即時性多角度光譜量測系統，結合電致發光、光致發光及反射率量測

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姓名

洪舜昱(Shun-Yu Hong) 查詢紙本館藏

畢業系所

光電科學與工程學系

論文名稱

即時性多角度光譜量測系統，結合電致發光、光致發光及反射率量測
(One-snap multi-angle spectroscopy optical system for electroluminescence, photoluminescence and reflectance measurements)

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摘要(中)

本研究旨在即時性多角度光譜量測系統之建立，結合電致發光(Electroluminescence, EL)、光致發光(Photoluminescence, PL)以及反射率 (reflectance)等量測，建立一套三合一的即時量測系統。
系統的光學設計上，光經由物鏡將各角度展開，通過狹縫後定義出空間維度(y-軸)，再由光柵將波長維度(x-軸)分光，最終在互補式金屬氧化物半導體(Complementary Metal-Oxide-Semiconductor, CMOS)上形成一波長—角度之二維空間頻譜。整套系統由無焦系統(afocal system)做為基礎原理架設而成，用以匹配光束的尺寸。另外，以外加光源的方式作為光致發光及反射率量測的量測光源。
相較於傳統旋轉光纖量測，即時性多角度光譜量測系統之優點在於迅速及方便性，本系統僅需約一秒鐘即可擷取到待測物之空間頻譜，而旋轉量測光纖通常需要較長的量測時間。另外，本系統的量測方式是將待測物直接靠置在物鏡前端，待測物尺寸僅需大於物鏡之收光孔徑，然而傳統光纖量測中，待測物尺寸和量測距離之相對關係對於空間頻譜的量測影響甚大，量測的變因亦多。
即時性多角度光譜量測系統未來可應用於OLED之空間頻譜量測，且對於具角度相依性的微共振腔元件如有機雷射之研究具有相當大的助益。

摘要(英)

This research focuses on the establishment of one-snap multi-angle spectroscopy optical system, which combines electroluminescence (EL), photoluminescence (PL) and reflectance measurements.
In the optical design, the rays are expended by an objective, and the direction of angular dimension (y-axis) is determined by a slit, while the wavelength dimension (x-axis) are separated by a blazed grating. Finally, the rays enter a Complementary Metal-Oxide-Semiconductor (CMOS) and a two dimensional spatial spectrum is formed. The whole system is established on the basis of afocal system tomatch the beam size. In addition, external light sources are applied for the PL and reflectance measurements.
Compared with the conventional fiber-rotation measurement, the one-snap multi-angle spectroscopy optical system has advantages of rapidity and convenience. The angle-resolved spectra can be acquired in nearly one second, whereas the fiber-rotation measurement usually takes a much longer time. Moreover, the measurement of the one-snap system can be easily performed by leaning the device on the front side of objective lens, which only requires the device with a size larger than the bore of objective lens. However, in conventional fiber measurements, the spatial spectra depend strongly on the relationship between the device size and the rotation diameter, with more variables to affect the result.
One-snap multi-angle spectroscopy optical system is believed to greatly benefit the studies of the spatial spectra of OLEDs and microcavity devices such as organic lasers.

關鍵字(中)

★ 光譜量測
★ 電致發光
★ 光致發光
★ 反射率

關鍵字(英)

★ measurement
★ electroluminescence
★ photoluminescence
★ reflectance

論文目次

中文摘要......i
Abstract......ii
誌謝......iv
目錄......v
圖目錄......viii
第一章緒論......1
1-1 前言......1
1-2 光纖量測......2
1-3 研究動機與目的......3
第二章基礎理論......4
2-1 即時性多角度光譜量測系統之光學理論......4
2-1-1 透鏡成像公式......4
2-1-2 無焦系統......5
2-1-3 閃耀光柵之理論與計算......6
2-1-4 空間濾波......8
2-1-5 朗伯光源與朗伯餘弦定理......11
2-2 光致發光之理論......12
2-3 有機發光二極體之理論......13
2-3-1 有機發光二極體之結構......13
2-3-2 電荷注入限制電流......15
2-3-3 空間電荷限制電流......17
2-3-4 量子效率......18
第三章實驗方式與步驟......19
3-1 實驗製程......19
3-1-1熱蒸鍍系統......19
3-1-2 手套箱......20
3-1-3 有機發光二極體之製程與結構......21
3-1-4 實驗步驟......23
3-2 實驗量測......25
3-2-1 半導體參數分析儀......25
3-2-2 光纖量測系統......26
3-2-3 外部量子效率之計算......28
3-2-4 三倍頻Q-switch雷射量測系統......29
3-2-5 積分球光學檢測儀......30
第四章實驗結果與討論......31
4-1 即時性多角度光譜量測系統之架設......31
4-2 系統校正......34
4-2-1 系統之成像品質......34
4-2-2 波長校正......36
4-2-3 角度校正......37
4-2-4 光強度校正......39
4-3 電致發光量測......46
4-4 光致發光量測......52
4-4-1 光致發光量測之架設......52
4-4-2 實驗方式及結果......53
4-4-3 結果討論......56
4-5 反射率量測......57
4-5-1 反射率量測之架設......57
4-5-2 實驗方式與結果......58
4-5-3 結果討論......60
第五章結論與未來展望......62
參考文獻......64

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指導教授

張瑞芬(Jui-Fen Chang)

審核日期

2017-10-6

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