敏, “科學發展月刊”, 第28卷, 第6期, 434(2000).
[5] Wayne M. Moreau, “Semiconductor lithography”, 2nd, Plenum, 1989.
[6] C. V. Shank and R. V. Schmidt, “Optical technique for producing 0.1-µ periodic surface structures”, Appl. Phys. Lett. 23, 154(1973).
[7] L.F. Johnson, G. W. Kammlott, and K. A. Ingersoll, “Generation of periodic surface
corrugations”, Appl. Opt. Vol. 17, No.8, 1165(1978).
[8] 鄭瑞庭、蔡宏營、林熙翔、蘇建彰、陳建洋, “簡介下世代微影技術與耐米轉印微影技術”, 機械工業雜誌, 245期, 116.
[9] Erik H. Anderson, Kazuhiko Komatsu, and Henry I. Smith, “Achromatic holographic lithography in the deep ultraviolet”, J. Vac. Sci. Technol. B 6, 216 (1988).
[10] Saleem H. Zaidi and S. R. J. Brueck, “Multiple-exposure interferometric lithography”, J. Vac. Sci. Technol. B 11, 658(1993).
[11] T. A. Savas, Satyen N. Shah, M. L. Schattenburg, J. M. Carter, and Henry I. Smith, “Achromatic interferometric lithography for 100-nm-period gratings and grids”, J. Vac. Sci. Technol. B 13, 2732(1995).
[12] A. Fernandez, H. T. Nguyen, J. A. Britten, R. D. Boyd, M. D. Perry, D. R. Kania, and A. M. Hawryluk, “Use of interference lithography to pattern arrays of submicron resist structures for field emission flat panel displays”, J. Vac. Sci. Technol. B 15, 729(1997).
[13] W. Hinsberg, F. A. Houle, J. Hoffnagle, M. Sanchez, G. Wallraff, M. Morrison, and S. Frank, “Deep-ultraviolet interferometric lithography as a tool for assessment of chemically amplified photoresist performance”, J. Vac. Sci. Technol. B 16, 3689(1998).
[14] M. A. M. Haast, J. R. Schuurhuis, L. Abelmann, J. C. Lodder, and Th. J. Popma, “Reversal mechanism of submicron patterned CoNi/Pt multilayers”, IEEE Trans. Magn. 34, 1006(1998).
[15] Brueck, S. R. J.; Zaidi, S. H.; Chen, X.; Zhang, Z, “Interferometric lithography - from periodic arrays to arbitrary patterns”, Microelectron. Eng. 41-42, 145(1998).
[16] T. A. Savas, M. L. Schattenburg, J. M. Carter, and Henry I. Smith, “Large-area achromatic interferometric lithography for 100 nm period gratings and grids”, J. Vac. Sci. Technol. B 14, 4167(1996).
[17] Xiaolan Chen and S. R. J. Brueck, “Imaging interferometric lithography: A wavelength division multiplex approach to extending optical lithography”, J. Vac. Sci. Technol. B 16, 3392(1999).
[18] Xiaolan Chen and S. R. J. Brueck, “Imaging interferometric lithography : approaching the solution limits of optics”, Optics Letters, Vol. 24, No.3, 124(1999).
[19] M. C. Hutley, “Coherent Photofabrication”, Opt. Eng. vol.15 No.3, 190 (1976).
[20] Willie W. NG, Chi-Shain Hong, Amnon Yariv, “Holographic Interference Litho- graphy for Integrated Optics”, IEEE Trans. On Electron. Device. vol.ED25 No.10, 1193 (1978).
[21] J. A. Hoffnagle, W. D. HinSberg, M. Sanchez, and F. A. Houle, “Liquid immersion deep-ultraviolet interferometric lithography”, Proc. SPIE 3678, 138 (1999).
[22] H. H. Solak, D. He, W. Li, S. Singh-Gasson, B. H. Sohn, X. M. Yang, and P. Nealey, “Exposure of 38 nm period grating patterns with extreme ultraviolet interferometric lithography”, Appl. Phys. Lett. 75, 2328(1999).
[23] H. H. Solak, D. He, W. Li, and F. Cerrina, “Nanolithography using extreme ultraviolet lithography interferometry : 19 nm lines and spaces”, J. Vac. Sci. Technol. B 17, 3052(1999).
[24] Carl G. Chan, Paul T. Konkola, Ralf K. Heilmann, G. S. Pati, and Mark L. Schattenburg, “Image metrology and system controls for scanning beam interference lithography”, J. Vac. Sci. Technol. B 19, 2335 (2001).
[25] G. S. Pati, R. K. Heilmann, P. T. Konkola, C. Joo, C. G. Chan, E. Murphy, and M. L. Schattenburg, “Generalized scanning beam interference lithography system for patterning gratings with variable period progressions”, J. Vac. Sci. Technol. B20, 2617(2002).
[26] M. L. Schattenburg, C. Chan, P. N. Everett, J. Ferrera, P. Konkola, and Henry I. Smith, “Sub-100 nm metrology sing interferometrically produced fiducials”, J. Vac. Sci. Technol. B17, 2692(1999).
[27] T. A. Savas, M. L. Schattenburg, J. M. Carter, and Henry I. Smith, “Large-area achromatic interferomatic lithography for 100 nm period grating and grids”, J. Vac. Sci. Technol. B14, 4167(1996).
[28] Juan Ferrera, M. L. Schattenburg, and Henry I. Smith, “Analysis of distortion in interferometric lithography”, J. Vac. Sci. Technol. B14, 4009(1996).
[29] Paul T. Konkola, Carl G. Chan, Ralf K. Heilmann, and M. L. Schattenburg, “Beam steering system and spatial filtering applied to interference lithography”, J. Vac. Sci. Technol. B18, 3282(2000).
[30] M. L. Schattenburg, C. G. Chan, R. K. Heilmann, P. T. Konkola, and G. S. Pati, “Progress towards a general grating patterning technology using phase-locked scanning beams”, Proceedings of the SPIE, Vol. 4485, 4485(2001).
[31] Ralf K. Heilmann, Paul T. Konkola, Carl G. Chan, G. S. Pati, and Mark L. Schattenburg, “Digital heterodyne interference fringe control system”, J. Vac. Sci. Technol. B19, 2342(2001).
[32] H. H. Solak, C. David, J. Gobrecht, L. Wang and F. Cerrina, “Multiple-beam in- terference lithography with electron beam written gratings”, J. Vac. Sci. Technol. B 20, 2844(2002).
[33] S.Pau, G. P. Watson and O. Nalamasu, “Writing an arbitrary non-periodic pattern
using interference lithography”, journal of modern optics, vol.48, no.7, 1211 (2001).
[34] H.H. Solak , C. David , J. Gobrecht , L. Wang , and F. Cerrina, “Four-wave EUV interference lithography”, Microelectronic Engineering 61–62 (2002)
[35] H.H. Solak , C. David , J. Gobrecht , V. Golovkina , F. Cerrina and S.O. Kim, “S ub-50 nm period patterns with EUV interference lithography”, Microelectronic Engineering 67–68 (2003)
[36] Golovkina VN, Nealey PF, Cerrina F, Taylor JW, Solak HH, David C, Gobrecht J, “Exploring the ultimate resolution of positive-tone chemically amplified resists: 26 nm dense lines using extreme ultraviolet interference lithography”, J. Vac. Sci. Technol. B 20, 99(2004).
[37] Solak HH, “Space-invariant multiple-beam achromatic EUV interference litho-
graphy”, Microelectronic Engineering 78–79 (2005) 410–416
[38] Thomas E. Murphy, “Design, Fabrication and Measurement of Integrated Bragg Grating Optical Filters”, Ph.D. Thesis, Massachusetts Institute of Technology, 2001.
[39] Chan TYM, Toader O and John S, “Photonic band gap templating using optical interference lithography”, Physical Review E 71 (4): Art. No. 046605 Part 2 ( 2005)
[40] Yang S, “Creating 3D microstructures by interference lithography: From 3D photonic crystals to biomimetic microlens arrays”, Abstracts of papers of the american chemical society 228: U433-U433 124-PMSE Part 2 ( 2004)
[41] Ao XY and He SL, “Three-dimensional photonic crystal of negative refraction achieved by interference lithography”,Optics letters 29 (21): 2542-2544(2004)
[42] Prodan L, Euser TG, van Wolferen HAGM, Bostan C, de Ridder RM, Beigang R, Boller KJ and Kuipers L, “Large-area two-dimensional silicon photonic crystals for infrared light fabricated with laser interference lithography” ,Nanotechnology 15 (5), 639(2004)
[43] Ao XY and He SL, “Two-stage design method for realization of photonic bandgap structures with desired symmetries by interference lithography ”,Optics express 12 (6), 978(2004)
[44] C. O. Bozler, C. T. Harris, S. Rabe, D. D. Rathman, M. A. Hollis, and Henry I. Smith, “Arrays of gated field-emitter cones having 0.32 µm tip-to-tip spacing”, J. Vac. Sci. Technol. B12, 629(1994)
[45] R. M. H. New, R. F. W. Pease,and R. L. White, “Submicron patterning of thin cobalt films for magnetic storage”, J. Vac. Sci. Technol. B12, 3196(1994)
[46] S.Y. Chou, M. Wei, P. R. Krauss, and P. B. Fischer, “Study of nanoscale magnetic structures fabricated using electron-beam lithography and quantum magnetic disk”, J. Vac. Sci. Technol. B12, 3695(1994)
[47] P. R. Krauss, and P. B. Fischer, and S.Y. Chou, “Fabrication of single-domain magnetic pillar array of 35 nm diameter and 65 Gbits/in.2 density”, J. Vac. Sci. Technol. B12, 3639(1994)
[48] B. Rezek, C. E. Nebel, and M. Stutzmann, “Polycrystalline silicon thin films by interference laser crystallization of amorphous silicon”, Jpn. J. Appl. Phys. 38, L1083(1999)
[49] B. Rezek, C. E. Nebel, and M. Stutzmann, “Laser beam induced currents in polycrystalline silicon thin films prepared by interference laser crystallization”, J. Appl. Phys. 91 4220(2002)
[50] P. V. Santos, A. R. Zanatta, U. Jahn, A. Trampert, F. Dondeo, and I. Chambouleyron, “Laser interference structuring of a-Ge films on GaAs”, J. Appl. Phys. 91, 2916 (2002).
[51] M. Zheng, M. Yu, Y. Liu, R. Skomski, S. H. Liou, and D. J. Sellmyer, V. N. Petryakov, Yu. K. Verevkin, N. I. Polushkin, and N.N. Salashchenko, “Magnetic nanodot arrays produced by direct laser interference lithography”, Appl. Phys. Lett. 79, 2606(2001)
[52] Peter Van Zant, “Microchip fabrication”, 4th, McGRAW-HILL, 2000
[53] 邱燦賓,“微影製程之數學模式(I)”,奈米通訊,第五卷第三期,30(2004)
[54] Hugene Hecht, “Optics”,4th,Addison Wesley,2002.
[55] Kjell J. Gasvik, “Optical Metrology”,3nd,John Wiley & Sons Ltd,2002
[56] Frank L. Pedrotti, S.J., “Introduction to Optics”, 2nd,Englewood Cliffs,1993
[57] M. Francon, “Optical Interferometry”, Sydney,1985
[58] J. A. Hoffnagle, W. D. Hinsberg, M. Sanchez, and F. A. Houle, “Liquid immersion deep-ultraviolet interferometric lithography”, J. Vac. Sci. Tech. B 17, 3306(1999)
[59] T. A. Savas, Satyen N. Shah, M. L. Schattenburg, J. M. Carter, and Henry I. Smith, “Achromatic interferometric lithography for 100-nm-period gratings and grids”, J. Vac. Sci. Tech. B 13, 2732(1995)
[60] M. Switkes, T. M. Bloomstein, and M. Rothschild, “Patterning of sub-50 nm dense features with space-invariant 157 nm interference lithography”, Applied Physics Letters V.77, 3149(2000)
[61] H. H. Solak, D. He, W. Li, S. Singh-Gasson, F. Cerrina, B. H. Sohn, X. M. Yang, and P. Nealey, “Exposure of 38 nm period grating patterns with extreme ultraviolet interferometric lithography”, Applied Physics Letters V.75, 2328(2000)
[62] Xiaolan Chen, S. R. J. Brueck, “ Imaging interferometriclithography:approaching the resolution limits of optics”, Optics Letters, V.24, 124(1999)
[63] Xiaolan Chen and S. R. J. Brueck, “Imaging interferometric lithography: A wavelength division multiplex approach to extending optical lithography”, J. Vac. Sci. Tech. B 16, 3392(1998)
[64] M. L. Schattenburg, C. Chen, P. N. Everett, J. Ferrera, P. Konkola, and Henry I. Smith, “Sub-100 nm metrology using interferometrically produced fiducials”, J. Vac. Sci. Tech. B 17, 2692(1999)
[65] W. Hinsberg, F. A. Houle, J. Hoffnagle, M. Sanchez, G. Wallraff, M. Morrison, and S. Frank, “Deep-ultraviolet interferometric lithography as a tool for assessment of chemically amplified photoresist performance”, J. Vac. Sci. Tech. B 16,3689(1998)
[66] Xiaolan Chen, Zhao Zhang, Steven R. J. Brueck, Ronald A. Carpio, and John S. Petersen, “Process development for 180-nm structures using interferometric lithography and i-line photoresist” Proceedings of SPIE, V.3048, 309(1997)
[67] Saleem H. Zaidi and S. R. J. Brueck, “Multiple-exposure interferometric litho- graphy”, J. Vac. Sci. Tech. B 11, 658(1993) |