博碩士論文 92336015 詳細資訊




以作者查詢圖書館館藏 以作者查詢臺灣博碩士 以作者查詢全國書目 勘誤回報 、線上人數:50 、訪客IP:3.145.41.253
姓名 廖其貴(Chi-Kuei LIAO)  查詢紙本館藏   畢業系所 環境工程研究所在職專班
論文名稱 Dry Scrubber 吸收技術去除毒性氣體之研究(半導體低壓化學氣相沈積製程為例)
相關論文
★ 半導體業化學機械研磨殘液及盛裝容器資源化再利用可行性評估★ 電子產業廢錫鉛銲材渣資源化操作條件探討
★ 台灣南部海域溢油動態資料庫-應用於海洋污染事故應變模擬分析★ 都市廢棄物固態發酵高溫產氫之研究
★ 以印刷電路板鍍銅水平製程探討晶膜現象衍生之銅層斷裂★ Thermite反應熔融處理都市垃圾焚化飛灰之研究
★ 焚化飛灰與下水污泥灰共熔之操作特性 與卜作嵐材料特性之研究★ 廢棄物衍生Thermite 熔融劑之研究
★ 廢棄物衍生Thermite熔融劑處理焚化飛灰-反應機制及重金屬移行之研究★ 廢棄物鋁熱反應熔融處理焚化飛灰-熔渣基本特性研究
★ 廢鑄砂及石材污泥取代水泥生料之研究★ 廢棄物衍生Thermite熔融劑處理焚化飛灰熔融物質回收之研究
★ 廢棄物衍生鋁熱熔融劑處理鉻污泥★ 廢棄物衍生鋁熱熔融劑處理不鏽鋼集塵灰
★ 濕式冶煉鉻污泥配置廢棄物衍生鋁熱熔融劑回收鉻金屬之研究★ 水洗前處理與添加劑對都市垃圾焚化飛灰燒結特性的影響
檔案 [Endnote RIS 格式]    [Bibtex 格式]    [相關文章]   [文章引用]   [完整記錄]   [館藏目錄]   [檢視]  [下載]
  1. 本電子論文使用權限為同意立即開放。
  2. 已達開放權限電子全文僅授權使用者為學術研究之目的,進行個人非營利性質之檢索、閱讀、列印。
  3. 請遵守中華民國著作權法之相關規定,切勿任意重製、散佈、改作、轉貼、播送,以免觸法。

摘要(中) 本研究以現有不同乾式化學吸收技術(Dry scrubber),對低壓化學氣相沉積製程(Chemical Vapor Deposition LPCVD)尾氣排放毒性氣體處理的效果,並分析不同吸收劑及吸附劑處理效率及副產物,以及三種不同處理設備的經濟成本評估。
實驗結果顯示:LPCVD製程尾氣經霍氏轉換紅外光(Fourier Transform Infrared Spectroscopy FTIR),其尾氣成份主要是SiF4、HCl、HF、及CO,經由三種不同吸收、吸附劑(AC、AC-OH及FeOOH)對前端氣體之去除效率皆>99%,FeOOH吸收劑所產生的副產品分析濃度為N.D。
摘要(英) Semiconductor and TFT-LCD processes use a significant amount of special gases. Most of these special gases are halogenated acid gases, e.g., Cl2, HCl, ClF3, and HBr, etc… The special gases are toxic to human and cause corrosion on pipes and process tools. Major treatment processes for those gases are wet scrubbing, burn + wet scrubbing and dry scrubbing processes. However, some gases have low solubility in water and burn process could cause fire hazard and consume significant energy. Semiconductor Industry Association recommends the dry local scrubber for CVD cleaning and etching as well as ion implantation. The objective of this study was to investigate the treatment ability of toxic gases from semiconductor processes by dry local scrubbers. Low pressure chemical vapor deposition process (LPCVD) was the primary target of this study and the ClF3 is used as the cleaning gas for wafer.
Three dry local scrubbers were studied, including the regular activated carbon, activated carbon coated with NaOH and CaOH, and FeOOH catalyst. A FTIR was used to detect the target gas and byproducts from the LPCVD process as well as the byproducts after the dry local scrubbers. Results showed that the major gases from the LPCVD process are SiF4, HCl, HF and CO. ClF3 was consumed during the process. Those gases were removed by the three types of dry scrubbers with efficiency higher than 99%. However, CFCs (chlorination fluorinated carbons) and methanol were detected in the effluent gases of the two activated carbons of local scrubbers, but negligible for FeOOH. Cost comparison of the three dry scrubbers showed the waste treatment cost are major problems for the dry scrubbers. The FeOOH can be recycled locally and therefore, the operation cost of the FeOOH was lowest.
Based on these observation, it were concluded the dry local scrubbers are high efficiency, and have low maintenance, no wastewater and toxic gases and low risk on fire hazard on special gas treatment. However, the activated carbon type of local scrubber can produce significant amount of by-products and waste treatment is major problem. The FeOOH type local scrubber can overcome those problems.
關鍵字(中) 關鍵字(英) ★ Dry scrubber
★ LPCVD
★ AC
★ AC-OH
★ FeOOH
論文目次 第一章 前言 1
1-1 研究緣起 1
1-2 研究目的 8
第二章 文獻回顧 10
2-1 現有之減量技術 10
2-1.1 Dry scrubber(乾式化學吸收技術) 10
2-1.2 Hot chemical bed/wet scrubbing(觸媒焚化後洗滌技術) 11
2-1.3 thermal(burn)/wet scrubbing(高溫焚化後洗滌技術) 11
2-1.4 Wet scrubbing(濕式氧化洗滌技術) 13
2-2 現有PFC之減量技術 16
2-3 管末處理技術 16
第三章 研究方法及工作實施方法 19
3.1 工作實施方法 19
3.2 美國環保署TEST METHOD 320 21
3.2-1 簡介 22
3.2-1.1範圍及適用性(applicability) 22
3.2-1.2 方法範圍及靈敏度(sensitivity) 22
3.2-2 方法概要 22
3.2-2.1 原理(principle) 22
3.2-2.2 採樣及分析(Sampling and Analysis) 23
3.2-2.3 標準圖譜(reference spectra) 23
3.2-2.4 操作要求 23
3-2.3 定義 23
3-2.4 干擾(interferences) 24
3-2.4.1分析干擾 24
3-2.4.2採樣系統干擾 24
3-2.5 安全 24
3-2.6 設備與零件 25
第四章 結果與討論 26
4-1 廢氣成分及相關濃度分析結果 26
4-2 不同吸收劑及吸附劑處理的分析 32
4-2.1 尾氣經不同吸收劑及吸附劑處理後的副產品 33
4-3 經濟性之評估 36
第五章 結論與建議 38
5-1 結論 38
5-2 建議 38
參考文獻 40
參考文獻 1. 余榮彬 ‘半導體工業全氟化物排放控制技術與機會 ‘TSIA, 1998
2. 余榮彬 ‘第七屆國際半導體安全衛生環保研討會報’, 2000/09/30
3. US EPA, 1998;Global Semiconductor Industry Conference on Perfluoro Compound Emission Control, Proceeding, Monterey, CA, USA.
4. Jerry Meyers, 1998;〝Emissions Characterization Package〞, Rev 2.4, Intel
5. VOC Newsletter 1-10Issuses,KWS 2000-Project Bureau,the Netherland, 1990-1993
6. 有害空氣污染物最佳可行控制技術(BACT)電子半導體實例分析,P135, 工業污染防治 第58期 , 1996.4
7. Jacoby, William A ; Blake, Daniel M. ; Noble, Richard D. ; Koval, Carl A. “Kinetics of the trichgloroethylene in air via heterogeneous photocatalysis” Physical Organic Chemistry, CA section 22 ,1995
8. Matthews, R.W. “Photooxidation of Organic Impurities in Water Using Thin Films of Titanium Dioxide.” J. Phys. Chem., 91, 3328, 1987.
9. Ollis, D.F.; Serpone, N.; and Pelizzetti, E. 浶eterogeneous Photocatalysis in the Environment: Application of Water Purification.” In Photocatalysis Fundamentals and Applications. Serpone, N.; and Pelizzetti, E., ed.; John Wiley & Sons: New York, 1989; 603-638.
10. Akata, A., Oxidation of Water Pollutants by Ozone Photolysis Studies of Nitrobenzeneas a Model Compound. Ph.D Dissertation; Drexel University: Philadelphia, PA., 1994.
11. Bhowmick, M. And Semmens, M. J.,” Ultraviolet photooxidation for the destruction of VOCs in Air” Wat. Res., 28, p 2407,1994.
12. Lin, Shu-sung, “Interaction of H2O2 with Iron Oxides for Oxidation of Organic Compounds in Water”, Ph.D. Thesis, Drexel University, Philadelphia, PA., USA, 1997.
13. Gurol, M. D.; Lin, S.-S.; and Bhat, N. “Granular Iron Oxide as a Catalyst in Chemical Oxidation of Organic Contaminates”in “In merging Technologies in Waste Management.” ACS, edited by F. Pohland and W. Tedder, 1996.
14. Taiwan Semiconductor Industry ESH Workshop,1998,5.
15. B. Dhandapani, S.T. Oyama, “ Gas phase ozone decomposion catalysts”, Applied Catalysis B: Environmental 11 , 1997, 129 – 166.
16. Chou, C. C. and Lin, S., “Characterization of Plume Opacity of Semiconductor Wet Central Scrubbers”, paper presented at 6th Annual International Environmental, Safety and Health Conference, June 13~15, 1999.
17. Williams, M.E., Baldwin, D.G. and Manz, P.C., “Semiconductor industrial hygiene handbook”, Noyes, NJ, 1995.
18. Rand, S. D. “The Semiconductor Industry’s Model Strategy for Global Climate Protection”, Semiconductor Fabtech, 10, 99-102, 1999.
19. Beu, L., Brown P. T., Latt, J., Rapp, J. U. , Gilliland, T., Tamayo, T., Harrison, J., Davison, J., Cheng, A., Jewett, J. and Worth, W. "Current State of Technology: Perfluorocompound (PFC) Emissions Reduction. SEMATECH Technology Transfer #98053508A-TR, 1998.
20. Vartanian, V., Beu, L., Stephens, T., Rivers, J., Perez, B., and Tonnis, E., Kiehlbauch, M. and Graves, D., ”Long-Term Evaluation of the Litmas "Blue" Plasma Device for Point-of-Use (POU) Perfluorocompound and Hydrofluorocarbon Abatement”, SEMATECH Technology Transfer # 99123865A-ENG, 2000.
21. 行政院環境保護署 “污染防治技術開發與推廣專案研究:電子產業及特定行業空氣污染改善輔導示範推廣及管制標準研訂專案工作研究報告” 2001.
指導教授 王鯤生(Kuen-Sheng Wang) 審核日期 2005-7-25
推文 facebook   plurk   twitter   funp   google   live   udn   HD   myshare   reddit   netvibes   friend   youpush   delicious   baidu   
網路書籤 Google bookmarks   del.icio.us   hemidemi   myshare   

若有論文相關問題,請聯絡國立中央大學圖書館推廣服務組 TEL:(03)422-7151轉57407,或E-mail聯絡  - 隱私權政策聲明