In situ scanning tunneling microscopy study of cobalt thin film electrodeposited on Pt(1 1 1) electrode

Please use this identifier to cite or link to this item: https://ir.lib.ncu.edu.tw/handle/987654321/100856

Title:	In situ scanning tunneling microscopy study of cobalt thin film electrodeposited on Pt(1 1 1) electrode
Authors:	姚學麟;Kuo, YenChun;Yen, PoYu;Chen, Wanchung;Chen, Sihzih;Yau, ShuehLin
Contributors:	理學院化學學系
Keywords:	Atomic structure;Cobalt;Cobalt thin film;Deposits;Electrodeposition;Electrodes;Moire pattern;Scanning tunneling microscopy;Thin films;Underpotential deposition
Date:	2013-12-01
Issue Date:	2026-04-21 14:16:23 (UTC+8)
Publisher:	Elsevier Ltd.;Elsevier Ltd
Abstract:	摘要： Thanks to the availability of single crystal electrodes and the advance of scanning probes, it is now possible to characterize the process of electrodeposition in real time and the atomic structure of ultrathin film. Reported here is an in situ scanning tunneling microscopy (STM) study of cobalt electrodeposition on an ordered Pt(111) electrode in a pH 3 chloride-containing medium. It was found to be a two-staged process, involving an underpotential deposition (UPD) stage and an overpotential deposition (OPD) occurring at potentials positive and negative of the Nernst potential of −0.57V (versus Ag/AgCl) calculated for 0.04M CoCl2. Time-dependent STM imaging revealed Co nucleated mainly in one atom high islands on terraces and at steps in the UPD stage, followed by quasi layer-by-layer growth to form a smooth thin film up to five layers in thickness. The UPD layer comprised Co atoms arranging in disarray, possibly resulting from competitive adsorption of hydrogen at the Pt electrode. Starting from the second layer, the Co film assumed ordered microstructures featuring a long range undulation of atomic height. This moire structure consisted of Co(0001) like plane stacked on the Pt(111) substrate with an in-plane interatomic spacing of 0.257nm in the bilayer film. Due to different lattice constants of Co and Pt, the Co/Pt(111) was strained, but the degree of this interfacial strain gradually decreased with the thickness of Co deposit, as revealed by the diminish of the moire pattern when the Co film grew to more than five layer in thickness. Meanwhile, the morphology of the Co deposit became rougher with thickness, which suggests a Stranski–Krastanov growth. 出版者： Elsevier Ltd 出版日期： 2013-12-01 出處： Electrochimica acta, 2013-12, Vol.112, p.831-837 版權： 2013 Elsevier Ltd 識別號： ISSN: 0013-4686 識別號： EISSN: 1873-3859 識別號： DOI: 10.1016/j.electacta.2013.05.047
Appears in Collections:	[Department of Chemistry] journal & Dissertation

Files in This Item:

File	Description	Size	Format
index.html		0Kb	HTML	22	View/Open

社群 sharing

Loading...