Kinetic analysis of spontaneous whisker growth on pre-treated surfaces with weak oxide

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Title:	Kinetic analysis of spontaneous whisker growth on pre-treated surfaces with weak oxide
Authors:	劉正毓;Su, Chien-Hao;Chen, Hao;Lee, Hsin-Yi;Liu, Cheng Yi;Ku, Ching-Shun;Wu, Albert T.
Contributors:	工學院化學工程與材料工程學系
Keywords:	Applied sciences;Ceramic whiskers;Characterization and Evaluation of Materials;Chemistry and Materials Science;Condensed matter: structure, mechanical and thermal properties;Corrosion;Corrosion mechanisms;Cross-disciplinary physics: materials science;rheology;Diffusion;Diffusion in solids;Electronics and Microelectronics;Exact sciences and technology;Instrumentation;Intermetallic compounds;Materials Science;Metals. Metallurgy;Methods of crystal growth;physics of crystal growth;Optical and Electronic Materials;Oxidation;Physics;Radiation;Solid State Physics;Surfaces and interfaces;thin films and whiskers (structure and nonelectronic properties);Theory and models of crystal growth;physics of crystal growth, crystal morphology and orientation;Thin films;Transport properties of condensed matter (nonelectronic);Whiskers and dendrites (growth, structure, and nonelectronic properties)
Date:	2014-01-01
Issue Date:	2026-04-21 14:20:14 (UTC+8)
Publisher:	Springer New York;Boston: Springer US
Abstract:	摘要： This study sought to clarify the relationship between cracks in surface oxide layers and the growth behavior of tin whiskers. The number, length, and total volume of extrusions were precisely calculated and residual stress was measured using synchrotron radiation x-ray diffractometry. The aim was to elucidate the influence of stress on the driving force and flux involved in atomic diffusion. The distance between weak spots was shown to be the most significant factor involved in the growth of whiskers. The results could explain why increasing the density of the surface weak spots could reduce the number of long whiskers. Measuring the dimensions of whiskers yielded a precise kinetic model capable of describing the migration of atoms to the root of whiskers, resulting in their spontaneous growth. 其他題名： Journal of Elec Materi 出版者： Boston: Springer US 出版日期： 2014-09-01 出處： Journal of electronic materials, 2014-09, Vol.43 (9), p.3290-3295 資源來源： EBSCOhost OmniFile Full Text Select 版權： TMS 2014 版權： 2015 INIST-CNRS 版權： The Minerals, Metals & Materials Society 2014 識別號： ISSN: 0361-5235 識別號： EISSN: 1543-186X 識別號： DOI: 10.1007/s11664-014-3182-6 識別號： CODEN: JECMA5
Appears in Collections:	[Department of Chemical and Materials Engineering] journal & Dissertation

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